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Spiga, Daniele

Normalized to: Spiga, D.

45 article(s) in total. 1979 co-authors, from 1 to 28 common article(s). Median position in authors list is 1,0.

[1]  oai:arXiv.org:1909.02454  [pdf] - 1956042
The Voyage of Metals in the Universe from Cosmological to Planetary Scales: the need for a Very High-Resolution, High Throughput Soft X-ray Spectrometer
Comments: White-Paper submitted in response to the "Voyage-2050" ESA call: cover page + 20 page text (including 16 figures) + 5 page references + list of team-members. Additional supporting authors are listed in the acknowledgment section at page 20 of the paper
Submitted: 2019-09-05
Metals form an essential part of the Universe at all scales. Without metals we would not exist, and the Cosmos would look completely different. Metals are primarily born through nuclear processes in stars. They leave their cradles through winds or explosions, and then start their journey through space. This can lead them in and out of astronomical objects on all scales, ranging from comets, planets, stars, entire galaxies, groups and clusters of galaxies to the largest structures of the Universe. Their wanderings are fundamental in determining how these objects, and the entire universe, evolve. In addition, their bare presence can be used to trace what these structures look like. The scope of this paper is to highlight the most important open astrophysical problems that will be central in the next decades and for which a deep understanding of the Universe-wandering metals, their physical and kinematical states and their chemical composition represents the only viable solution. The majority of these studies can only be efficiently performed through High Resolution Spectroscopy in the soft X-ray band.
[2]  oai:arXiv.org:1908.08586  [pdf] - 1948262
PHEMTO : Polarimetric High Energy Modular Telescope Observatory
Comments: 20 pages, White Paper submitted for High Energy Astrophysics to the Voyage 2050 ESA Call
Submitted: 2019-08-22
With the opening of the X and gamma--ray windows in the sixties, thanks to to sounding rockets and satellite-borne instruments, extremely energetic and violent phenomena were discovered and subsequently found to be ubiquitous in the Universe. Observations in the high energy domain are fundamental for understanding how matter is organized and behaves around black holes; unravelling how these extreme objects influence their environments on a very large scale; and finding the still elusive obscured massive objects in the centre of galaxies. Other major problems in contemporary astrophysics, such as the understanding of acceleration processes at shocks of all sizes (those of pulsar wind nebulae, supernova remnants, but also at larger scales those of Active Galactic Nuclei radio lobes) in relation to the origin of cosmic-rays, or the definitive characterization of the debated non-thermal X-ray energy content of clusters of galaxies, also requires observations at very high energies. An observatory type medium mission operating from around 1 keV to about 600 keV can provide direct insights into these major questions. The essential characteristics will be coverage of the full energy range by telescopes featuring a large throughput and arc-second resolution optics, coupled to a compact focal plane assembly, with excellent imaging resolution and spectroscopy. In addition, the mission will provide unique polarimetry measurements in the hard X-ray domain, an important new diagnostic tool at energies for which the non-thermal processes dominate. The Polarimetric High-Energy Modular Telescope Observatory (PHEMTO) is designed to have performance several orders of magnitude better than the present hard X-ray instruments. This gives to PHEMTO the improvements in scientific performance needed for a mission in the 2050 era.
[3]  oai:arXiv.org:1908.01778  [pdf] - 1929957
Voyage through the Hidden Physics of the Cosmic Web
Comments: White paper submitted in response to ESA's Voyage 2050 Call
Submitted: 2019-08-05
The majority of the ordinary matter in the local Universe has been heated by strong structure formation shocks and resides in a largely unexplored hot, diffuse, X-ray emitting plasma that permeates the halos of galaxies, galaxy groups and clusters, and the cosmic web. We propose a next-generation "Cosmic Web Explorer" that will permit a complete and exhaustive understanding of these unseen baryons. This will be the first mission capable to reach the accretion shocks located several times farther than the virial radii of galaxy clusters, and reveal the out-of-equilibrium parts of the intra-cluster medium which are live witnesses to the physics of cosmic accretion. It will also enable a view of the thermal, kinematic, and chemical composition of the circum-galactic medium in galaxies with masses similar to the Milky Way, at the same level of detail that $Athena$ will unravel for the virialized regions of massive galaxy clusters, delivering a transformative understanding of the evolution of those galaxies in which most of the stars and metals in the Universe were formed. Finally, the proposed X-ray satellite will connect the dots of the large-scale structure by mapping, at high spectral resolution, as much as 100% of the diffuse gas hotter than $10^6$ K that fills the filaments of the cosmic web at low redshifts, down to an over-density of 1, both in emission and in absorption against the ubiquitous cosmic X-ray background, surveying up to half of the sky over 5 years in orbit. This requires a large effective area (~10 m$^2$ at 1 keV) over a large field of view (~1 deg$^2$), a megapixel cryogenic microcalorimeter array providing integral field spectroscopy with a resolving power $E/\Delta E$ = 2000 at 0.6 keV and a spatial resolution of 5" in the soft X-ray band, and a Low-Earth orbit that ensures a stable instrumental background and high sensitivity to faint, extended emission.
[4]  oai:arXiv.org:1812.04020  [pdf] - 1795995
The enhanced X-ray Timing and Polarimetry mission - eXTP
Zhang, ShuangNan; Santangelo, Andrea; Feroci, Marco; Xu, YuPeng; Lu, FangJun; Chen, Yong; Feng, Hua; Zhang, Shu; Brandt, Søren; Hernanz, Margarita; Baldini, Luca; Bozzo, Enrico; Campana, Riccardo; De Rosa, Alessandra; Dong, YongWei; Evangelista, Yuri; Karas, Vladimir; Meidinger, Norbert; Meuris, Aline; Nandra, Kirpal; Pan, Teng; Pareschi, Giovanni; Orleanski, Piotr; Huang, QiuShi; Schanne, Stephane; Sironi, Giorgia; Spiga, Daniele; Svoboda, Jiri; Tagliaferri, Gianpiero; Tenzer, Christoph; Vacchi, Andrea; Zane, Silvia; Walton, Dave; Wang, ZhanShan; Winter, Berend; Wu, Xin; Zand, Jean J. M. in 't; Ahangarianabhari, Mahdi; Ambrosi, Giovanni; Ambrosino, Filippo; Barbera, Marco; Basso, Stefano; Bayer, Jörg; Bellazzini, Ronaldo; Bellutti, Pierluigi; Bertucci, Bruna; Bertuccio, Giuseppe; Borghi, Giacomo; Cao, XueLei; Cadoux, Franck; Campana, Riccardo; Ceraudo, Francesco; Chen, TianXiang; Chen, YuPeng; Chevenez, Jerome; Civitani, Marta; Cui, Wei; Cui, WeiWei; Dauser, Thomas; Del Monte, Ettore; Di Cosimo, Sergio; Diebold, Sebastian; Doroshenko, Victor; Dovciak, Michal; Du, YuanYuan; Ducci, Lorenzo; Fan, QingMei; Favre, Yannick; Fuschino, Fabio; Gálvez, José Luis; Gao, Min; Ge, MingYu; Gevin, Olivier; Grassi, Marco; Gu, QuanYing; Gu, YuDong; Han, DaWei; Hong, Bin; Hu, Wei; Ji, Long; Jia, ShuMei; Jiang, WeiChun; Kennedy, Thomas; Kreykenbohm, Ingo; Kuvvetli, Irfan; Labanti, Claudio; Latronico, Luca; Li, Gang; Li, MaoShun; Li, Xian; Li, Wei; Li, ZhengWei; Limousin, Olivier; Liu, HongWei; Liu, XiaoJing; Lu, Bo; Luo, Tao; Macera, Daniele; Malcovati, Piero; Martindale, Adrian; Michalska, Malgorzata; Meng, Bin; Minuti, Massimo; Morbidini, Alfredo; Muleri, Fabio; Paltani, Stephane; Perinati, Emanuele; Picciotto, Antonino; Piemonte, Claudio; Qu, JinLu; Rachevski, Alexandre; Rashevskaya, Irina; Rodriguez, Jerome; Schanz, Thomas; Shen, ZhengXiang; Sheng, LiZhi; Song, JiangBo; Song, LiMing; Sgro, Carmelo; Sun, Liang; Tan, Ying; Uttley, Phil; Wang, Juan; Wang, LangPing; Wang, YuSa; Watts, Anna L.; Wen, XiangYang; Wilms, Jörn; Xiong, ShaoLin; Yang, JiaWei; Yang, Sheng; Yang, YanJi; Yu, Nian; Zhang, WenDa; Zampa, Gianluigi; Zampa, Nicola; Zdziarski, Andrzej A.; Zhang, AiMei; Zhang, ChengMo; Zhang, Fan; Zhang, Long; Zhang, Tong; Zhang, Yi; Zhang, XiaoLi; Zhang, ZiLiang; Zhao, BaoSheng; Zheng, ShiJie; Zhou, YuPeng; Zorzi, Nicola; Zwart, J. Frans
Comments: Accepted for publication on Sci. China Phys. Mech. Astron. (2019)
Submitted: 2018-12-10
In this paper we present the enhanced X-ray Timing and Polarimetry mission - eXTP. eXTP is a space science mission designed to study fundamental physics under extreme conditions of density, gravity and magnetism. The mission aims at determining the equation of state of matter at supra-nuclear density, measuring effects of QED, and understanding the dynamics of matter in strong-field gravity. In addition to investigating fundamental physics, eXTP will be a very powerful observatory for astrophysics that will provide observations of unprecedented quality on a variety of galactic and extragalactic objects. In particular, its wide field monitoring capabilities will be highly instrumental to detect the electro-magnetic counterparts of gravitational wave sources. The paper provides a detailed description of: (1) the technological and technical aspects, and the expected performance of the instruments of the scientific payload; (2) the elements and functions of the mission, from the spacecraft to the ground segment.
[5]  oai:arXiv.org:1610.09258  [pdf] - 1504566
Design and advancement status of the Beam Expander Testing X-ray facility (BEaTriX)
Comments: Accepted paper, pre-print version. The finally published manuscript can be downloaded from http://dx.doi.org/10.1117/12.2238952
Submitted: 2016-10-28
The BEaTriX (Beam Expander Testing X-ray facility) project is an X-ray apparatus under construction at INAF/OAB to generate a broad (200 x 60 mm2), uniform and low-divergent X-ray beam within a small lab (6 x 15 m2). BEaTriX will consist of an X-ray source in the focus a grazing incidence paraboloidal mirror to obtain a parallel beam, followed by a crystal monochromation system and by an asymmetrically-cut diffracting crystal to perform the beam expansion to the desired size. Once completed, BEaTriX will be used to directly perform the quality control of focusing modules of large X-ray optics such as those for the ATHENA X-ray observatory, based on either Silicon Pore Optics (baseline) or Slumped Glass Optics (alternative), and will thereby enable a direct quality control of angular resolution and effective area on a number of mirror modules in a short time, in full X-ray illumination and without being affected by the finite distance of the X-ray source. However, since the individual mirror modules for ATHENA will have an optical quality of 3-4 arcsec HEW or better, BEaTriX is required to produce a broad beam with divergence below 1-2 arcsec, and sufficient flux to quickly characterize the PSF of the module without being significantly affected by statistical uncertainties. Therefore, the optical components of BEaTriX have to be selected and/or manufactured with excellent optical properties in order to guarantee the final performance of the system. In this paper we report the final design of the facility and a detailed performance simulation.
[6]  oai:arXiv.org:1610.00723  [pdf] - 1490921
Roughness tolerances for Cherenkov telescope mirrors
Comments: Preprint version. The fully published paper can be found at https://doi.org/10.1117/12.2187025
Submitted: 2016-10-03
The Cherenkov Telescope Array (CTA) is a forthcoming international ground-based observatory for very high-energy gamma rays. Its goal is to reach sensitivity five to ten times better than existing Cherenkov telescopes such as VERITAS, H.E.S.S. or MAGIC and extend the range of observation to energies down to few tens of GeV and beyond 100 TeV. To achieve this goal, an array of about 100 telescopes is required, meaning a total reflective surface of several thousands of square meters. Thence, the optimal technology used for CTA mirrors manufacture should be both low-cost (~1000 euros/m2) and allow high optical performances over the 300-550 nm wavelength range. More exactly, a reflectivity higher than 85% and a PSF (Point Spread Function) diameter smaller than 1 mrad. Surface roughness can significantly contribute to PSF broadening and limit telescope performances. Fortunately, manufacturing techniques for mirrors are now available to keep the optical scattering well below the geometrically-predictable effect of figure errors. This paper determines first order surface finish tolerances based on a surface microroughness characterization campaign, using Phase Shift Interferometry. That allows us to compute the roughness contribution to Cherenkov telescope PSF. This study is performed for diverse mirror candidates (MAGIC-I and II, ASTRI, MST) varying in manufacture technologies, selected coating materials and taking into account the degradation over time due to environmental hazards.
[7]  oai:arXiv.org:1610.00693  [pdf] - 1490079
Computation and validation of two-dimensional PSF simulation based on physical optics
Comments: Preprint version. The fully published paper can be found at https://doi.org/10.1117/12.2187534
Submitted: 2016-10-03
The Point Spread Function (PSF) is a key figure of merit for specifying the angular resolution of optical systems and, as the demand for higher and higher angular resolution increases, the problem of surface finishing must be taken seriously even in optical telescopes. From the optical design of the instrument, reliable ray-tracing routines allow computing and display of the PSF based on geometrical optics. However, such an approach does not directly account for the scattering caused by surface microroughness, which is interferential in nature. Although the scattering effect can be separately modeled, its inclusion in the ray-tracing routine requires assumptions that are difficult to verify. In that context, a purely physical optics approach is more appropriate as it remains valid regardless of the shape and size of the defects appearing on the optical surface. Such a computation, when performed in two-dimensional consideration, is memory and time consuming because it requires one to process a surface map with a few micron resolution, and the situation becomes even more complicated in case of optical systems characterized by more than one reflection. Fortunately, the computation is significantly simplified in far-field configuration, since the computation involves only a sequence of Fourier Transforms. In this paper, we provide validation of the PSF simulation with Physical Optics approach through comparison with real PSF measurement data in the case of ASTRI-SST M1 hexagonal segments. These results represent a first foundation stone for future development in a more advanced computation taking into account microroughness and multiple reflection in optical systems.
[8]  oai:arXiv.org:1610.00272  [pdf] - 1490021
Manufacturing and testing a thin glass mirror shell with piezoelectric active control
Comments: Preprint version. The fully published paper is found at https://doi.org/10.1117/12.2189990
Submitted: 2016-10-02
Optics for future X-ray telescopes will be characterized by very large aperture and focal length, and will be made of lightweight materials like glass or silicon in order to keep the total mass within acceptable limits. Optical modules based on thin slumped glass foils are being developed at various institutes, aiming at improving the angular resolution to a few arcsec HEW. Thin mirrors are prone to deform, so they require a careful integration to avoid deformations and even correct forming errors. On the other hand, this offers the opportunity to actively correct the residual deformation: a viable possibility to improve the mirror figure is the application of piezoelectric actuators onto the non-optical side of the mirrors, and several groups are already at work on this approach. The concept we are developing consists of actively integrating thin glass foils with piezoelectric patches, fed by voltages driven by the feedback provided by X-rays. The actuators are commercial components, while the tension signals are carried by a printed circuit obtained by photolithography, and the driving electronic is a multi-channel low power consumption voltage supply developed in-house. Finally, the shape detection and the consequent voltage signal to be provided to the piezoelectric array are determined in X-rays, in intra-focal setup at the XACT facility at INAF/OAPA. In this work, we describe the manufacturing steps to obtain a first active mirror prototype and the very first test performed in X-rays.
