Normalized to: Tutt, J.
[1]
oai:arXiv.org:1603.04839 [pdf] - 1374470
Line Spread Functions of Blazed Off-Plane Gratings Operated in the
Littrow Mounting
DeRoo, Casey T.;
McEntaffer, Randall L.;
Miles, Drew M.;
Peterson, Thomas J.;
Marlowe, Hannah;
Tutt, James H.;
Donovan, Benjamin D.;
Menz, Benedikt;
Burwitz, Vadim;
Hartner, Gisela;
Allured, Ryan;
Smith, Randall K.;
Gunther, Ramses;
Yanson, Alex;
Vacanti, Giuseppe;
Ackermann, Marcelo
Submitted: 2016-03-15
Future soft X-ray (10 - 50 Angstrom) spectroscopy missions require higher
effective areas and resolutions to perform critical science that cannot be done
by instruments on current missions. An X-ray grating spectrometer employing
off-plane reflection gratings would be capable of meeting these performance
criteria. Off-plane gratings with blazed groove facets operated in the Littrow
mounting can be used to achieve excellent throughput into orders achieving high
resolutions. We have fabricated two off-plane gratings with blazed groove
profiles via a technique which uses commonly available microfabrication
processes, is easily scaled for mass production, and yields gratings customized
for a given mission architecture. Both fabricated gratings were tested in the
Littrow mounting at the Max-Planck-Institute for extraterrestrial Physics
PANTER X-ray test facility to assess their performance. The line spread
functions of diffracted orders were measured, and a maximum resolution of 800
$\pm$ 20 is reported. In addition, we also observe evidence of a `blaze' effect
from measurements of relative efficiencies of the diffracted orders.
[2]
oai:arXiv.org:1503.05809 [pdf] - 968633
Performance Testing of a Novel Off-plane Reflection Grating and Silicon
Pore Optic Spectrograph at PANTER
Marlowe, Hannah;
McEntaffer, Randall L.;
Allured, Ryan;
DeRoo, Casey;
Miles, Drew M.;
Donovan, Benjamin D.;
Tutt, James H.;
Burwitz, Vadim;
Menz, Benedikt;
Hartner, Gisela D.;
Smith, Randall K.;
Günther, Ramses;
Yanson, Alex;
Vacanti, Giuseppe;
Ackermann, Marcelo
Submitted: 2015-03-19
An X-ray spectrograph consisting of radially ruled off-plane reflection
gratings and silicon pore optics was tested at the Max Planck Institute for
extraterrestrial Physics PANTER X-ray test facility. The silicon pore optic
(SPO) stack used is a test module for the Arcus small explorer mission, which
will also feature aligned off-plane reflection gratings. This test is the first
time two off-plane gratings were actively aligned to each other and with a SPO
to produce an overlapped spectrum. The gratings were aligned using an active
alignment module which allows for the independent manipulation of subsequent
gratings to a reference grating in three degrees of freedom using picomotor
actuators which are controllable external to the test chamber. We report the
line spread functions of the spectrograph and the actively aligned gratings,
and plans for future development.
[3]
oai:arXiv.org:1301.5531 [pdf] - 1159228
First results from a next-generation off-plane X-ray diffraction grating
McEntaffer, Randall;
DeRoo, Casey;
Schultz, Ted;
Gantner, Brennan;
Tutt, James;
Holland, Andrew;
O'Dell, Stephen;
Gaskin, Jessica;
Kolodziejczak, Jeffrey;
Zhang, William W.;
Chan, Kai-Wing;
Biskach, Michael;
McClelland, Ryan;
Iazikov, Dmitri;
Wang, Xinpeng;
Koecher, Larry
Submitted: 2013-01-23
Future NASA X-ray spectroscopy missions will require high throughput, high
resolution grating spectrometers. Off-plane reflection gratings are capable of
meeting the performance requirements needed to realize the scientific goals of
these missions. We have identified a novel grating fabrication method that
utilizes common lithographic and microfabrication techniques to produce the
high fidelity groove profile necessary to achieve this performance. Application
of this process has produced an initial pre-master that exhibits a radial
(variable line spacing along the groove dimension), high density (>6000
grooves/mm), laminar profile. This pre-master has been tested for diffraction
efficiency at the BESSY II synchrotron light facility and diffracts up to 55%
of incident light into usable spectral orders. Furthermore, tests of spectral
resolving power show that these gratings are capable of obtaining resolutions
well above 1300 ($\lambda/\Delta\lambda$) with limitations due to the test
apparatus, not the gratings. Obtaining these results has provided confidence
that this fabrication process is capable of producing off-plane reflection
gratings for the next generation of X-ray observatories.