We report the radiation hardness of a p-channel CCD developed for the X-ray CCD camera onboard the XRISM satellite. This CCD has basically the same characteristics as the one used in the previous Hitomi satellite, but newly employs a notch structure of potential for signal charges by increasing the implant concentration in the channel. The new device was exposed up to approximately $7.9 \times 10^{10} \mathrm{~protons~cm^{-2}}$ at 100 MeV. The charge transfer inefficiency was estimated as a function of proton fluence with an ${}^{55} \mathrm{Fe}$ source. A device without the notch structure was also examined for comparison. The result shows that the notch device has a significantly higher radiation hardness than those without the notch structure including the device adopted for Hitomi. This proves that the new CCD is radiation tolerant for space applications with a sufficient margin.

X-ray polarimetry in astronomy has not been exploited well, despite its importance. The recent innovation of instruments is changing this situation. We focus on a complementary MOS (CMOS) pixel detector with small pixel size and employ it as an x-ray photoelectron tracking polarimeter. The CMOS detector we employ is developed by GPixel Inc., and has a pixel size of 2.5 $\mathrm{\mu}$m $\times$ 2.5 $\mathrm{\mu}$m. Although it is designed for visible light, we succeed in detecting x-ray photons with an energy resolution of 176 eV (FWHM) at 5.9 keV at room temperature and the atmospheric condition. We measure the x-ray detection efficiency and polarimetry sensitivity by irradiating polarized monochromatic x-rays at BL20B2 in SPring-8, the synchrotron radiation facility in Japan. We obtain modulation factors of 7.63% $\pm$ 0.07% and 15.5% $\pm$ 0.4% at 12.4 keV and 24.8 keV, respectively. It demonstrates that this sensor can be used as an x-ray imaging spectrometer and polarimeter with the highest spatial resolution ever tested.