Normalized to: Uesugi, K.
[1]
oai:arXiv.org:1805.07707 [pdf] - 1685958
Imaging and spectral performance of CdTe double-sided strip detectors
for the Hard X-ray Imager onboard ASTRO-H
Hagino, Kouichi;
Odaka, Hirokazu;
Sato, Goro;
Watanabe, Shin;
Takeda, Shin'ichiro;
Kokubun, Motohide;
Fukuyama, Taro;
Saito, Shinya;
Sato, Tamotsu;
Ichinohe, Yuto;
Takahashi, Tadayuki;
Nakano, Toshio;
Nakazawa, Kazuhiro;
Makishima, Kazuo;
Tajima, Hiroyasu;
Tanaka, Takaaki;
Ishibashi, Kazunori;
Miyazawa, Takuya;
Sakai, Michito;
Sakanobe, Karin;
Kato, Hiroyoshi;
Takizawa, Shunya;
Uesugi, Kentaro
Submitted: 2018-05-20
The imaging and spectral performance of CdTe double-sided strip detectors
(CdTe-DSDs) was evaluated for the ASTRO-H mission. The charcterized CdTe-DSDs
have a strip pitch of 0.25 mm, an imaging area of 3.2 cm$\times$3.2 cm and a
thickness of 0.75 mm. The detector was successfully operated at a temperature
of $-20^\circ$C and with an applied bias voltage of 250 V. By using two-strip
events as well as one-strip events for the event reconstruction, a good energy
resolution of 2.0 keV at 59.5 keV and a sub-strip spatial resolution was
achieved. The hard X-ray and gamma-ray response of CdTe-DSDs is complex due to
the properties of CdTe and the small pixel effect. Therefore, one of the issues
to investigate is the response of the CdTe-DSD. In order to investigate the
spatial dependence of the detector response, we performed fine beam scan
experiments at SPring-8, a synchrotron radiation facility. From these
experiments, the depth structure of the electric field was determined as well
as properties of carriers in the detector and successfully reproduced the
experimental data with simulated spectra.
[2]
oai:arXiv.org:1509.03478 [pdf] - 1275564
Angular resolution measurements at SPring-8 of a hard X-ray optic for
the New Hard X-ray Mission
Spiga, D.;
Raimondi, L.;
Furuzawa, A.;
Basso, S.;
Binda, R.;
Borghi, G.;
Cotroneo, V.;
Grisoni, G.;
Kunieda, H.;
Marioni, F.;
Matsumoto, H.;
Mori, H.;
Miyazawa, T.;
Negri, B.;
Orlandi, A.;
Pareschi, G.;
Salmaso, B.;
Tagliaferri, G.;
Uesugi, K.;
Valsecchi, G.;
Vernani, D.
Submitted: 2015-09-11
The realization of X-ray telescopes with imaging capabilities in the hard (>
10 keV) X-ray band requires the adoption of optics with shallow (< 0.25 deg)
grazing angles to enhance the reflectivity of reflective coatings. On the other
hand, to obtain large collecting area, large mirror diameters (< 350 mm) are
necessary. This implies that mirrors with focal lengths >10 m shall be produced
and tested. Full-illumination tests of such mirrors are usually performed with
on- ground X-ray facilities, aimed at measuring their effective area and the
angular resolution; however, they in general suffer from effects of the finite
distance of the X-ray source, e.g. a loss of effective area for double
reflection. These effects increase with the focal length of the mirror under
test; hence a "partial" full-illumination measurement might not be fully
representative of the in-flight performances. Indeed, a pencil beam test can be
adopted to overcome this shortcoming, because a sector at a time is exposed to
the X-ray flux, and the compensation of the beam divergence is achieved by
tilting the optic. In this work we present the result of a hard X-ray test
campaign performed at the BL20B2 beamline of the SPring-8 synchrotron radiation
facility, aimed at characterizing the Point Spread Function (PSF) of a
multilayer-coated Wolter-I mirror shell manufactured by Nickel electroforming.
The mirror shell is a demonstrator for the NHXM hard X-ray imaging telescope
(0.3 - 80 keV), with a predicted HEW (Half Energy Width) close to 20 arcsec. We
show some reconstructed PSFs at monochromatic X-ray energies of 15 to 63 keV,
and compare them with the PSFs computed from post-campaign metrology data,
self-consistently treating profile and roughness data by means of a method
based on the Fresnel diffraction theory. The modeling matches the measured PSFs
accurately.