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Tutt, James

Normalized to: Tutt, J.

3 article(s) in total. 29 co-authors, from 1 to 3 common article(s). Median position in authors list is 6,0.

[1]  oai:arXiv.org:1603.04839  [pdf] - 1374470
Line Spread Functions of Blazed Off-Plane Gratings Operated in the Littrow Mounting
Comments: 25 pages including references
Submitted: 2016-03-15
Future soft X-ray (10 - 50 Angstrom) spectroscopy missions require higher effective areas and resolutions to perform critical science that cannot be done by instruments on current missions. An X-ray grating spectrometer employing off-plane reflection gratings would be capable of meeting these performance criteria. Off-plane gratings with blazed groove facets operated in the Littrow mounting can be used to achieve excellent throughput into orders achieving high resolutions. We have fabricated two off-plane gratings with blazed groove profiles via a technique which uses commonly available microfabrication processes, is easily scaled for mass production, and yields gratings customized for a given mission architecture. Both fabricated gratings were tested in the Littrow mounting at the Max-Planck-Institute for extraterrestrial Physics PANTER X-ray test facility to assess their performance. The line spread functions of diffracted orders were measured, and a maximum resolution of 800 $\pm$ 20 is reported. In addition, we also observe evidence of a `blaze' effect from measurements of relative efficiencies of the diffracted orders.
[2]  oai:arXiv.org:1503.05809  [pdf] - 968633
Performance Testing of a Novel Off-plane Reflection Grating and Silicon Pore Optic Spectrograph at PANTER
Comments: Draft Version March 19, 2015
Submitted: 2015-03-19
An X-ray spectrograph consisting of radially ruled off-plane reflection gratings and silicon pore optics was tested at the Max Planck Institute for extraterrestrial Physics PANTER X-ray test facility. The silicon pore optic (SPO) stack used is a test module for the Arcus small explorer mission, which will also feature aligned off-plane reflection gratings. This test is the first time two off-plane gratings were actively aligned to each other and with a SPO to produce an overlapped spectrum. The gratings were aligned using an active alignment module which allows for the independent manipulation of subsequent gratings to a reference grating in three degrees of freedom using picomotor actuators which are controllable external to the test chamber. We report the line spread functions of the spectrograph and the actively aligned gratings, and plans for future development.
[3]  oai:arXiv.org:1301.5531  [pdf] - 1159228
First results from a next-generation off-plane X-ray diffraction grating
Comments: 17 pages, 10 figures, Submitted to Experimetal Astronomy
Submitted: 2013-01-23
Future NASA X-ray spectroscopy missions will require high throughput, high resolution grating spectrometers. Off-plane reflection gratings are capable of meeting the performance requirements needed to realize the scientific goals of these missions. We have identified a novel grating fabrication method that utilizes common lithographic and microfabrication techniques to produce the high fidelity groove profile necessary to achieve this performance. Application of this process has produced an initial pre-master that exhibits a radial (variable line spacing along the groove dimension), high density (>6000 grooves/mm), laminar profile. This pre-master has been tested for diffraction efficiency at the BESSY II synchrotron light facility and diffracts up to 55% of incident light into usable spectral orders. Furthermore, tests of spectral resolving power show that these gratings are capable of obtaining resolutions well above 1300 ($\lambda/\Delta\lambda$) with limitations due to the test apparatus, not the gratings. Obtaining these results has provided confidence that this fabrication process is capable of producing off-plane reflection gratings for the next generation of X-ray observatories.