[9]  oai:arXiv.org:1609.09655  [pdf] - 1489506
Analytical computation of stray light in nested mirror modules for X-ray telescopes
Comments: Preprint version. The fully published version can be downloaded at http://dx.doi.org/10.1117/12.2185414
Submitted: 2016-09-30
Stray light in X-ray telescopes is a well-known issue. Unlike rays focused via a double reflection by usual grazing-incidence geometries such as the Wolter-I, stray rays coming from off-axis sources are reflected only once by either the parabolic or the hyperbolic segment. Although not focused, stray light may represent a major source of background and ghost images especially when observing a field of faint sources in the vicinities of another, more intense, just outside the field of view of the telescope. The stray light problem is faced by mounting a pre-collimator in front of the mirror module, in order to shade a part of the reflective surfaces that may give rise to singly-reflected rays. Studying the expected stray light impact, and consequently designing a pre-collimator, is a typical ray-tracing problem, usually time and computation consuming, especially if we consider that rays propagate throughout a densely nested structure. This in turn requires one to pay attention to all the possible obstructions, increasing the complexity of the simulation. In contrast, approaching the problems of stray light calculation from an analytical viewpoint largely simplifies the problem, and may also ease the task of designing an effective pre-collimator. In this work we expose an analytical formalism that can be used to compute the stray light in a nested optical module in a fast and effective way, accounting for obstruction effects.
[10]  oai:arXiv.org:1609.09683  [pdf] - 1489510
Testing multilayer-coated polarizing mirrors for the LAMP soft X-ray telescope
Comments: Preprint version: the fully published paper can be downloaded at http://dx.doi.org/10.1117/12.2185432
Submitted: 2016-09-30
The LAMP (Lightweight Asymmetry and Magnetism Probe) X-ray telescope is a mission concept to measure the polarization of X-ray astronomical sources at 250 eV via imaging mirrors that reflect at incidence angles near the polarization angle, i.e., 45 deg. Hence, it will require the adoption of multilayer coatings with a few nanometers d-spacing in order to enhance the reflectivity. The nickel electroforming technology has already been successfully used to fabricate the high angular resolution imaging mirrors of the X-ray telescopes SAX, XMM-Newton, and Swift/XRT. We are investigating this consolidated technology as a possible technique to manufacture focusing mirrors for LAMP. Although the very good reflectivity performances of this kind of mirrors were already demonstrated in grazing incidence, the reflectivity and the scattering properties have not been tested directly at the unusually large angle of 45 deg. Other possible substrates are represented by thin glass foils or silicon wafers. In this paper we present the results of the X-ray reflectivity campaign performed at the BEAR beamline of Elettra - Sincrotrone Trieste on multilayer coatings of various composition (Cr/C, Co/C), deposited with different sputtering parameters on nickel, silicon, and glass substrates, using polarized X-rays in the spectral range 240 - 290 eV.
[11]  oai:arXiv.org:1609.09677  [pdf] - 1489509
BEaTriX, expanded X-ray beam facility for testing modular elements of telescope optics: an update
Comments: Preprint version: the fully published paper can be downloaded at http://dx.doi.org/10.1117/12.2188607
Submitted: 2016-09-30
We present in this paper an update on the design of BEaTriX (Beam Expander Testing X-ray facility), an X-ray apparatus to be realized at INAF/OAB and that will generate an expanded, uniform and parallel beam of soft X-rays. BEaTriX will be used to perform the functional tests of X-ray focusing modules of large X-ray optics such as those for the ATHENA X-ray observatory, using the Silicon Pore Optics (SPO) as a baseline technology, and Slumped Glass Optics (SGO) as a possible alternative. Performing the tests in X-rays provides the advantage of an in-situ, at-wavelength quality control of the optical modules produced in series by the industry, performing a selection of the modules with the best angular resolution, and, in the case of SPOs, there is also the interesting possibility to align the parabolic and the hyperbolic stacks directly under X-rays, to minimize the aberrations. However, a parallel beam with divergence below 2 arcsec is necessary in order to measure mirror elements that are expected to reach an angular resolution of about 4 arcsec, since the ATHENA requirement for the entire telescope is 5 arcsec. Such a low divergence over the typical aperture of modular optics would require an X-ray source to be located in a several kilometers long vacuum tube. In contrast, BEaTriX will be compact enough (5 m x 14 m) to be housed in a small laboratory, will produce an expanded X-ray beam 60 mm x 200 mm broad, characterized by a very low divergence (1.5 arcsec HEW), strong polarization, high uniformity, and X-ray energy selectable between 1.5 keV and 4.5 keV. In this work we describe the BEaTriX layout and show a performance simulation for the X-ray energy of 4.5 keV.
[12]  oai:arXiv.org:1607.05319  [pdf] - 1439929
Monte Carlo simulations of soft proton flares: testing the physics with XMM-Newton
Comments:
Submitted: 2016-07-18
Low energy protons (<100-300 keV) in the Van Allen belt and the outer regions can enter the field of view of X-ray focusing telescopes, interact with the Wolter-I optics, and reach the focal plane. The use of special filters protects the XMM-Newton focal plane below an altitude of 70000 km, but above this limit the effect of soft protons is still present in the form of sudden flares in the count rate of the EPIC instruments, causing the loss of large amounts of observing time. We try to characterize the input proton population and the physics interaction by simulating, using the BoGEMMS framework, the proton interaction with a simplified model of the X-ray mirror module and the focal plane, and comparing the result with a real observation. The analysis of ten orbits of observations of the EPIC/pn instrument show that the detection of flares in regions far outside the radiation belt is largely influenced by the different orientation of the Earth's magnetosphere respect with XMM-Newton's orbit, confirming the solar origin of the soft proton population. The Equator-S proton spectrum at 70000 km altitude is used for the proton population entering the optics, where a combined multiple and Firsov scattering is used as physics interaction. If the thick filter is used, the soft protons in the 30-70 keV energy range are the main contributors to the simulated spectrum below 10 keV. We are able to reproduce the proton vignetting observed in real data-sets, with a 50\% decrease from the inner to the outer region, but a maximum flux of 0.01 counts cm-2 s-1 keV-1 is obtained below 10 keV, about 5 times lower than the EPIC/MOS detection and 100 times lower than the EPIC/pn one. Given the high variability of the flare intensity, we conclude that an average spectrum, based on the analysis of a full season of soft proton events is required to compare Monte Carlo simulations with real events.
[13]  oai:arXiv.org:1510.00910  [pdf] - 1287738
Active shape correction of a thin glass/plastic X-ray mirror
Comments:
Submitted: 2015-10-04
Optics for future X-ray telescopes will be characterized by very large aperture and focal length, and will be made of lightweight materials like glass or plastic in order to keep the total mass within acceptable limits. Optics based on thin slumped glass foils are currently in use in the NuSTAR telescope and are being developed at various institutes like INAF/OAB, aiming at improving the angular resolution to a few arcsec HEW. Another possibility would be the use of thin plastic foils, being developed at SAO and the Palermo University. Even if relevant progresses in the achieved angular resolution were recently made, a viable possibility to further improve the mirror figure would be the application of piezoelectric actuators onto the non-optical side of the mirrors. In fact, thin mirrors are prone to deform, so they require a careful integration to avoid deformations and even correct forming errors. This however offers the possibility to actively correct the residual deformation. Even if other groups are already at work on this idea, we are pursuing the concept of active integration of thin glass or plastic foils with piezoelectric patches, fed by voltages driven by the feedback provided by X-rays, in intra-focal setup at the XACT facility at INAF/OAPA. In this work, we show the preliminary simulations and the first steps taken in this project.
[14]  oai:arXiv.org:1509.04769  [pdf] - 1278414
Analysis of microroughness evolution in X-ray astronomical multilayer mirrors by surface topography with the MPES program and by X-ray scattering
Comments:
Submitted: 2015-09-15
Future hard X-ray telescopes (e.g. SIMBOL-X and Constellation-X) will make use of hard X-ray optics with multilayer coatings, with angular resolutions comparable to the achieved ones in the soft X-rays. One of the crucial points in X-ray optics, indeed, is multilayer interfacial microroughness that causes effective area reduction and X-Ray Scattering (XRS). The latter, in particular, is responsible for image quality degradation. Interfacial smoothness deterioration in multilayer deposition processes is commonly observed as a result of substrate profile replication and intrinsic random deposition noise. For this reason, roughness growth should be carefully investigated by surface topographic analysis, X-ray reflectivity and XRS measurements. It is convenient to express the roughness evolution in terms of interface Power Spectral Densities (PSD), that are directly related to XRS and, in turn, in affecting the optic HEW (Half Energy Width). In order to interpret roughness amplification and to help us to predict the imaging performance of hard X-ray optics, we have implemented a well known kinetic continuum equation model in a IDL language program (MPES, Multilayer PSDs Evolution Simulator), allowing us the determination of characteristic growth parameters in multilayer coatings. In this paper we present some results from analysis we performed on several samples coated with hard X-ray multilayers (W/Si, Pt/C, Mo/Si) using different deposition techniques. We show also the XRS predictions resulting from the obtained modelizations, in comparison to the experimental XRS measurements performed at the energy of 8.05 keV.
[15]  oai:arXiv.org:1509.04770  [pdf] - 1278415
An expanded X-ray beam facility (BEaTriX) to test the modular elements of the ATHENA optics
Comments:
Submitted: 2015-09-15
Future large X-ray observatories like ATHENA will be equipped with very large optics, obtained by assembling modular optical elements, named X-ray Optical Units (XOU) based on the technology of either Silicon Pore Optics or Slumped Glass Optics. In both cases, the final quality of the modular optic (a 5 arcsec HEW requirement for ATHENA) is determined by the accuracy alignment of the XOUs within the assembly, but also by the angular resolution of the individual XOU. This is affected by the mirror shape accuracy, its surface roughness, and the mutual alignment of the mirrors within the XOU itself. Because of the large number of XOUs to be produced, quality tests need to be routinely done to select the most performing stacked blocks, to be integrated into the final optic. In addition to the usual metrology based on profile and roughness measurements, a direct measurement with a broad, parallel, collimated and uniform X- ray beam would be the most reliable test, without the need of a focal spot reconstruction as usually done in synchrotron light. To this end, we designed the BEaTriX (Beam Expander Testing X-ray facility) to be realized at INAF-OAB, devoted to the functional tests of the XOUs. A grazing incidence parabolic mirror and an asymmetrically cut crystal will produce a parallel X-ray beam broad enough to illuminate the entire aperture of the focusing elements. An X-ray camera at the focal distance from the mirrors will directly record the image. The selection of different crystals will enable to test the XOUs in the 1 - 5 keV range, included in the X-ray energy band of ATHENA (0.2-12 keV). In this paper we discuss a possible BEaTriX facility implementation. We also show a preliminary performance simulation of the optical system.
[16]  oai:arXiv.org:1509.04777  [pdf] - 1278416
X-ray optical systems: from metrology to Point Spread Function
Comments:
Submitted: 2015-09-15
One of the problems often encountered in X-ray mirror manufacturing is setting proper manufacturing tolerances to guarantee an angular resolution - often expressed in terms of Point Spread Function (PSF) - as needed by the specific science goal. To do this, we need an accurate metrological apparatus, covering a very broad range of spatial frequencies, and an affordable method to compute the PSF from the metrology dataset. [...] However, the separation between these spectral ranges is difficult do define exactly, and it is also unclear how to affordably combine the PSFs, computed with different methods in different spectral ranges, into a PSF expectation at a given X-ray energy. For this reason, we have proposed a method entirely based on the Huygens-Fresnel principle to compute the diffracted field of real Wolter-I optics, including measured defects over a wide range of spatial frequencies. Owing to the shallow angles at play, the computation can be simplified limiting the computation to the longitudinal profiles, neglecting completely the effect of roundness errors. Other authors had already proposed similar approaches in the past, but only in far-field approximation, therefore they could not be applied to the case of Wolter-I optics, in which two reflections occur in sequence within a short range. The method we suggest is versatile, as it can be applied to multiple reflection systems, at any X-ray energy, and regardless of the nominal shape of the mirrors in the optical system. The method has been implemented in the WISE code, successfully used to explain the measured PSFs of multilayer-coated optics for astronomic use, and of a K-B optical system in use at the FERMI free electron laser.
[17]  oai:arXiv.org:1509.04392  [pdf] - 1277254
LAMP: a micro-satellite based soft X-ray polarimeter for astrophysics
Comments:
Submitted: 2015-09-15
The Lightweight Asymmetry and Magnetism Probe (LAMP) is a micro-satellite mission concept dedicated for astronomical X-ray polarimetry and is currently under early phase study. It consists of segmented paraboloidal multilayer mirrors with a collecting area of about 1300 cm^2 to reflect and focus 250 eV X-rays, which will be detected by position sensitive detectors at the focal plane. The primary targets of LAMP include the thermal emission from the surface of pulsars and synchrotron emission produced by relativistic jets in blazars. With the expected sensitivity, it will allow us to detect polarization or place a tight upper limit for about 10 pulsars and 20 blazars. In addition to measuring magnetic structures in these objects, LAMP will also enable us to discover bare quark stars if they exist, whose thermal emission is expected to be zero polarized, while the thermal emission from neutron stars is believed to be highly polarized due to plasma polarization and the quantum electrodynamics (QED) effect. Here we present an overview of the mission concept, its science objectives and simulated observational results.
[18]  oai:arXiv.org:1509.03473  [pdf] - 1275562
Characterization of a flat superpolished mandrel prototype with hard (TiN / SiC) overcoating to enhance the surface durability
Comments:
Submitted: 2015-09-11
A number of hard X-Ray (10 - 100 KeV) astronomical missions of near future will make use of multilayer-coated focusing mirrors. The technology based on Nickel electroformed replication is suitable for the multilayer optics realization, since multi-modular telescopes are foreseen. For example, for the Constellation-X mission there is the need of realizing up to 14 identical modules (12 flight modules plus two spares) which can be replicated by the same series of mandrels. The Ni replication approach is derived from the method already successfully used for making the Au coated soft X-ray mirrors with good imaging performances of the missions BeppoSAX, XMM-Newton and Swift. In the technological extension of the process to the multilayer optics fabrication, it would be convenient to overcoat the external surface of mandrels (normally in Kanigen) with a layer made of a very hard material. This would help to maintain the very low roughness level requested by the application (typically less than a couple of Angstroms for a 1 micrometer scan length with AFM) also after many replications and successive cleaning of the mandrel. Good material candidate are at this regard TiN and SiC, both characterized by a very high hardness. We have proven that flat prototypes with TiN and SiC overcoating can be superpolished at a level comparable to the traditional electroless Nickel coating. In this paper we will present a characterization by topographic measurement (AFM and WYKO) and by X-Ray scattering of two of these samples.
