The existence of dark matter is undisputed, while the nature of it is still unknown. Explaining dark matter with the existence of a new unobserved particle is among the most promising possible solutions. Recently dark matter candidates in the MeV mass region received more and more interest. In comparison to the mass region between a few GeV to several TeV, this region is experimentally largely unexplored. We discuss the application of a RNDR DEPFET semiconductor detector for direct searches for dark matter in the MeV mass region. We present the working principle of the RNDR DEPFET devices and review the performance obtained by previously performed prototype measurements. The future potential of the technology as dark matter detector is discussed and the sensitivity for MeV dark matter detection with RNDR DEPFET sensors is presented. Under the assumption of three background events in the region of interest and an exposure of one kg$\cdot$y a sensitivity of $\bar{\sigma}_{\bar{e}} = 10^{-41}$ cm$^{2}$ for dark matter particles with a mass of 10 MeV can be reached.

The Wide Field Imager (WFI) is one of the two scientific instruments proposed for the Athena+ X-ray observatory. It will provide imaging in the 0.1-15 keV band over a wide field, simultaneously with spectrally and time-resolved photon counting. The instrument is designed to make optimal use of the grasp (collecting area times solid angle product) provided by the optical design of the Athena+ mirror system (Willingale et al. 2013), by combining a sensitive approx. 40' diameter field of view (baseline; 50' goal) DEPFET detector with a pixel size properly sampling the angular resolution of 5 arc sec on-axis (half energy width).This synthesis makes the WFI a very powerful survey instrument, significantly surpassing currently existing capabilities (Nandra et al. 2013; Aird et al. 2013). In addition, the WFI will provide unprecedented simultaneous high-time resolution and high count rate capabilities for the observation of bright sources with low pile-up and high efficiency. In this paper, we summarize the instrument design, the status of the technology development, and the baseline performance.