The realization of X-ray telescopes with imaging capabilities in the hard (> 10 keV) X-ray band requires the adoption of optics with shallow (< 0.25 deg) grazing angles to enhance the reflectivity of reflective coatings. On the other hand, to obtain large collecting area, large mirror diameters (< 350 mm) are necessary. This implies that mirrors with focal lengths >10 m shall be produced and tested. Full-illumination tests of such mirrors are usually performed with on- ground X-ray facilities, aimed at measuring their effective area and the angular resolution; however, they in general suffer from effects of the finite distance of the X-ray source, e.g. a loss of effective area for double reflection. These effects increase with the focal length of the mirror under test; hence a "partial" full-illumination measurement might not be fully representative of the in-flight performances. Indeed, a pencil beam test can be adopted to overcome this shortcoming, because a sector at a time is exposed to the X-ray flux, and the compensation of the beam divergence is achieved by tilting the optic. In this work we present the result of a hard X-ray test campaign performed at the BL20B2 beamline of the SPring-8 synchrotron radiation facility, aimed at characterizing the Point Spread Function (PSF) of a multilayer-coated Wolter-I mirror shell manufactured by Nickel electroforming. The mirror shell is a demonstrator for the NHXM hard X-ray imaging telescope (0.3 - 80 keV), with a predicted HEW (Half Energy Width) close to 20 arcsec. We show some reconstructed PSFs at monochromatic X-ray energies of 15 to 63 keV, and compare them with the PSFs computed from post-campaign metrology data, self-consistently treating profile and roughness data by means of a method based on the Fresnel diffraction theory. The modeling matches the measured PSFs accurately.

Future hard (10 -100 keV) X-ray telescopes (SIMBOL-X, Con-X, HEXIT-SAT, XEUS) will implement focusing optics with multilayer coatings: in view of the production of these optics we are exploring several deposition techniques for the reflective coatings. In order to evaluate the achievable optical performance X-Ray Reflectivity (XRR) measurements are performed, which are powerful tools for the in-depth characterization of multilayer properties (roughness, thickness and density distribution). An exact extraction of the stack parameters is however difficult because the XRR scans depend on them in a complex way. The PPM code, developed at ERSF in the past years, is able to derive the layer-by-layer properties of multilayer structures from semi-automatic XRR scan fittings by means of a global minimization procedure in the parameters space. In this work we will present the PPM modeling of some multilayer stacks (Pt/C and Ni/C) deposited by simple e-beam evaporation. Moreover, in order to verify the predictions of PPM, the obtained results are compared with TEM profiles taken on the same set of samples. As we will show, PPM results are in good agreement with the TEM findings. In addition, we show that the accurate fitting returns a physically correct evaluation of the variation of layers thickness through the stack, whereas the thickness trend derived from TEM profiles can be altered by the superposition of roughness profiles in the sample image.

Simbol-X will push grazing incidence imaging up to 80 keV, providing a strong improvement both in sensitivity and angular resolution compared to all instruments that have operated so far above 10 keV. The superb hard X-ray imaging capability will be guaranteed by a mirror module of 100 electroformed Nickel shells with a multilayer reflecting coating. Here we will describe the technogical development and solutions adopted for the fabrication of the mirror module, that must guarantee an Half Energy Width (HEW) better than 20 arcsec from 0.5 up to 30 keV and a goal of 40 arcsec at 60 keV. During the phase A, terminated at the end of 2008, we have developed three engineering models with two, two and three shells, respectively. The most critical aspects in the development of the Simbol-X mirrors are i) the production of the 100 mandrels with very good surface quality within the timeline of the mission; ii) the replication of shells that must be very thin (a factor of 2 thinner than those of XMM-Newton) and still have very good image quality up to 80 keV; iii) the development of an integration process that allows us to integrate these very thin mirrors maintaining their intrinsic good image quality. The Phase A study has shown that we can fabricate the mandrels with the needed quality and that we have developed a valid integration process. The shells that we have produced so far have a quite good image quality, e.g. HEW <~30 arcsec at 30 keV, and effective area. However, we still need to make some improvements to reach the requirements. We will briefly present these results and discuss the possible improvements that we will investigate during phase B.