[19]  oai:arXiv.org:1508.05894  [pdf] - 1275515
CTA Contributions to the 34th International Cosmic Ray Conference (ICRC2015)
Consortium, The CTA; :; Abchiche, A.; Abeysekara, U.; Abril, Ó.; Acero, F.; Acharya, B. S.; Actis, M.; Agnetta, G.; Aguilar, J. A.; Aharonian, F.; Akhperjanian, A.; Albert, A.; Alcubierre, M.; Alfaro, R.; Aliu, E.; Allafort, A. J.; Allan, D.; Allekotte, I.; Aloisio, R.; Amans, J. -P.; Amato, E.; Ambrogi, L.; Ambrosi, G.; Ambrosio, M.; Anderson, J.; Anduze, M.; Angüner, E. O.; Antolini, E.; Antonelli, L. A.; Antonucci, M.; Antonuccio, V.; Antoranz, P.; Aramo, C.; Aravantinos, A.; Argan, A.; Armstrong, T.; Arnaldi, H.; Arnold, L.; Arrabito, L.; Arrieta, M.; Arrieta, M.; Asano, K.; Asorey, H. G.; Aune, T.; Singh, C. B.; Babic, A.; Backes, M.; Bais, A.; Bajtlik, S.; Balazs, C.; Balbo, M.; Balis, D.; Balkowski, C.; Ballester, O.; Ballet, J.; Balzer, A.; Bamba, A.; Bandiera, R.; Barber, A.; Barbier, C.; Barceló, M.; Barnacka, A.; de Almeida, U. Barres; Barrio, J. A.; Basso, S.; Bastieri, D.; Bauer, C.; Baushev, A.; Becciani, U.; Becherini, Y.; Tjus, J. Becker; Beckmann, V.; Bednarek, W.; Benbow, W.; Ventura, D. Benedico; Berdugo, J.; Berge, D.; Bernardini, E.; Bernhard, S.; Bernlöhr, K.; Bertucci, B.; Besel, M. -A.; Bhatt, N.; Bhattacharjee, P.; Bhattachryya, S.; Biasuzzi, B.; Bicknell, G.; Bigongiari, C.; Biland, A.; Billotta, S.; Bilnik, W.; Biondo, B.; Bird, T.; Birsin, E.; Bissaldi, E.; Biteau, J.; Bitossi, M.; Bigas, O. Blanch; Blasi, P.; Boehm, C.; Bogacz, L.; Bogdan, M.; Bohacova, M.; Boisson, C.; Gargallo, J. Boix; Bolmont, J.; Bonanno, G.; Bonardi, A.; Bonifacio, P.; Bonnoli, G.; Borkowski, J.; Bose, R.; Bosnjak, Z.; Bottani, A.; Böttcher, M.; Bousquet, J. -J.; Boutonnet, C.; Bouyjou, F.; Braiding, C.; Brandt, L.; Brau-Nogué, S.; Bregeon, J.; Bretz, T.; Briggs, M.; Brigida, M.; Bringmann, T.; Brisken, W.; Brocato, E.; Brook, P.; Brown, A. M.; Brun, P.; Brunetti, G.; Brunetti, L.; Bruno, P.; Bryan, M.; Buanes, T.; Bucciantini, N.; Buchholtz, G.; Buckley, J.; Bugaev, V.; Bühler, R.; Bulgarelli, A.; Bulik, T.; Burton, M.; Burtovoi, A.; Busetto, G.; Buson, S.; Buss, J.; Byrum, K.; Cameron, R.; Camprecios, J.; Canelli, F.; Canestrari, R.; Cantu, S.; Capalbi, M.; Capasso, M.; Capobianco, G.; Caraveo, P.; Cardenzana, J.; Carius, S.; Carlile, C.; Carmona, E.; Carosi, A.; Carosi, R.; Carr, J.; Carroll, M.; Carter, J.; Carton, P. -H.; Caruso, R.; Casandjian, J. -M.; Casanova, S.; Cascone, E.; Casiraghi, M.; Castellina, A.; Catalano, O.; Catalanotti, S.; Cavazzani, S.; Cazaux, S.; Cefalà, M.; Cerchiara, P.; Cereda, M.; Cerruti, M.; Chabanne, E.; Chadwick, P.; Champion, C.; Chaty, S.; Chaves, R.; Cheimets, P.; Chen, A.; Chen, X.; Chernyakova, M.; Chiappetti, L.; Chikawa, M.; Chinn, D.; Chitnis, V. R.; Cho, N.; Christov, A.; Chudoba, J.; Cieślar, M.; Cillis, A.; Ciocci, M. A.; Clay, R.; Cohen-Tanugi, J.; Colafrancesco, S.; Colin, P.; Colombo, E.; Colome, J.; Colonges, S.; Compin, M.; Conforti, V.; Connaughton, V.; Connell, S.; Conrad, J.; Contreras, J. L.; Coppi, P.; Corbel, S.; Coridian, J.; Corona, P.; Corti, D.; Cortina, J.; Cossio, L.; Costa, A.; Costantini, H.; Cotter, G.; Courty, B.; Covino, S.; Covone, G.; Crimi, G.; Criswell, S. J.; Crocker, R.; Croston, J.; Cusumano, G.; Da Vela, P.; Dale, Ø.; D'Ammando, F.; Dang, D.; Daniel, M.; Davids, I.; Dawson, B.; Dazzi, F.; Costa, B. de Aguiar; De Angelis, A.; Cardoso, R. F. de Araujo; De Caprio, V.; De Cesare, G.; De Franco, A.; De Frondat, F.; Pino, E. M. de Gouveia Dal; de la Calle, I.; De La Vega, G. A.; Lopez, R. de los Reyes; De Lotto, B.; De Luca, A.; Neto, J. R. T. de Mello; de Naurois, M.; Wilhelmi, E. de Oña; De Palma, F.; de Souza, V.; Decock, G.; Deil, C.; Del Santo, M.; Delagnes, E.; Deleglise, G.; Delgado, C.; della Volpe, D.; Deloye, P.; Depaola, G.; Detournay, M.; Dettlaff, A.; Di Girolamo, T.; Di Giulio, C.; Di Paola, A.; Di Pierro, F.; Di Sciascio, G.; Díaz, C.; Dick, J.; Dickinson, H.; Diebold, S.; Diez, V.; Digel, S.; Dipold, J.; Disset, G.; Distefano, A.; Djannati-Ataï, A.; Doert, M.; Dohmke, M.; Domainko, W.; Dominik, N.; Prester, D. Dominis; Donat, A.; Donnarumma, I.; Dorner, D.; Doro, M.; Dournaux, J. -L.; Doyle, K.; Drake, G.; Dravins, D.; Drury, L.; Dubus, G.; Dumas, D.; Dumm, J.; Durand, D.; D'Urso, D.; Dwarkadas, V.; Dyks, J.; Dyrda, M.; Ebr, J.; Echaniz, J. C.; Edy, E.; Egberts, K.; Egberts, K.; Eger, P.; Einecke, S.; Eisch, J.; Eisenkolb, F.; Eleftheriadis, C.; Elsässer, D.; Emmanoulopoulos, D.; Engelbrecht, C.; Engelhaupt, D.; Ernenwein, J. -P.; Errando, M.; Eschbach, S.; Etchegoyen, A.; Evans, P.; Fairbairn, M.; Falcone, A.; Fantinel, D.; Farakos, K.; Farnier, C.; Farrell, E.; Farrell, S.; Fasola, G.; Fegan, S.; Feinstein, F.; Ferenc, D.; Fernandez, A.; Fernandez-Alonso, M.; Ferreira, O.; Fesquet, M.; Fetfatzis, P.; Fiasson, A.; Filipčič, A.; Filipovic, M.; Fink, D.; Finley, C.; Finley, J. P.; Finoguenov, A.; Fioretti, V.; Fiorini, M.; Curcoll, R. Firpo; Fleischhack, H.; Flores, H.; Florin, D.; Föhr, C.; Fokitis, E.; Font, L.; Fontaine, G.; Fontes, B.; Forest, F.; Fornasa, M.; Förster, A.; Fortin, P.; Fortson, L.; Fouque, N.; Franckowiak, A.; Franco, F. J.; Frankowski, A.; Frega, N.; Albuquerque, I. Freire Mota; Coromina, L. Freixas; Fresnillo, L.; Fruck, C.; Fuessling, M.; Fugazza, D.; Fujita, Y.; Fukami, S.; Fukazawa, Y.; Fukuda, T.; Fukui, Y.; Funk, S.; Gäbele, W.; Gabici, S.; Gadola, A.; Galante, N.; Gall, D. D.; Gallant, Y.; Galloway, D.; Gallozzi, S.; Gao, S.; Garcia, B.; Gil, R. García; López, R. Garcia; Garczarczyk, M.; Gardiol, D.; Gargano, C.; Gargano, F.; Garozzo, S.; Garrecht, F.; Garrido, D.; Garrido, L.; Gascon, D.; Gaskins, J.; Gaudemard, J.; Gaug, M.; Gaweda, J.; Geffroy, N.; Gérard, L.; Ghalumyan, A.; Ghedina, A.; Ghigo, M.; Ghislain, P.; Giannakaki, E.; Gianotti, F.; Giarrusso, S.; Giavitto, G.; Giebels, B.; Giglietto, N.; Gika, V.; Gimenes, R.; Giomi, M.; Giommi, P.; Giordano, F.; Giovannini, G.; Giro, E.; Giroletti, M.; Giuliani, A.; Glicenstein, J. -F.; Godinovic, N.; Goldoni, P.; Berisso, M. Gomez; Vargas, G. A. Gomez; Gonzalez, M. M.; González, A.; González, F.; Muñoz, A. González; Gothe, K. S.; Gotz, D.; Grabarczyk, T.; Graciani, R.; Grandi, P.; Grañena, F.; Granot, J.; Grasseau, G.; Gredig, R.; Green, A. J.; Green, A. M.; Greenshaw, T.; Grenier, I.; Grillo, A.; Grondin, M. -H.; Grube, J.; Grudzinska, M.; Grygorczuk, J.; Guarino, V.; Guberman, D.; Gunji, S.; Gyuk, G.; Hadasch, D.; Hagedorn, A.; Hahn, J.; Hakansson, N.; Heras, N. Hamer; Hanabata, Y.; Hara, S.; Hardcastle, M. J.; Harris, J.; Hassan, T.; Hatanaka, K.; Haubold, T.; Haupt, A.; Hayakawa, T.; Hayashida, M.; Heller, M.; Heller, R.; Henault, F.; Henri, G.; Hermann, G.; Hermel, R.; Llorente, J. Herrera; Herrero, A.; Hervet, O.; Hidaka, N.; Hinton, J.; Hirai, W.; Hirotani, K.; Hoard, D.; Hoffmann, D.; Hofmann, W.; Hofverberg, P.; Holch, T.; Holder, J.; Hooper, S.; Horan, D.; Hörandel, J. R.; Hormigos, S.; Horns, D.; Hose, J.; Houles, J.; Hovatta, T.; Hrabovsky, M.; Hrupec, D.; Huet, J. -M.; Hütten, M.; Humensky, T. B.; Huovelin, J.; Huppert, J. -F.; Iacovacci, M.; Ibarra, A.; Idźkowski, B.; Ikawa, D.; Illa, J. M.; Impiombato, D.; Incorvaia, S.; Inome, Y.; Inoue, S.; Inoue, T.; Inoue, Y.; Iocco, F.; Ioka, K.; Iori, M.; Ishio, K.; Israel, G. L.; Jablonski, C.; Jacholkowska, A.; Jacquemier, J.; Jamrozy, M.; Janecek, P.; Janiak, M.; Jankowsky, F.; Jean, P.; Jeanney, C.; Jegouzo, I.; Jenke, P.; Jimenez, J. J.; Jingo, M.; Jingo, M.; Jocou, L.; Jogler, T.; Johnson, C. A.; Journet, L.; Juffroy, C.; Jung, I.; Kaaret, P. E.; Kagaya, M.; Kakuwa, J.; Kalekin, O.; Kalkuhl, C.; Kankanyan, R.; Karastergiou, A.; Kärcher, K.; Karczewski, M.; Karkar, S.; Karn, P.; Kasperek, J.; Katagiri, H.; Kataoka, J.; Katarzyński, K.; Katz, U.; Kaufmann, S.; Kawanaka, N.; Kawashima, T.; Kazanas, D.; Kelley-Hoskins, N.; Kellner-Leidel, B.; Kendziorra, E.; Kersten, J.; Khélifi, B.; Kieda, D. B.; Kihm, T.; Kisaka, S.; Kissmann, R.; Klepser, S.; Kluźniak, W.; Knapen, J.; Knapp, J.; Knödlseder, J.; Köck, F.; Kocot, J.; Kodakkadan, A.; Kodani, K.; Kohri, K.; Kojima, T.; Kokkotas, K.; Kolitzus, D.; Komin, N.; Kominis, I.; Konno, Y.; Kosack, K.; Koss, G.; Koul, R.; Kowal, G.; Koyama, S.; Kozioł, J.; Kraus, M.; Krause, J.; Krause, M.; Krawzcynski, H.; Krennrich, F.; Kretzschmann, A.; Kruger, P.; Kubo, H.; Kudryavtsev, V.; Mezek, G. Kukec; Kushida, J.; Kuznetsov, A.; La Barbera, A.; La Palombara, N.; La Parola, V.; La Rosa, G.; Laffon, H.; Lagadec, T.; Lahmann, R.; Lalik, K.; Lamanna, G.; Landriu, D.; Landt, H.; Lang, R. G.; Languignon, D.; Lapington, J.; Laporte, P.; Latovski, N.; Law-Green, D.; Fèvre, J. -P. Le; Flour, T. Le; Sidaner, P. Le; Lee, S. -H.; Lee, W. H.; Leffhalm, K.; Leich, H.; de Oliveira, M. A. Leigui; Lelas, D.; Lemière, A.; Lemoine-Goumard, M.; Lenain, J. -P.; Leonard, R.; Leoni, R.; Lessio, L.; Leto, G.; Leveque, A.; Lieunard, B.; Limon, M.; Lindemann, R.; Lindfors, E.; Liolios, A.; Lipniacka, A.; Lockart, H.; Lohse, T.; Loiseau, D.; Łokas, E.; Lombardi, S.; Longo, F.; Longo, G.; Lopatin, A.; Lopez, M.; López-Coto, R.; López-Oramas, A.; Loreggia, D.; Louge, T.; Louis, F.; Lu, C. -C.; Lucarelli, F.; Lucchesi, D.; Lüdecke, H.; Luque-Escamilla, P. L.; Luz, O.; Lyard, E.; Maccarone, M. C.; Maccarone, T. J.; Mach, E.; Madejski, G. M.; Madonna, A.; Mahabir, M.; Maier, G.; Majumdar, P.; Makariev, M.; Malaguti, G.; Malaspina, G.; Mallot, A. K.; Maltezos, S.; Mancilla, A.; Mandat, D.; Maneva, G.; Manigot, P.; Mankushiyil, N.; Mannheim, K.; Maragos, N.; Marano, D.; Marchegiani, P.; Marcomini, J. A.; Marcowith, A.; Mariotti, M.; Marisaldi, M.; Markoff, S.; Marszałek, A.; Martens, C.; Martí, J.; Martin, J. -M.; Martin, P.; Martínez, G.; Martínez, M.; Martínez, O.; Marx, R.; Massimino, P.; Mastichiadis, A.; Mastroianni, S.; Mastropietro, M.; Masuda, S.; Matsumoto, H.; Matsuoka, S.; Mattiazzo, S.; Maurin, G.; Maxted, N.; Maya, J.; Mayer, M.; Mazin, D.; Mazureau, E.; Mazziotta, M. N.; Comb, L. Mc; McCann, A.; McCubbin, N.; McHardy, I.; McKay, R.; McKinney, K.; Meagher, K.; Medina, C.; Mehrez, F.; Melioli, C.; Melkumyan, D.; Melo, D.; Melse, T.; Mereghetti, S.; Mertsch, P.; Meyer, M.; Meyrelles, J. L.; Miccichè, A.; Michałowski, J.; Micolon, P.; Mientjes, P.; Mignot, S.; Mihailidis, A.; Mineo, T.; Minuti, M.; Mirabal, N.; Mirabel, F.; Miranda, J. M.; Mirzoyan, R.; Mistò, A.; Mitchell, A.; Mizuno, T.; Moderski, R.; Mognet, I.; Mohammed, M.; Moharana, R.; Molinari, E.; Monmarthe, E.; Monnier, G.; Montaruli, T.; Monte, C.; Monteiro, I.; Moore, P.; Olaizola, A. Moralejo; Morello, C.; Moretti, E.; Mori, K.; Morlino, G.; Morselli, A.; Mottez, F.; Moudden, Y.; Moulin, E.; Mrusek, I.; Mueller, S.; Mukherjee, R.; Munar-Adrover, P.; Mundell, C.; Muraishi, H.; Murase, K.; Muronga, A.; Murphy, A.; Nagataki, S.; Nagayoshi, T.; Nagesh, B. K.; Naito, T.; Nakajima, D.; Nakamori, T.; Nakayama, K.; Naumann, D.; Nayman, P.; Nellen, L.; Nemmen, R.; Neronov, A.; Neustroev, V.; Neyroud, N.; Nguyen, T.; Nicastro, L.; Nicolau-Kukliński, J.; Niederwanger, F.; Niedźwiecki, A.; Niemiec, J.; Nieto, D.; Nievas, M.; Nikolaidis, A.; Nishijima, K.; Nishikawa, K. -I.; Noda, K.; Nogues, L.; Nolan, S.; Northrop, R.; Nosek, D.; Nozka, L.; Nunio, F.; Oakes, L.; O'Brien, P.; Occhipinti, G.; de Bhroithe, A. O'Faolain; Ogino, M.; Ohira, Y.; Ohishi, M.; Ohm, S.; Ohoka, H.; Okumura, A.; Olive, J. -F.; Olszowski, D.; Ong, R. A.; Ono, S.; Orienti, M.; Orito, R.; Orlati, A.; Orlati, A.; Osborne, J.; Ostrowski, M.; Otero, L. A.; Ottaway, D.; Otte, N.; Oya, I.; Ozieblo, A.; Padovani, M.; Pagano, I.; Paiano, S.; Paizis, A.; Palacio, J.; Palatka, M.; Pallotta, J.; Panagiotidis, K.; Panazol, J. -L.; Paneque, D.; Panter, M.; Panzera, M. R.; Paoletti, R.; Paolillo, M.; Papayannis, A.; Papyan, G.; Paravac, A.; Paredes, J. M.; Pareschi, G.; Park, N.; Parsons, D.; Paśko, P.; Pavy, S.; Arribas, M. Paz; Pech, M.; Peck, A.; Pedaletti, G.; Peet, S.; Pelassa, V.; Pelat, D.; Peres, C.; Perez, M. d. C.; Perri, L.; Persic, M.; Petrashyk, A.; Petrucci, P. -O.; Peyaud, B.; Pfeifer, M.; Pfeiffer, G.; Piano, G.; Pichel, A.; Pieloth, D.; Pierbattista, M.; Pierre, E.; de Pinho, F. Pinto; García, C. Pio; Piret, Y.; Pita, S.; Planes, A.; Platino, M.; Platos, Ł.; Platzer, R.; Podkladkin, S.; Pogosyan, L.; Pohl, M.; Poinsignon, P.; Ponz, J. D.; Porcelli, A.; Potter, W.; Poulios, S.; Poutanen, J.; Prandini, E.; Prast, J.; Preece, R.; Profeti, F.; Prokhorov, D.; Prokoph, H.; Prouza, M.; Proyetti, M.; Pruchniewicz, R.; Pueschel, E.; Pühlhofer, G.; Puljak, I.; Punch, M.; Pyzioł, R.; Queiroz, F.; Quel, E. J.; Quinn, J.; Quirrenbach, A.; Racero, E.; Räck, T.; Rafalski, J.; Rafighi, I.; Rainò, S.; Rajda, P. J.; Rameez, M.; Rando, R.; Rannot, R. C.; Rataj, M.; Rateau, S.; Ravel, T.; Ravignani, D.; Razzaque, S.; Reardon, P.; Reimann, O.; Reimer, A.; Reimer, O.; Reitberger, K.; Renaud, M.; Renner, S.; Reposeur, T.; Rettig, R.; Reville, B.; Rhode, W.; Ribeiro, D.; Ribó, M.; Richards, G.; Richer, M. G.; Rico, J.; Ridky, J.; Rieger, F.; Ringegni, P.; Ristori, P. R.; Rivière, A.; Rivoire, S.; Roache, E.; Rodeghiero, G.; Rodriguez, J.; Fernandez, G. Rodriguez; Vázquez, J. J. Rodríguez; Rogers, T.; Rojas, G.; Romano, P.; Rodriguez, M. P. Romay; Romeo, G.; Romero, G. E.; Roncadelli, M.; Rose, J.; Rosen, S.; Lees, S. Rosier; Ross, D.; Rossiter, P.; Rouaix, G.; Rousselle, J.; Rovero, A. C.; Rowell, G.; Roy, F.; Royer, S.; Różańska, A.; Rudak, B.; Rugliancich, A.; Rulten, C.; Rupiński, M.; Russo, F.; Rutkowski, K.; Saavedra, O.; Sabatini, S.; Sacco, B.; Saemann, E. O.; Saggion, A.; Saha, L.; Sahakian, V.; Saito, K.; Saito, T.; Sakaki, N.; Salega, M.; Salek, D.; Salgado, J.; Salini, A.; Sanchez, D.; Sanchez, F.; Sanchez-Conde, M.; Sandaker, H.; Sandoval, A.; Sangiorgi, P.; Sanguillon, M.; Sano, H.; Santander, M.; Santangelo, A.; Santos, E. M.; Santos-Lima, R.; Sanuy, A.; Sapozhnikov, L.; Sarkar, S.; Satalecka, K.; Savalle, R.; Sawada, M.; Sayède, F.; Schafer, J.; Schanne, S.; Schanz, T.; Schioppa, E. J.; Schlenstedt, S.; Schlickeiser, R.; Schmidt, T.; Schmoll, J.; Schneider, M.; Schovanek, P.; Schubert, A.; Schultz, C.; Schultze, J.; Schulz, A.; Schulz, S.; Schure, K.; Schussler, F.; Schwab, T.; Schwanke, U.; Schwarz, J.; Schweizer, T.; Schwemmer, S.; Schwendicke, U.; Schwerdt, C.; Segreto, A.; Seiradakis, J. -H.; Sembroski, G. H.; Semikoz, D.; Serre, N.; Servillat, M.; Seweryn, K.; Shafi, N.; Sharma, M.; Shayduk, M.; Shellard, R. C.; Shibata, T.; Pandeni, K. Shiningayamwe; Shukla, A.; Shum, E.; Sidoli, L.; Sidz, M.; Sieiro, J.; Siejkowski, H.; Silk, J.; Sillanpää, A.; Simone, D.; Singh, B. B.; Sinha, A.; Sironi, G.; Sitarek, J.; Sizun, P.; Slyusar, V.; Smith, A.; Smith, J.; Sobczyńska, D.; Sol, H.; Sottile, G.; Sowiński, M.; Spanier, F.; Spengler, G.; Spiga, D.; Stadler, R.; Stahl, O.; Stamatescu, V.; Stamerra, A.; Stanič, S.; Starling, R.; Stawarz, Ł.; Steenkamp, R.; Stefanik, S.; Stegmann, C.; Steiner, S.; Stella, C.; Stergioulas, N.; Sternberger, R.; Sterzel, M.; Stevenson, B.; Stinzing, F.; Stodulska, M.; Stodulski, M.; Stolarczyk, T.; Straumann, U.; Strazzeri, E.; Stringhetti, L.; Strzys, M.; Stuik, R.; Sulanke, K. -H.; Supanitsky, A. D.; Suric, T.; Sushch, I.; Sutcliffe, P.; Sykes, J.; Szanecki, M.; Szepieniec, T.; Szwarnog, P.; Tacchini, A.; Tachihara, K.; Tagliaferri, G.; Tajima, H.; Takahashi, H.; Takahashi, K.; Takahashi, M.; Takalo, L.; Takami, H.; Talbot, G.; Tammi, J.; Tanaka, M.; Tanaka, S.; Tanaka, T.; Tanaka, Y.; Tanci, C.; Tarantino, E.; Tavani, M.; Tavecchio, F.; Tavernet, J. -P.; Tayabaly, K.; Tejedor, L. A.; Telezhinsky, I.; Temme, F.; Temnikov, P.; Tenzer, C.; Terada, Y.; Terrier, R.; Tescaro, D.; Teshima, M.; Testa, V.; Tezier, D.; Thayer, J.; Thomas, V.; Thornhill, J.; Thuermann, D.; Tibaldo, L.; Tibolla, O.; Tiengo, A.; Tijsseling, G.; Timpanaro, M. C.; Tluczykont, M.; Peixoto, C. J. Todero; Tokanai, F.; Tokarz, M.; Toma, K.; Toma, K.; Tomastik, J.; Tomono, Y.; Tonachini, A.; Tonev, D.; Torii, K.; Tornikoski, M.; Torres, D. F.; Torres, M.; Torresi, E.; Toscano, S.; Toso, G.; Tosti, G.; Totani, T.; Tothill, N.; Toussenel, F.; Tovmassian, G.; Townsley, C.; Toyama, T.; Travnicek, P.; Trifoglio, M.; Pujadas, I. Troyano; Pujadas, I. Troyano; Trzeciak, M.; Tsinganos, K.; Tsubone, Y.; Tsuchiya, Y.; Tsujimoto, S.; Tsuru, T.; Uchiyama, Y.; Umana, G.; Umetsu, Y.; Underwood, C.; Upadhya, S. S.; Uslenghi, M.; Vagnetti, F.; Valdes-Galicia, J.; Vallania, P.; Vallejo, G.; Valore, L.; van Driel, W.; van Eldik, C.; van Soelen, B.; Vandenbroucke, J.; Vanderwalt, J.; Vasileiadis, G.; Vassiliev, V.; Acosta, M. L. Vázquez; Vecchi, M.; Vegas, I.; Veitch, P.; Venema, L.; Venter, C.; Vercellone, S.; Vergani, S.; Verma, K.; Verzi, V.; Vettolani, G. P.; Viana, A.; Vicha, J.; Videla, M.; Vigorito, C.; Vincent, P.; Vincent, S.; Vink, J.; Vittorini, V.; Vlahakis, N.; Vlahos, L.; Voelk, H.; Vogler, P.; Voisin, V.; Vollhardt, A.; Volpicelli, A.; Vorobiov, S.; Vovk, I.; Vu, L. V.; Wagner, R.; Wagner, R. M.; Wagner, R. G.; Wagner, S. J.; Wakely, S. P.; Walter, R.; Walther, T.; Ward, J. E.; Ward, M.; Warda, K.; Warwick, R.; Wassberg, S.; Watson, J.; Wawer, P.; Wawrzaszek, R.; Webb, N.; Wegner, P.; Weinstein, A.; Weitzel, Q.; Wells, R.; Werner, F.; Werner, M.; Wetteskind, H.; White, M.; White, R.; Więcek, M.; Wierzcholska, A.; Wiesand, S.; Wijers, R.; Wild, N.; Wilhelm, A.; Wilkinson, M.; Will, M.; Williams, D. A.; Williams, J. T.; Willingale, R.; Winde, M.; Winiarski, K.; Winkler, H.; Wischnewski, R.; Wojcik, P.; Wolf, D.; Wood, M.; Wörnlein, A.; Wu, E.; Wu, T.; Yadav, K. K.; Yamamoto, H.; Yamamoto, T.; Yamazaki, R.; Yanagita, S.; Yang, L.; Yebras, J. M.; Yelos, D.; Yeung, W.; Yoshida, A.; Yoshida, T.; Yoshiike, S.; Yoshikoshi, T.; Yu, P.; Zabalza, V.; Zabalza, V.; Zacharias, M.; Zaharijas, G.; Zajczyk, A.; Zampieri, L.; Zandanel, F.; Zanin, R.; Sanchez, R. Zanmar; Zavrtanik, D.; Zavrtanik, M.; Zdziarski, A.; Zech, A.; Zechlin, H.; Zhao, A.; Ziegler, A.; Ziemann, J.; Ziętara, K.; Ziółkowski, J.; Zitelli, V.; Zoli, A.; Zurbach, C.; Żychowski, P.
Comments: Index of CTA conference proceedings at the ICRC2015, The Hague (The Netherlands). v1: placeholder with no arXiv links yet, to be replaced once individual contributions have been all submitted; v2: final with arXiv links to all CTA contributions and full author list
Submitted: 2015-08-24, last modified: 2015-09-11
List of contributions from the CTA Consortium presented at the 34th International Cosmic Ray Conference, 30 July - 6 August 2015, The Hague, The Netherlands.
[20]  oai:arXiv.org:1509.03478  [pdf] - 1275564
Angular resolution measurements at SPring-8 of a hard X-ray optic for the New Hard X-ray Mission
Comments:
Submitted: 2015-09-11
The realization of X-ray telescopes with imaging capabilities in the hard (> 10 keV) X-ray band requires the adoption of optics with shallow (< 0.25 deg) grazing angles to enhance the reflectivity of reflective coatings. On the other hand, to obtain large collecting area, large mirror diameters (< 350 mm) are necessary. This implies that mirrors with focal lengths >10 m shall be produced and tested. Full-illumination tests of such mirrors are usually performed with on- ground X-ray facilities, aimed at measuring their effective area and the angular resolution; however, they in general suffer from effects of the finite distance of the X-ray source, e.g. a loss of effective area for double reflection. These effects increase with the focal length of the mirror under test; hence a "partial" full-illumination measurement might not be fully representative of the in-flight performances. Indeed, a pencil beam test can be adopted to overcome this shortcoming, because a sector at a time is exposed to the X-ray flux, and the compensation of the beam divergence is achieved by tilting the optic. In this work we present the result of a hard X-ray test campaign performed at the BL20B2 beamline of the SPring-8 synchrotron radiation facility, aimed at characterizing the Point Spread Function (PSF) of a multilayer-coated Wolter-I mirror shell manufactured by Nickel electroforming. The mirror shell is a demonstrator for the NHXM hard X-ray imaging telescope (0.3 - 80 keV), with a predicted HEW (Half Energy Width) close to 20 arcsec. We show some reconstructed PSFs at monochromatic X-ray energies of 15 to 63 keV, and compare them with the PSFs computed from post-campaign metrology data, self-consistently treating profile and roughness data by means of a method based on the Fresnel diffraction theory. The modeling matches the measured PSFs accurately.
[21]  oai:arXiv.org:1509.03666  [pdf] - 1276331
Computation of the off-axis effective area of the New Hard X-ray Mission modules by means of an analytical approach
Comments:
Submitted: 2015-09-11
One of the most important parameters determining the sensitivity of X-ray telescopes is their effective area as a function of the X-ray energy. The computation of the effective area of a Wolter-I mirror, with either a single layer or multilayer coating, is a very simple task for a source on-axis at astronomical distance. Indeed, when the source moves off-axis the calculation is more complicated, in particular for new hard X-ray imaging telescopes (NuSTAR, ASTRO-H, NHXM, IXO) beyond 10 keV, that will make use of multilayer coatings to extend the reflectivity band in grazing incidence. Unlike traditional single-layer coatings (in Ir or Au), graded multilayer coatings exhibit an oscillating reflectivity as a function of the incidence angle, which makes the effective area not immediately predictable for a source placed off-axis within the field of view. For this reason, the computation of the off-axis effective area has been so far demanded to ray- tracing codes, able to sample the incidence of photons onto the mirror assembly. Even if this approach should not be disdained, it would be interesting to approach the same problem from an analytical viewpoint. This would speed up and simplify the computation of the effective area as a function of the off-axis angle, a considerable advantage especially whenever the mirror parameters are still to be optimized. In this work we present the application of a novel, analytical formalism to the computation of the off-axis effective area and the grasp of the NHXM optical modules, requiring only the standard routines for the multilayer reflectivity computation.
[22]  oai:arXiv.org:1509.02736  [pdf] - 1274620
Optical module HEW simulations for the X-ray telescopes SIMBOL-X, EDGE and XEUS
Comments:
Submitted: 2015-09-09
One of the most important parameters defining the angular resolution of an X-ray optical module is its Half-Energy Width (HEW) as a function of the photon energy. Future X-ray telescopes with imaging capabilities (SIMBOL-X, Constellation-X, NeXT, EDGE, XEUS,...) should be characterized by a very good angular resolution in soft (< 10 keV) and hard (> 10 keV) X-rays. As a consequence, an important point in the optics development for these telescopes is the simulation of the achievable HEW for a system of X-ray mirrors. This parameter depends on the single mirror profile and nesting accuracy, but also on the mirrors surface microroughness that causes X-ray Scattering (XRS). In particular, owing to its dependence on the photon energy, XRS can dominate the profile errors in hard X-rays: thus, its impact has to be accurately evaluated in every single case, in order to formulate surface finishing requirements for X-ray mirrors. In this work we provide with some simulations of the XRS term of the HEW for some future soft and hard X-ray telescopes.
[23]  oai:arXiv.org:1509.02732  [pdf] - 1274619
HEW simulations and quantification of the microroughness requirements for X-ray telescopes by means of numerical and analytical methods
Comments:
Submitted: 2015-09-09
Future X-ray telescopes like SIMBOL-X will operate in a wide band of the X-ray spectrum (from 0.1 to 80 keV); these telescopes will extend the optical performances of the existing soft X-ray telescopes to the hard X-ray band, and in particular they will be characterized by a angular resolution (conveniently expressed in terms of HEW, Half-Energy- Width) less than 20 arcsec. However, it is well known that the microroughness of the reflecting surfaces of the optics causes the scattering of X-rays. As a consequence, the imaging quality can be severely degraded. Moreover, the X-ray scattering can be the dominant problem in hard X-rays because its relevance is an increasing function of the photon energy. In this work we consistently apply a numerical method and an analytical one to evaluate the X-ray scattering impact on the HEW of an X-ray optic, as a function of the photon energy: both methods can also include the effects of figure errors in determining the final HEW. A comparison of the results obtained with the two methods for the particular case of the SIMBOL-X X-ray telescope will be presented.
[24]  oai:arXiv.org:1509.02726  [pdf] - 1274618
Surface smoothness requirements for the mirrors of the IXO X-ray telescope
Comments:
Submitted: 2015-09-09
The International X-ray Observatory (IXO) is a very ambitious mission, aimed at the X-ray observation of the early Universe. This makes IXO extremely demanding in terms of effective area and angular resolution. In particular, the HEW requirement below 10 keV is 5 arcsec Half-Energy Width (HEW). At higher photon energies, the HEW is expected to increase, and the angular resolution to be correspondingly degraded, due to the increasing relevance of the X-ray scattering off the reflecting surfaces. Therefore, the HEW up to 40 keV is required to be better than 30 arcsec, even though the IXO goal is to achieve an angular resolution as close as possible to 5 arcsec also at this energy. To this end, the roughness of the reflecting surfaces has to not exceed a tolerance, expressed in terms of a surface roughness PSD (Power-Spectral-Density). In this work we provide such tolerances by simulating the HEW scattering term for IXO, assuming a specific configuration for the optical module and different hypotheses on the PSD of mirrors.
[25]  oai:arXiv.org:1509.02264  [pdf] - 1273349
Characterization of multilayer stack parameters from X-ray reflectivity data using the PPM program: measurements and comparison with TEM results
Comments:
Submitted: 2015-09-08
Future hard (10 -100 keV) X-ray telescopes (SIMBOL-X, Con-X, HEXIT-SAT, XEUS) will implement focusing optics with multilayer coatings: in view of the production of these optics we are exploring several deposition techniques for the reflective coatings. In order to evaluate the achievable optical performance X-Ray Reflectivity (XRR) measurements are performed, which are powerful tools for the in-depth characterization of multilayer properties (roughness, thickness and density distribution). An exact extraction of the stack parameters is however difficult because the XRR scans depend on them in a complex way. The PPM code, developed at ERSF in the past years, is able to derive the layer-by-layer properties of multilayer structures from semi-automatic XRR scan fittings by means of a global minimization procedure in the parameters space. In this work we will present the PPM modeling of some multilayer stacks (Pt/C and Ni/C) deposited by simple e-beam evaporation. Moreover, in order to verify the predictions of PPM, the obtained results are compared with TEM profiles taken on the same set of samples. As we will show, PPM results are in good agreement with the TEM findings. In addition, we show that the accurate fitting returns a physically correct evaluation of the variation of layers thickness through the stack, whereas the thickness trend derived from TEM profiles can be altered by the superposition of roughness profiles in the sample image.
[26]  oai:arXiv.org:1509.02385  [pdf] - 1273362
A magnetic diverter for charged particle background rejection in the SIMBOL-X telescope
Comments:
Submitted: 2015-09-08
Minimization of charged particle background in X-ray telescopes is a well known issue. Charged particles (chiefly protons and electrons) naturally present in the cosmic environment constitute an important background source when they collide with the X-ray detector. Even worse, a serious degradation of spectroscopic performances of the X-ray detector was observed in Chandra and Newton-XMM, caused by soft protons with kinetic energies ranging between 100 keV and some MeV being collected by the grazing-incidence mirrors and funneled to the detector. For a focusing telescope like SIMBOL-X, the exposure of the soft X-ray detector to the proton flux can increase significantly the instrumental background, with a consequent loss of sensitivity. In the worst case, it can also seriously compromise the detector duration. A well-known countermeasure that can be adopted is the implementation of a properly-designed magnetic diverter, that should prevent high-energy particles from reaching the focal plane instruments of SIMBOL-X. Although Newton-XMM and Swift-XRT are equipped with magnetic diverters for electrons, the magnetic fields used are insufficient to effectively act on protons. In this paper, we simulate the behavior of a magnetic diverter for SIMBOL-X, consisting of commercially-available permanent magnets. The effects of SIMBOL-X optics is simulated through GEANT4 libraries, whereas the effect of the intense required magnetic fields is simulated along with specifically-written numerical codes in IDL.
[27]  oai:arXiv.org:1509.02298  [pdf] - 1273356
Profile reconstruction of grazing-incidence X-ray mirrors from intra-focal X-ray full imaging
Comments:
Submitted: 2015-09-08
The optics of a number of future X-ray telescopes will have very long focal lengths (10 - 20 m), and will consist of a number of nested/stacked thin, grazing-incidence mirrors. The optical quality characterization of a real mirror can be obtained via profile metrology, and the Point Spread Function of the mirror can be derived via one of the standard computation methods. However, in practical cases it can be difficult to access the optical surfaces of densely stacked mirror shells, after they have been assembled, using the widespread metrological tools. For this reason, the assessment of the imaging resolution of a system of mirrors is better obtained via a direct, full-illumination test in X-rays. If the focus cannot be reached, an intra-focus test can be performed, and the image can be compared with the simulation results based on the metrology, if available. However, until today no quantitative information was extracted from a full-illumination, intra-focal exposure. In this work we show that, if the detector is located at an optimal distance from the mirror, the intensity variations of the intra-focal, full-illumination image in single reflection can be used to reconstruct the profile of the mirror surface, without the need of a wavefront sensor. The Point Spread Function can be subsequently computed from the reconstructed mirror shape. We show the application of this method to an intra-focal (8 m distance from mirror) test performed at PANTER on an optical module prototype made of hot-slumped glass foils with a 20 m focal length, from which we could derive an expected imaging quality near 16 arcsec HEW.
[28]  oai:arXiv.org:1502.03308  [pdf] - 1303946
Development of mirrors made of chemically tempered glass foils for future X-ray telescopes
Comments: Accepted for publication in Experimental Astronomy. Author's accepted manuscript posted to arXiv.org as permitted by Springer's Self-Archiving Policy
Submitted: 2015-02-11
Thin slumped glass foils are considered good candidates for the realization of future X-ray telescopes with large effective area and high spatial resolution. However, the hot slumping process affects the glass strength, and this can be an issue during the launch of the satellite because of the high kinematical and static loads occurring during that phase. In the present work we have investigated the possible use of Gorilla glass (produced by Corning), a chemical tempered glass that, thanks to its strength characteristics, would be ideal. The un-tempered glass foils were curved by means of an innovative hot slumping technique and subsequently chemically tempered. In this paper we show that the chemical tempering process applied to Gorilla glass foils does not affect the surface micro-roughness of the mirrors. On the other end, the stress introduced by the tempering process causes a reduction in the amplitude of the longitudinal profile errors with a lateral size close to the mirror length. The effect of the overall shape changes in the final resolution performance of the glass mirrors was studied by simulating the glass foils integration with our innovative approach based on glass reinforcing ribs. The preliminary tests performed so far suggest that this approach has the potential to be applied to the X-ray telescopes of the next generation.
[29]  oai:arXiv.org:1409.1750  [pdf] - 905259
Mirrors for X-ray telescopes: Fresnel diffraction-based computation of point spread functions from metrology
Comments: Final version with typos corrected
Submitted: 2014-09-05, last modified: 2014-12-09
The imaging sharpness of an X-ray telescope is chiefly determined by the optical quality of its focusing optics, which in turn mostly depends on the shape accuracy and the surface finishing of the grazing-incidence X-ray mirrors that compose the optical modules. To ensure the imaging performance during the mirror manufacturing, a fundamental step is predicting the mirror point spread function (PSF) from the metrology of its surface. Traditionally, the PSF computation in X-rays is assumed to be different depending on whether the surface defects are classified as figure errors or roughness. [...] The aim of this work is to overcome this limit by providing analytical formulae that are valid at any light wavelength, for computing the PSF of an X-ray mirror shell from the measured longitudinal profiles and the roughness power spectral density (PSD), without distinguishing spectral ranges with different treatments. The method we adopted is based on the Huygens-Fresnel principle for computing the diffracted intensity from measured or modeled profiles. In particular, we have simplified the computation of the surface integral to only one dimension, owing to the grazing incidence that reduces the influence of the azimuthal errors by orders of magnitude. The method can be extended to optical systems with an arbitrary number of reflections - in particular the Wolter-I, which is frequently used in X-ray astronomy - and can be used in both near- and far-field approximation. Finally, it accounts simultaneously for profile, roughness, and aperture diffraction. We describe the formalism with which one can self-consistently compute the PSF of grazing-incidence mirrors, [...] Finally, we validate this by comparing the simulated PSF of a real Wolter-I mirror shell with the measured PSF in hard X-rays.
[30]  oai:arXiv.org:1402.3445  [pdf] - 1203354
Evaluation of the surface strength of glass plates shaped by hot slumping process
Comments: Accepted for publication in Optical Enginnering (Jun 26, 2014)
Submitted: 2014-02-14, last modified: 2014-07-09
The Hot Slumping Technology is under development by several research groups in the world for the realization of grazing-incidence segmented mirrors for X-ray astronomy, based on thin glass plates shaped over a mould at temperatures above the transformation point. The performed thermal cycle and related operations might have effects on the strength characteristics of the glass, with consequences on the structural design of the elemental optical modules and consecutively on the entire X-ray optic for large astronomical missions like IXO and ATHENA. The mechanical strength of glass plates after they underwent the slumping process was tested through destructive double-ring tests in the context of a study performed by the Astronomical Observatory of Brera with the collaboration of Stazione Sperimentale del Vetro and BCV Progetti. The entire study has been realized on more than 200 D263 Schott borosilicate glass specimens of dimension 100 mm x 100 mm and thickness 0.4 mm, either flat or bent at a Radius of Curvature of 1000 mm through the particular pressure assisted hot slumping process developed by INAF-OAB. The collected experimental data have been compared to non-linear FEM analyses and treated with Weibull statistic to assess the current IXO glass X-ray telescope design, in terms of survival probability, when subject to static and acoustic loads characteristic of the launch phase. The paper describes the activities performed and presents the obtained results.
[31]  oai:arXiv.org:1403.7200  [pdf] - 1208656
The imaging properties of the Gas Pixel Detector as a focal plane polarimeter
Comments: Accepted for publication in The Astrophysical Journal Supplement
Submitted: 2014-03-27
X-rays are particularly suited to probe the physics of extreme objects. However, despite the enormous improvements of X-ray Astronomy in imaging, spectroscopy and timing, polarimetry remains largely unexplored. We propose the photoelectric polarimeter Gas Pixel Detector (GPD) as an instrument candidate to fill the gap of more than thirty years of lack of measurements. The GPD, in the focus of a telescope, will increase the sensitivity of orders of magnitude. Moreover, since it can measure the energy, the position, the arrival time and the polarization angle of every single photon, allows to perform polarimetry of subsets of data singled out from the spectrum, the light curve or the image of source. The GPD has an intrinsic very fine imaging capability and in this work we report on the calibration campaign carried out in 2012 at the PANTER X-ray test facility of the Max-Planck-Institut f\"ur extraterrestrische Physik of Garching (Germany) in which, for the first time, we coupled it to a JET-X optics module with a focal length of 3.5 m and an angular resolution of 18 arcsec at 4.5 keV. This configuration was proposed in 2012 aboard the X-ray Imaging Polarimetry Explorer (XIPE) in response to the ESA call for a small mission. We derived the imaging and polarimetric performance for extended sources like Pulsar Wind Nebulae and Supernova Remnants as case studies for the XIPE configuration, discussing also possible improvements by coupling the detector with advanced optics, having finer angular resolution and larger effective area, to study with more details extended objects.
[32]  oai:arXiv.org:1311.2220  [pdf] - 786443
Re-testing the JET-X Flight Module No. 2 at the PANTER facility
Comments: Author's accepted manuscript posted to arXiv.org as permitted by Springer's Self-Archiving Policy. The final publication is available at http://rd.springer.com/article/10.1007%2Fs10686-013-9365-y
Submitted: 2013-11-09, last modified: 2014-02-18
The Joint European X-ray Telescope (JET-X) was the core instrument of the Russian Spectrum-X-gamma space observatory. It consisted of two identical soft X-ray (0.3 - 10 keV) telescopes with focusing optical modules having a measured angular resolution of nearly 15 arcsec. Soon after the payload completion, the mission was cancelled and the two optical flight modules (FM) were brought to the Brera Astronomical Observatory where they had been manufactured. After 16 years of storage, we have utilized the JET-X FM2 to test at the PANTER X-ray facility a prototype of a novel X-ray polarimetric telescope, using a Gas Pixel Detector (GPD) with polarimetric capabilities in the focal plane of the FM2. The GPD was developed by a collaboration between INFN-Pisa and INAF-IAPS. In the first phase of the test campaign, we have re-tested the FM2 at PANTER to have an up-to-date characterization in terms of angular resolution and effective area, while in the second part of the test the GPD has been placed in the focal plane of the FM2. In this paper we report the results of the tests of the sole FM2, using an unpolarized X-ray source, comparing the results with the calibration done in 1996.
[33]  oai:arXiv.org:1309.6995  [pdf] - 1453148
XIPE: the X-ray Imaging Polarimetry Explorer
Soffitta, Paolo; Barcons, Xavier; Bellazzini, Ronaldo; Braga, João; Costa, Enrico; Fraser, George W.; Gburek, Szymon; Huovelin, Juhani; Matt, Giorgio; Pearce, Mark; Poutanen, Juri; Reglero, Victor; Santangelo, Andrea; Sunyaev, Rashid A.; Tagliaferri, Gianpiero; Weisskopf, Martin; Aloisio, Roberto; Amato, Elena; Attiná, Primo; Axelsson, Magnus; Baldini, Luca; Basso, Stefano; Bianchi, Stefano; Blasi, Pasquale; Bregeon, Johan; Brez, Alessandro; Bucciantini, Niccoló; Burderi, Luciano; Burwitz, Vadim; Casella, Piergiorgio; Churazov, Eugene; Civitani, Marta; Covino, Stefano; da Silva, Rui Miguel Curado; Cusumano, Giancarlo; Dadina, Mauro; D'Amico, Flavio; De Rosa, Alessandra; Di Cosimo, Sergio; Di Persio, Giuseppe; Di Salvo, Tiziana; Dovciak, Michal; Elsner, Ronald; Eyles, Chris J.; Fabian, Andrew C.; Fabiani, Sergio; Feng, Hua; Giarrusso, Salvatore; Goosmann, René W.; Grandi, Paola; Grosso, Nicolas; Israel, Gianluca; Jackson, Miranda; Kaaret, Philip; Karas, Vladimir; Kuss, Michael; Lai, Dong; La Rosa, Giovanni; Larsson, Josefin; Larsson, Stefan; Latronico, Luca; Maggio, Antonio; Maia, Jorge; Marin, Frédéric; Massai, Marco Maria; Mineo, Teresa; Minuti, Massimo; Moretti, Elena; Muleri, Fabio; O'Dell, Stephen L.; Pareschi, Giovanni; Peres, Giovanni; Pesce, Melissa; Petrucci, Pierre-Olivier; Pinchera, Michele; Porquet, Delphine; Ramsey, Brian; Rea, Nanda; Reale, Fabio; Rodrigo, Juana Maria; Różańska, Agata; Rubini, Alda; Rudawy, Pawel; Ryde, Felix; Salvati, Marco; Júnior, Valdivino Alexandre de Santiago; Sazonov, Sergey; Sgró, Carmelo; Silver, Eric; Spandre, Gloria; Spiga, Daniele; Stella, Luigi; Tamagawa, Toru; Tamborra, Francesco; Tavecchio, Fabrizio; Dias, Teresa Teixeira; van Adelsberg, Matthew; Wu, Kinwah; Zane, Silvia
Comments: 49 pages, 14 figures, 6 tables. Paper published in Experimental Astronomy http://link.springer.com/journal/10686
Submitted: 2013-09-26
X-ray polarimetry, sometimes alone, and sometimes coupled to spectral and temporal variability measurements and to imaging, allows a wealth of physical phenomena in astrophysics to be studied. X-ray polarimetry investigates the acceleration process, for example, including those typical of magnetic reconnection in solar flares, but also emission in the strong magnetic fields of neutron stars and white dwarfs. It detects scattering in asymmetric structures such as accretion disks and columns, and in the so-called molecular torus and ionization cones. In addition, it allows fundamental physics in regimes of gravity and of magnetic field intensity not accessible to experiments on the Earth to be probed. Finally, models that describe fundamental interactions (e.g. quantum gravity and the extension of the Standard Model) can be tested. We describe in this paper the X-ray Imaging Polarimetry Explorer (XIPE), proposed in June 2012 to the first ESA call for a small mission with a launch in 2017 but not selected. XIPE is composed of two out of the three existing JET-X telescopes with two Gas Pixel Detectors (GPD) filled with a He-DME mixture at their focus and two additional GPDs filled with pressurized Ar-DME facing the sun. The Minimum Detectable Polarization is 14 % at 1 mCrab in 10E5 s (2-10 keV) and 0.6 % for an X10 class flare. The Half Energy Width, measured at PANTER X-ray test facility (MPE, Germany) with JET-X optics is 24 arcsec. XIPE takes advantage of a low-earth equatorial orbit with Malindi as down-link station and of a Mission Operation Center (MOC) at INPE (Brazil).
[34]  oai:arXiv.org:1307.2232  [pdf] - 699247
CTA contributions to the 33rd International Cosmic Ray Conference (ICRC2013)
Consortium, The CTA; :; Abril, O.; Acharya, B. S.; Actis, M.; Agnetta, G.; Aguilar, J. A.; Aharonian, F.; Ajello, M.; Akhperjanian, A.; Alcubierre, M.; Aleksic, J.; Alfaro, R.; Aliu, E.; Allafort, A. J.; Allan, D.; Allekotte, I.; Aloisio, R.; Amato, E.; Ambrosi, G.; Ambrosio, M.; Anderson, J.; Angüner, E. O.; Antonelli, L. A.; Antonuccio, V.; Antonucci, M.; Antoranz, P.; Aravantinos, A.; Argan, A.; Arlen, T.; Aramo, C.; Armstrong, T.; Arnaldi, H.; Arrabito, L.; Asano, K.; Ashton, T.; Asorey, H. G.; Aune, T.; Awane, Y.; Baba, H.; Babic, A.; Baby, N.; Bähr, J.; Bais, A.; Baixeras, C.; Bajtlik, S.; Balbo, M.; Balis, D.; Balkowski, C.; Ballet, J.; Bamba, A.; Bandiera, R.; Barber, A.; Barbier, C.; Barceló, M.; Barnacka, A.; Barnstedt, J.; de Almeida, U. Barres; Barrio, J. A.; Basili, A.; Basso, S.; Bastieri, D.; Bauer, C.; Baushev, A.; Becciani, U.; Becerra, J.; Becerra, J.; Becherini, Y.; Bechtol, K. C.; Tjus, J. Becker; Beckmann, V.; Bednarek, W.; Behera, B.; Belluso, M.; Benbow, W.; Berdugo, J.; Berge, D.; Berger, K.; Bernard, F.; Bernardino, T.; Bernlöhr, K.; Bertucci, B.; Bhat, N.; Bhattacharyya, S.; Biasuzzi, B.; Bigongiari, C.; Biland, A.; Billotta, S.; Bird, T.; Birsin, E.; Bissaldi, E.; Biteau, J.; Bitossi, M.; Blake, S.; Bigas, O. Blanch; Blasi, P.; Bobkov, A.; Boccone, V.; Böttcher, M.; Bogacz, L.; Bogart, J.; Bogdan, M.; Boisson, C.; Gargallo, J. Boix; Bolmont, J.; Bonanno, G.; Bonardi, A.; Bonev, T.; Bonifacio, P.; Bonnoli, G.; Bordas, P.; Borgland, A.; Borkowski, J.; Bose, R.; Botner, O.; Bottani, A.; Bouchet, L.; Bourgeat, M.; Boutonnet, C.; Bouvier, A.; Brau-Nogué, S.; Braun, I.; Bretz, T.; Briggs, M.; Brigida, M.; Bringmann, T.; Britto, R.; Brook, P.; Brun, P.; Brunetti, L.; Bruno, P.; Bucciantini, N.; Buanes, T.; Buckley, J.; Bühler, R.; Bugaev, V.; Bulgarelli, A.; Bulik, T.; Busetto, G.; Buson, S.; Byrum, K.; Cailles, M.; Cameron, R.; Camprecios, J.; Canestrari, R.; Cantu, S.; Capalbi, M.; Caraveo, P.; Carmona, E.; Carosi, A.; Carosi, R.; Carr, J.; Carter, J.; Carton, P. -H.; Caruso, R.; Casanova, S.; Cascone, E.; Casiraghi, M.; Castellina, A.; Catalano, O.; Cavazzani, S.; Cazaux, S.; Cerchiara, P.; Cerruti, M.; Chabanne, E.; Chadwick, P.; Champion, C.; Chaves, R.; Cheimets, P.; Chen, A.; Chiang, J.; Chiappetti, L.; Chikawa, M.; Chitnis, V. R.; Chollet, F.; Christof, A.; Chudoba, J.; Cieślar, M.; Cillis, A.; Cilmo, M.; Codino, A.; Cohen-Tanugi, J.; Colafrancesco, S.; Colin, P.; Colome, J.; Colonges, S.; Compin, M.; Conconi, P.; Conforti, V.; Connaughton, V.; Conrad, J.; Contreras, J. L.; Coppi, P.; Coridian, J.; Corona, P.; Corti, D.; Cortina, J.; Cossio, L.; Costa, A.; Costantini, H.; Cotter, G.; Courty, B.; Couturier, S.; Covino, S.; Crimi, G.; Criswell, S. J.; Croston, J.; Cusumano, G.; Dafonseca, M.; Dale, O.; Daniel, M.; Darling, J.; Davids, I.; Dazzi, F.; de Angelis, A.; De Caprio, V.; De Frondat, F.; Pino, E. M. de Gouveia Dal; de la Calle, I.; De La Vega, G. A.; Lopez, R. de los Reyes; de Lotto, B.; De Luca, A.; de Naurois, M.; de Oliveira, Y.; Wilhelmi, E. de Oña; de Palma, F.; de Souza, V.; Decerprit, G.; Decock, G.; Deil, C.; Delagnes, E.; Deleglise, G.; Delgado, C.; della Volpe, D.; Demange, P.; Depaola, G.; Dettlaff, A.; Di Girolamo, T.; Di Giulio, C.; Di Paola, A.; Di Pierro, F.; di Sciascio, G.; Díaz, C.; Dick, J.; Dickherber, R.; Dickinson, H.; Diez-Blanco, V.; Digel, S.; Dimitrov, D.; Disset, G.; Djannati-Ataï, A.; Doert, M.; Dohmke, M.; Domainko, W.; Prester, D. Dominis; Donat, A.; Dorner, D.; Doro, M.; Dournaux, J. -L.; Drake, G.; Dravins, D.; Drury, L.; Dubois, F.; Dubois, R.; Dubus, G.; Dufour, C.; Dumas, D.; Dumm, J.; Durand, D.; Dwarkadas, V.; Dyks, J.; Dyrda, M.; Ebr, J.; Edy, E.; Egberts, K.; Eger, P.; Einecke, S.; Eleftheriadis, C.; Elles, S.; Emmanoulopoulos, D.; Engelhaupt, D.; Enomoto, R.; Ernenwein, J. -P.; Errando, M.; Etchegoyen, A.; Evans, P. A.; Falcone, A.; Faltenbacher, A.; Fantinel, D.; Farakos, K.; Farnier, C.; Farrell, E.; Fasola, G.; Favill, B. W.; Fede, E.; Federici, S.; Fegan, S.; Feinstein, F.; Ferenc, D.; Ferrando, P.; Fesquet, M.; Fetfatzis, P.; Fiasson, A.; Fillin-Martino, E.; Fink, D.; Finley, C.; Finley, J. P.; Fiorini, M.; Curcoll, R. Firpo; Flandrini, E.; Fleischhack, H.; Flores, H.; Florin, D.; Focke, W.; Föhr, C.; Fokitis, E.; Font, L.; Fontaine, G.; Fornasa, M.; Förster, A.; Fortson, L.; Fouque, N.; Franckowiak, A.; Franco, F. J.; Frankowski, A.; Fransson, C.; Fraser, G. W.; Frei, R.; Fresnillo, L.; Fruck, C.; Fugazza, D.; Fujita, Y.; Fukazawa, Y.; Fukui, Y.; Funk, S.; Gäbele, W.; Gabici, S.; Gabriele, R.; Gadola, A.; Galante, N.; Gall, D.; Gallant, Y.; Gámez-García, J.; Garczarczyk, M.; García, B.; López, R. Garcia; Gardiol, D.; Gargano, F.; Garrido, D.; Garrido, L.; Gascon, D.; Gaug, M.; Gaweda, J.; Gebremedhin, L.; Geffroy, N.; Gerard, L.; Ghedina, A.; Ghigo, M.; Ghislain, P.; Giannakaki, E.; Gianotti, F.; Giarrusso, S.; Giavitto, G.; Giebels, B.; Giglietto, N.; Gika, V.; Giomi, M.; Giommi, P.; Giordano, F.; Girard, N.; Giro, E.; Giuliani, A.; Glanzman, T.; Glicenstein, J. -F.; Godinovic, N.; Golev, V.; Berisso, M. Gomez; Gómez-Ortega, J.; Gonzalez, M. M.; González, A.; González, F.; Muñoz, A. González; Gothe, K. S.; Grabarczyk, T.; Gougerot, M.; Graciani, R.; Grandi, P.; Grañena, F.; Granot, J.; Grasseau, G.; Gredig, R.; Green, A.; Greenshaw, T.; Grégoire, T.; Grillo, A.; Grimm, O.; Grondin, M. -H.; Grube, J.; Grudzinska, M.; Gruev, V.; Grünewald, S.; Grygorczuk, J.; Guarino, V.; Gunji, S.; Gyuk, G.; Hadasch, D.; Hagedorn, A.; Hagiwara, R.; Hahn, J.; Hakansson, N.; Hallgren, A.; Heras, N. Hamer; Hara, S.; Hardcastle, M. J.; Harezlak, D.; Harris, J.; Hassan, T.; Hatanaka, K.; Haubold, T.; Haupt, A.; Hayakawa, T.; Hayashida, M.; Heller, R.; Henault, F.; Henri, G.; Hermann, G.; Hermel, R.; Herrero, A.; Hervet, O.; Hidaka, N.; Hinton, J. A.; Hirotani, K.; Hoffmann, D.; Hofmann, W.; Hofverberg, P.; Holder, J.; Hörandel, J. R.; Horns, D.; Horville, D.; Houles, J.; Hrabovsky, M.; Hrupec, D.; Huan, H.; Huber, B.; Huet, J. -M.; Hughes, G.; Humensky, T. B.; Huovelin, J.; Huppert, J. -F.; Ibarra, A.; Ikawa, D.; Illa, J. M.; Impiombato, D.; Incorvaia, S.; Inoue, S.; Inoue, Y.; Iocco, F.; Ioka, K.; Israel, G. L.; Jablonski, C.; Jacholkowska, A.; Jacquemier, J.; Jamrozy, M.; Janiak, M.; Jean, P.; Jeanney, C.; Jimenez, J. J.; Jogler, T.; Johnson, C.; Johnson, T.; Journet, L.; Juffroy, C.; Jung, I.; Kaaret, P.; Kabuki, S.; Kagaya, M.; Kakuwa, J.; Kalkuhl, C.; Kankanyan, R.; Karastergiou, A.; Kärcher, K.; Karczewski, M.; Karkar, S.; Kasperek, J.; Kastana, D.; Katagiri, H.; Kataoka, J.; Katarzyński, K.; Katz, U.; Kawanaka, N.; Kazanas, D.; Kelley-Hoskins, N.; Kellner-Leidel, B.; Kelly, H.; Kendziorra, E.; Khélifi, B.; Kieda, D. B.; Kifune, T.; Kihm, T.; Kishimoto, T.; Kitamoto, K.; Kluźniak, W.; Knapic, C.; Knapp, J.; Knödlseder, J.; Köck, F.; Kocot, J.; Kodani, K.; Köhne, J. -H.; Kohri, K.; Kokkotas, K.; Kolitzus, D.; Komin, N.; Kominis, I.; Konno, Y.; Köppel, H.; Korohoda, P.; Kosack, K.; Koss, G.; Kossakowski, R.; Koul, R.; Kowal, G.; Koyama, S.; Kozioł, J.; Krähenbühl, T.; Krause, J.; Krawzcynski, H.; Krennrich, F.; Krepps, A.; Kretzschmann, A.; Krobot, R.; Krueger, P.; Kubo, H.; Kudryavtsev, V. A.; Kushida, J.; Kuznetsov, A.; La Barbera, A.; La Palombara, N.; La Parola, V.; La Rosa, G.; Lacombe, K.; Lamanna, G.; Lande, J.; Languignon, D.; Lapington, J. S.; Laporte, P.; Laurent, B.; Lavalley, C.; Flour, T. Le; Padellec, A. Le; Lee, S. -H.; Lee, W. H.; Lefèvre, J. -P.; Leich, H.; de Oliveira, M. A. Leigui; Lelas, D.; Lenain, J. -P.; Leoni, R.; Leopold, D. J.; Lerch, T.; Lessio, L.; Leto, G.; Lieunard, B.; Lieunard, S.; Lindemann, R.; Lindfors, E.; Liolios, A.; Lipniacka, A.; Lockart, H.; Lohse, T.; Lombardi, S.; Longo, F.; Lopatin, A.; Lopez, M.; López-Coto, R.; López-Oramas, A.; Lorca, A.; Lorenz, E.; Louis, F.; Lubinski, P.; Lucarelli, F.; Lüdecke, H.; Ludwin, J.; Luque-Escamilla, P. L.; Lustermann, W.; Luz, O.; Lyard, E.; Maccarone, M. C.; Maccarone, T. J.; Madejski, G. M.; Madhavan, A.; Mahabir, M.; Maier, G.; Majumdar, P.; Malaguti, G.; Malaspina, G.; Maltezos, S.; Manalaysay, A.; Mancilla, A.; Mandat, D.; Maneva, G.; Mangano, A.; Manigot, P.; Mannheim, K.; Manthos, I.; Maragos, N.; Marcowith, A.; Mariotti, M.; Marisaldi, M.; Markoff, S.; Marszałek, A.; Martens, C.; Martí, J.; Martin, J. -M.; Martin, P.; Martínez, G.; Martínez, F.; Martínez, M.; Massaro, F.; Masserot, A.; Mastichiadis, A.; Mathieu, A.; Matsumoto, H.; Mattana, F.; Mattiazzo, S.; Maurer, A.; Maurin, G.; Maxfield, S.; Maya, J.; Mazin, D.; Comb, L. Mc; McCann, A.; McCubbin, N.; McHardy, I.; McKay, R.; Meagher, K.; Medina, C.; Melioli, C.; Melkumyan, D.; Melo, D.; Mereghetti, S.; Mertsch, P.; Meucci, M.; Meyer, M.; Michałowski, J.; Micolon, P.; Mihailidis, A.; Mineo, T.; Minuti, M.; Mirabal, N.; Mirabel, F.; Miranda, J. M.; Mirzoyan, R.; Mistò, A.; Mizuno, T.; Moal, B.; Moderski, R.; Mognet, I.; Molinari, E.; Molinaro, M.; Montaruli, T.; Monte, C.; Monteiro, I.; Moore, P.; Olaizola, A. Moralejo; Mordalska, M.; Morello, C.; Mori, K.; Morlino, G.; Morselli, A.; Mottez, F.; Moudden, Y.; Moulin, E.; Mrusek, I.; Mukherjee, R.; Munar-Adrover, P.; Muraishi, H.; Murase, K.; Murphy, A. StJ.; Nagataki, S.; Naito, T.; Nakajima, D.; Nakamori, T.; Nakayama, K.; Naumann, C.; Naumann, D.; Naumann-Godo, M.; Nayman, P.; Nedbal, D.; Neise, D.; Nellen, L.; Neronov, A.; Neustroev, V.; Neyroud, N.; Nicastro, L.; Nicolau-Kukliński, J.; Niedźwiecki, A.; Niemiec, J.; Nieto, D.; Nikolaidis, A.; Nishijima, K.; Nishikawa, K. -I.; Noda, K.; Nolan, S.; Northrop, R.; Nosek, D.; Nowak, N.; Nozato, A.; Oakes, L.; O'Brien, P. T.; Ohira, Y.; Ohishi, M.; Ohm, S.; Ohoka, H.; Okuda, T.; Okumura, A.; Olive, J. -F.; Ong, R. A.; Orito, R.; Orr, M.; Osborne, J. P.; Ostrowski, M.; Otero, L. A.; Otte, N.; Ovcharov, E.; Oya, I.; Ozieblo, A.; Padilla, L.; Pagano, I.; Paiano, S.; Paillot, D.; Paizis, A.; Palanque, S.; Palatka, M.; Pallota, J.; Palatiello, M.; Panagiotidis, K.; Panazol, J. -L.; Paneque, D.; Panter, M.; Panzera, M. R.; Paoletti, R.; Papayannis, A.; Papyan, G.; Paredes, J. M.; Pareschi, G.; Parraud, J. -M.; Parsons, D.; Pauletta, G.; Arribas, M. Paz; Pech, M.; Pedaletti, G.; Pelassa, V.; Pelat, D.; Perez, M. d. C.; Persic, M.; Petrucci, P. -O.; Peyaud, B.; Pichel, A.; Pieloth, D.; Pierre, E.; Pita, S.; Pivato, G.; Pizzolato, F.; Platino, M.; Platos, Ł.; Platzer, R.; Podkladkin, S.; Pogosyan, L.; Pohl, M.; Pojmanski, G.; Ponz, J. D.; Potter, W.; Poutanen, J.; Prandini, E.; Prast, J.; Preece, R.; Profeti, F.; Prokoph, H.; Prouza, M.; Proyetti, M.; Puerto-Giménez, I.; Pühlhofer, G.; Puljak, I.; Punch, M.; Pyzioł, R.; Quel, E. J.; Quesada, J.; Quinn, J.; Quirrenbach, A.; Racero, E.; Rainò, S.; Rajda, P. J.; Rameez, M.; Ramon, P.; Rando, R.; Rannot, R. C.; Rataj, M.; Raue, M.; Ravignani, D.; Reardon, P.; Reimann, O.; Reimer, A.; Reimer, O.; Reitberger, K.; Renaud, M.; Renner, S.; Reville, B.; Rhode, W.; Ribó, M.; Ribordy, M.; Richards, G.; Richer, M. G.; Rico, J.; Ridky, J.; Rieger, F.; Ringegni, P.; Ripken, J.; Ristori, P. R.; Rivière, A.; Rivoire, S.; Rob, L.; Rodeghiero, G.; Roeser, U.; Rohlfs, R.; Rojas, G.; Romano, P.; Romaszkan, W.; Romero, G. E.; Rosen, S. R.; Lees, S. Rosier; Ross, D.; Rouaix, G.; Rousselle, J.; Rousselle, S.; Rovero, A. C.; Roy, F.; Royer, S.; Rudak, B.; Rulten, C.; Rupiński, M.; Russo, F.; Ryde, F.; Saavedra, O.; Sacco, B.; Saemann, E. O.; Saggion, A.; Sahakian, V.; Saito, K.; Saito, T.; Saito, Y.; Sakaki, N.; Sakonaka, R.; Salini, A.; Sanchez, F.; Sanchez-Conde, M.; Sandoval, A.; Sandaker, H.; Sant'Ambrogio, E.; Santangelo, A.; Santos, E. M.; Sanuy, A.; Sapozhnikov, L.; Sarkar, S.; Sartore, N.; Sasaki, H.; Satalecka, K.; Sawada, M.; Scalzotto, V.; Scapin, V.; Scarcioffolo, M.; Schafer, J.; Schanz, T.; Schlenstedt, S.; Schlickeiser, R.; Schmidt, T.; Schmoll, J.; Schovanek, P.; Schroedter, M.; Schubert, A.; Schultz, C.; Schultze, J.; Schulz, A.; Schure, K.; Schussler, F.; Schwab, T.; Schwanke, U.; Schwarz, J.; Schwarzburg, S.; Schweizer, T.; Schwemmer, S.; Schwendicke, U.; Schwerdt, C.; Segreto, A.; Seiradakis, J. -H.; Sembroski, G. H.; Servillat, M.; Seweryn, K.; Sharma, M.; Shayduk, M.; Shellard, R. C.; Shi, J.; Shibata, T.; Shibuya, A.; Shore, S.; Shum, E.; Sideras-Haddad, E.; Sidoli, L.; Sidz, M.; Sieiro, J.; Sikora, M.; Silk, J.; Sillanpää, A.; Singh, B. B.; Sironi, G.; Sitarek, J.; Skole, C.; Smareglia, R.; Smith, A.; Smith, D.; Smith, J.; Smith, N.; Sobczyńska, D.; Sol, H.; Sottile, G.; Sowiński, M.; Spanier, F.; Spiga, D.; Spyrou, S.; Stamatescu, V.; Stamerra, A.; Starling, R. L. C.; Stawarz, Ł.; Steenkamp, R.; Stegmann, C.; Steiner, S.; Stella, C.; Stergioulas, N.; Sternberger, R.; Sterzel, M.; Stinzing, F.; Stodulski, M.; Stolarczyk, Th.; Straumann, U.; Strazzeri, E.; Stringhetti, L.; Suarez, A.; Suchenek, M.; Sugawara, R.; Sulanke, K. -H.; Sun, S.; Supanitsky, A. D.; Suric, T.; Sutcliffe, P.; Sykes, J. M.; Szanecki, M.; Szepieniec, T.; Szostek, A.; Tagliaferri, G.; Tajima, H.; Takahashi, H.; Takahashi, K.; Takalo, L.; Takami, H.; Talbot, G.; Tammi, J.; Tanaka, M.; Tanaka, S.; Tasan, J.; Tavani, M.; Tavernet, J. -P.; Tejedor, L. A.; Telezhinsky, I.; Temnikov, P.; Tenzer, C.; Terada, Y.; Terrier, R.; Teshima, M.; Testa, V.; Tezier, D.; Thayer, J.; Thuermann, D.; Tibaldo, L.; Tibaldo, L.; Tibolla, O.; Tiengo, A.; Timpanaro, M. C.; Tluczykont, M.; Peixoto, C. J. Todero; Tokanai, F.; Tokarz, M.; Toma, K.; Tonachini, A.; Torii, K.; Tornikoski, M.; Torres, D. F.; Torres, M.; Toscano, S.; Toso, G.; Tosti, G.; Totani, T.; Toussenel, F.; Tovmassian, G.; Travnicek, P.; Treves, A.; Trifoglio, M.; Troyano, I.; Tsinganos, K.; Ueno, H.; Umana, G.; Umehara, K.; Upadhya, S. S.; Usher, T.; Uslenghi, M.; Vagnetti, F.; Valdes-Galicia, J. F.; Vallania, P.; Vallejo, G.; van Driel, W.; van Eldik, C.; Vandenbrouke, J.; Vanderwalt, J.; Vankov, H.; Vasileiadis, G.; Vassiliev, V.; Veberic, D.; Vegas, I.; Vercellone, S.; Vergani, S.; Verzi, V.; Vettolani, G. P.; Veyssière, C.; Vialle, J. P.; Viana, A.; Videla, M.; Vigorito, C.; Vincent, P.; Vincent, S.; Vink, J.; Vlahakis, N.; Vlahos, L.; Vogler, P.; Voisin, V.; Vollhardt, A.; von Gunten, H. -P.; Vorobiov, S.; Vuerli, C.; Waegebaert, V.; Wagner, R.; Wagner, R. G.; Wagner, S.; Wakely, S. P.; Walter, R.; Walther, T.; Warda, K.; Warwick, R. S.; Wawer, P.; Wawrzaszek, R.; Webb, N.; Wegner, P.; Weinstein, A.; Weitzel, Q.; Welsing, R.; Werner, M.; Wetteskind, H.; White, R. J.; Wierzcholska, A.; Wiesand, S.; Wilhelm, A.; Wilkinson, M. I.; Williams, D. A.; Willingale, R.; Winde, M.; Winiarski, K.; Wischnewski, R.; Wiśniewski, Ł.; Wojcik, P.; Wood, M.; Wörnlein, A.; Xiong, Q.; Yadav, K. K.; Yamamoto, H.; Yamamoto, T.; Yamazaki, R.; Yanagita, S.; Yebras, J. M.; Yelos, D.; Yoshida, A.; Yoshida, T.; Yoshikoshi, T.; Yu, P.; Zabalza, V.; Zacharias, M.; Zajczyk, A.; Zampieri, L.; Zanin, R.; Zdziarski, A.; Zech, A.; Zhao, A.; Zhou, X.; Zietara, K.; Ziolkowski, J.; Ziółkowski, P.; Zitelli, V.; Zurbach, C.; Zychowski, P.
Comments: Index of CTA conference proceedings at the ICRC2013, Rio de Janeiro (Brazil). v1: placeholder with no arXiv links yet, to be replaced once individual contributions have been all submitted. v2: final with arXiv links to all CTA contributions and full author list
Submitted: 2013-07-08, last modified: 2013-07-29
Compilation of CTA contributions to the proceedings of the 33rd International Cosmic Ray Conference (ICRC2013), which took place in 2-9 July, 2013, in Rio de Janeiro, Brazil
[35]  oai:arXiv.org:1301.2121  [pdf] - 647873
X-ray beam-shaping via deformable mirrors: analytical computation of the required mirror profile
Comments: 4th IWXM conference, Barcelona, Jul 2012. Published in NIM-A on May 11, 2013. AAM posted to arXiv as per Elsevier's Article posting policy. Published paper available at http://dx.doi.org/10.1016/j.nima.2012.10.117
Submitted: 2013-01-10, last modified: 2013-04-04
X-ray mirrors with high focusing performances are in use in both mirror modules for X-ray telescopes and in synchrotron and FEL (Free Electron Laser) beamlines. A degradation of the focus sharpness arises in general from geometrical deformations and surface roughness, the former usually described by geometrical optics and the latter by physical optics. In general, technological developments are aimed at a very tight focusing, which requires the mirror profile to comply with the nominal shape as much as possible and to keep the roughness at a negligible level. However, a deliberate deformation of the mirror can be made to endow the focus with a desired size and distribution, via piezo actuators as done at the EIS-TIMEX beamline of FERMI@Elettra. The resulting profile can be characterized with a Long Trace Profilometer and correlated with the expected optical quality via a wavefront propagation code. However, if the roughness contribution can be neglected, the computation can be performed via a ray-tracing routine, and, under opportune assumptions, the focal spot profile (the Point Spread Function, PSF) can even be predicted analytically. The advantage of this approach is that the analytical relation can be reversed; i.e, from the desired PSF the required mirror profile can be computed easily, thereby avoiding the use of complex and time-consuming numerical codes. The method can also be suited in the case of spatially inhomogeneous beam intensities, as commonly experienced at Synchrotrons and FELs. In this work we expose the analytical method and the application to the beam shaping problem.
[36]  oai:arXiv.org:1301.2974  [pdf] - 647875
X-ray scattering of periodic and graded multilayers: comparison of experiments to simulations from surface microroughness characterization
Comments: 4th IWXM conference, Barcelona, Jul 2012. Published in NIM-A on May 11, 2013. AAM posted to arXiv as per Elsevier's Article posting policy. Published paper available at http://dx.doi.org/10.1016/j.nima.2012.10.104
Submitted: 2013-01-14, last modified: 2013-04-04
To enhance the reflectivity of X-ray mirrors beyond the critical angle, multilayer coatings are required. Interface imperfections in the multilayer growth process are known to cause non-specular scattering and degrade the mirror optical performance; therefore, it is important to predict the amount of X-ray scattering from the rough topography of the outer surface of the coating, which can be directly measured, e.g., with an Atomic Force Microscope (AFM). This kind of characterization, combined with X-ray reflectivity measurements to assess the deep multilayer stack structure, can be used to model the layer roughening during the growth process via a well-known roughness evolution model. In this work, X-ray scattering measurements are performed and compared with simulations obtained from the modeled interfacial Power Spectral Densities (PSDs) and the modeled Crossed Spectral Densities for all the couples of interfaces. We already used this approach in a previous work for periodic multilayers; we now show how this method can be extended to graded multilayers. The upgraded code is validated for both periodic and graded multilayers, with a good accord between experimental data and model findings. Doing this, different kind of defects observed in AFM scans are included in the PSD analysis. The subsequent data-model comparison enables us to recognize them as surface contamination or interfacial defects that contribute to the X-ray scattering of the multilayer.
[37]  oai:arXiv.org:1105.0637  [pdf] - 353860
POLARIX: a pathfinder mission of X-ray polarimetry
Comments: 42 pages, 28 figures
Submitted: 2011-05-03
Since the birth of X-ray astronomy, spectral, spatial and timing observation improved dramatically, procuring a wealth of information on the majority of the classes of the celestial sources. Polarimetry, instead, remained basically unprobed. X-ray polarimetry promises to provide additional information procuring two new observable quantities, the degree and the angle of polarization. POLARIX is a mission dedicated to X-ray polarimetry. It exploits the polarimetric response of a Gas Pixel Detector, combined with position sensitivity, that, at the focus of a telescope, results in a huge increase of sensitivity. Three Gas Pixel Detectors are coupled with three X-ray optics which are the heritage of JET-X mission. POLARIX will measure time resolved X-ray polarization with an angular resolution of about 20 arcsec in a field of view of 15 arcmin $\times$ 15 arcmin and with an energy resolution of 20 % at 6 keV. The Minimum Detectable Polarization is 12 % for a source having a flux of 1 mCrab and 10^5 s of observing time. The satellite will be placed in an equatorial orbit of 505 km of altitude by a Vega launcher.The telemetry down-link station will be Malindi. The pointing of POLARIX satellite will be gyroless and it will perform a double pointing during the earth occultation of one source, so maximizing the scientific return. POLARIX data are for 75 % open to the community while 25 % + SVP (Science Verification Phase, 1 month of operation) is dedicated to a core program activity open to the contribution of associated scientists. The planned duration of the mission is one year plus three months of commissioning and SVP, suitable to perform most of the basic science within the reach of this instrument.
[38]  oai:arXiv.org:1104.2048  [pdf] - 576598
ORIGIN: Metal Creation and Evolution from the Cosmic Dawn
Herder, J. W. den; Piro, L.; Ohashi, T.; Kouveliotou, C.; Hartmann, D. H.; Kaastra, J. S.; Amati, L.; Andersen, M. I.; Arnaud, M.; Attéia, J-L.; Bandler, S.; Barbera, M.; Barcons, X.; Barthelmy, S.; Basa, S.; Basso, S.; Boer, M.; Branchini, E.; Branduardi-Raymont, G.; Borgani, S.; Boyarsky, A.; Brunetti, G.; Budtz-Jorgensen, C.; Burrows, D.; Butler, N.; Campana, S.; Caroli, E.; Ceballos, M.; Christensen, F.; Churazov, E.; Comastri, A.; Colasanti, L.; Cole, R.; Content, R.; Corsi, A.; Costantini, E.; Conconi, P.; Cusumano, G.; de Plaa, J.; De Rosa, A.; Del Santo, M.; Di Cosimo, S.; De Pasquale, M.; Doriese, R.; Ettori, S.; Evans, P.; Ezoe, Y.; Ferrari, L.; Finger, H.; Figueroa-Feliciano, T.; Friedrich, P.; Fujimoto, R.; Furuzawa, A.; Fynbo, J.; Gatti, F.; Galeazzi, M.; Gehrels, N.; Gendre, B.; Ghirlanda, G.; Ghisellini, G.; Gilfanov, M.; Giommi, P.; Girardi, M.; Grindlay, J.; Cocchi, M.; Godet, O.; Guedel, M.; Haardt, F.; Hartog, R. den; Hepburn, I.; Hermsen, W.; Hjorth, J.; Hoekstra, H.; Holland, A.; Hornstrup, A.; van der Horst, A.; Hoshino, A.; Zand, J. in 't; Irwin, K.; Ishisaki, Y.; Jonker, P.; Kitayama, T.; Kawahara, H.; Kawai, N.; Kelley, R.; Kilbourne, C.; de Korte, P.; Kusenko, A.; Kuvvetli, I.; Labanti, M.; Macculi, C.; Maiolino, R.; Hesse, M. Mas; Matsushita, K.; Mazzotta, P.; McCammon, D.; Méndez, M.; Mignani, R.; Mineo, T.; Mitsuda, K.; Mushotzky, R.; Molendi, S.; Moscardini, L.; Natalucci, L.; Nicastro, F.; O'Brien, P.; Osborne, J.; Paerels, F.; Page, M.; Paltani, S.; Pedersen, K.; Perinati, E.; Ponman, T.; Pointecouteau, E.; Predehl, P.; Porter, S.; Rasmussen, A.; Rauw, G.; Röttgering, H.; Roncarelli, M.; Rosati, P.; Quadrini, E.; Ruchayskiy, O.; Salvaterra, R.; Sasaki, S.; Sato, K.; Savaglio, S.; Schaye, J.; Sciortino, S.; Shaposhnikov, M.; Sharples, R.; Shinozaki, K.; Spiga, D.; Sunyaev, R.; Suto, Y.; Takei, Y.; Tanvir, N.; Tashiro, M.; Tamura, T.; Tawara, Y.; Troja, E.; Tsujimoto, M.; Tsuru, T.; Ubertini, P.; Ullom, J.; Ursino, E.; Verbunt, F.; van de Voort, F.; Viel, M.; Wachter, S.; Watson, D.; Weisskopf, M.; Werner, N.; White, N.; Willingale, R.; Wijers, R.; Yamasaki, N.; Yoshikawa, K.; Zane, S.
Comments: 34 pages, 13 figures. ESA Cosmic Vision medium-class mission (M3) proposal. Accepted for publication in Experimental Astronomy. Including minor corrections in the author list
Submitted: 2011-04-11, last modified: 2011-04-15
ORIGIN is a proposal for the M3 mission call of ESA aimed at the study of metal creation from the epoch of cosmic dawn. Using high-spectral resolution in the soft X-ray band, ORIGIN will be able to identify the physical conditions of all abundant elements between C and Ni to red-shifts of z=10, and beyond. The mission will answer questions such as: When were the first metals created? How does the cosmic metal content evolve? Where do most of the metals reside in the Universe? What is the role of metals in structure formation and evolution? To reach out to the early Universe ORIGIN will use Gamma-Ray Bursts (GRBs) to study their local environments in their host galaxies. This requires the capability to slew the satellite in less than a minute to the GRB location. By studying the chemical composition and properties of clusters of galaxies we can extend the range of exploration to lower redshifts (z ~ 0.2). For this task we need a high-resolution spectral imaging instrument with a large field of view. Using the same instrument, we can also study the so far only partially detected baryons in the Warm-Hot Intergalactic Medium (WHIM). The less dense part of the WHIM will be studied using absorption lines at low redshift in the spectra for GRBs.
[39]  oai:arXiv.org:1101.0629  [pdf] - 335959
Optics for X-ray telescopes: analytical treatment of the off-axis effective area of mirrors in optical modules
Comments: 13 pages, 12 figures, version after language editing
Submitted: 2011-01-03, last modified: 2011-03-25
Optical modules for X-ray telescopes comprise several double-reflection mirrors operating in grazing incidence. The concentration power of an optical module, which determines primarily the telescope's sensitivity, is in general expressed by its on-axis effective area as a function of the X-ray energy. Nevertheless, the effective area of X-ray mirrors in general decreases as the source moves off-axis, with a consequent loss of sensitivity. To make matters worse, the dense nesting of mirror shells in an optical module results in a mutual obstruction of their aperture when an astronomical source is off-axis, with a further effective area reduction. [...] While the effective area of an X-ray mirror is easy to predict on-axis, the same task becomes more difficult for a source off-axis. It is therefore important to develop an appropriate formalism to reliably compute the off-axis effective area of a Wolter-I mirror, including the effect of obstructions. Most of collecting area simulation for X-ray optical modules has been so far performed along with numerical codes, involving ray-tracing routines, very effective but in general complex, difficult to handle, time consuming and affected by statistical errors. In contrast, in a previous paper we approached this problem from an analytical viewpoint, to the end of simplifying and speeding up the prediction of the off-axis effective area of unobstructed X-ray mirrors with any reflective coating, including multilayers.In this work we extend the analytical results obtained: we show that the analytical formula for the off-axis effective area can be inverted, and we expose in detail a novel analytical treatment of mutual shell obstruction in densely nested mirror assemblies, which reduces the off-axis effective area computation to a simple integration. The results are in excellent agreement with the findings of a detailed ray-tracing routine.
[40]  oai:arXiv.org:0906.5367  [pdf] - 25787
Analytical computation of the off-axis Effective Area of grazing incidence X-ray mirrors
Comments: 12 pages, 11 figures, accepted for publication in "Astronomy & Astrophysics", section "Instruments, observational techniques, and data processing". Updated version after grammatical revision and typos correction
Submitted: 2009-06-29, last modified: 2009-09-04
Focusing mirrors for X-ray telescopes in grazing incidence, introduced in the 70s, are characterized in terms of their performance by their imaging quality and effective area, which in turn determines their sensitivity. Even though the on-axis effective area is assumed in general to characterize the collecting power of an X-ray optic, the telescope capability of imaging extended X-ray sources is also determined by the variation in its effective area with the off-axis angle. [...] The complex task of designing optics for future X-ray telescopes entails detailed computations of both imaging quality and effective area on- and off-axis. Because of their apparent complexity, both aspects have been, so far, treated by using ray-tracing routines aimed at simulating the interaction of X-ray photons with the reflecting surfaces of a given focusing system. Although this approach has been widely exploited and proven to be effective, it would also be attractive to regard the same problem from an analytical viewpoint, to assess an optical design of an X-ray optical module with a simpler calculation than a ray-tracing routine. [...] We have developed useful analytical formulae for the off-axis effective area of a double-reflection mirror in the double cone approximation, requiring only an integration and the standard routines to calculate the X-ray coating reflectivity for a given incidence angle. [...] Algebraic expressions are provided for the mirror geometric area, as a function of the off-axis angle. Finally, the results of the analytical computations presented here are validated by comparison with the corresponding predictions of a ray-tracing code.
[41]  oai:arXiv.org:0903.2483  [pdf] - 22372
Simbol-X Hard X-ray Focusing Mirrors: Results Obtained During the Phase A Study
Comments: 6 pages, 3 figures, invited talk at the conference "2nd International Simbol-X Symposium", Paris, 2-5 december, 2008
Submitted: 2009-03-13
Simbol-X will push grazing incidence imaging up to 80 keV, providing a strong improvement both in sensitivity and angular resolution compared to all instruments that have operated so far above 10 keV. The superb hard X-ray imaging capability will be guaranteed by a mirror module of 100 electroformed Nickel shells with a multilayer reflecting coating. Here we will describe the technogical development and solutions adopted for the fabrication of the mirror module, that must guarantee an Half Energy Width (HEW) better than 20 arcsec from 0.5 up to 30 keV and a goal of 40 arcsec at 60 keV. During the phase A, terminated at the end of 2008, we have developed three engineering models with two, two and three shells, respectively. The most critical aspects in the development of the Simbol-X mirrors are i) the production of the 100 mandrels with very good surface quality within the timeline of the mission; ii) the replication of shells that must be very thin (a factor of 2 thinner than those of XMM-Newton) and still have very good image quality up to 80 keV; iii) the development of an integration process that allows us to integrate these very thin mirrors maintaining their intrinsic good image quality. The Phase A study has shown that we can fabricate the mandrels with the needed quality and that we have developed a valid integration process. The shells that we have produced so far have a quite good image quality, e.g. HEW <~30 arcsec at 30 keV, and effective area. However, we still need to make some improvements to reach the requirements. We will briefly present these results and discuss the possible improvements that we will investigate during phase B.
[42]  oai:arXiv.org:0801.2350  [pdf] - 9028
Estimation of X-ray scattering impact in imaging degradation for the SIMBOL-X telescope
Comments: Memorie della Societa' Astronomica ITaliana. 3 pages, 3 figures, Proceedings of the International Workshop "Simbol-X: the hard X-ray universe in focus", May 2007, Bologna (Italy). Typos corrected
Submitted: 2008-01-15
The imaging performance of X-ray optics (expressed in terms of HEW, Half-Energy-Width) can be severely affected by X-ray scattering caused by the surface roughness of the mirrors. The impact of X-ray scattering has an increasing relevance for increasing photon energy, and can be the dominant problem in a hard X-ray telescope like SIMBOL-X. In this work we show how, by means of a novel formalism, we can derive a surface roughness tolerance - in terms of its power spectrum - from a specific HEW requirement for the SIMBOL-X optical module.
[43]  oai:arXiv.org:0704.1612  [pdf] - 360
Analytical evaluation of the X-ray scattering contribution to imaging degradation in grazing-incidence X-ray telescopes
Comments: 10 pages, 6 figures, published in Astronomy & Astrophysics, sect. "Astronomical Instrumentation". In this version, a typo in two equations has been corrected. After the correction, the other results, formulae and conclusions in the paper remain unchanged
Submitted: 2007-04-12, last modified: 2007-11-28
The focusing performance of X-ray optics (conveniently expressed in terms of HEW, Half Energy Width) strongly depend on both mirrors deformations and photon scattering caused by the microroughness of reflecting surfaces. In particular, the contribution of X-ray Scattering (XRS) to the HEW of the optic is usually an increasing function H(E) of the photon energy E. Therefore, in future hard X-ray imaging telescopes of the future (SIMBOL-X, NeXT, Constellation-X, XEUS), the X-ray scattering could be the dominant problem since they will operate also in the hard X-ray band (i.e. beyond 10 keV). [...] Several methods were proposed in the past years to estimate the scattering contribution to the HEW, dealing with the surface microroughness expressed in terms of its Power Spectral Density (PSD), on the basis of the well-established theory of X-ray scattering from rough surfaces. We faced that problem on the basis on the same theory, but we tried a new approach: the direct, analytical translation of a given surface roughness PSD into a H(E) trend, and - vice versa - the direct translation of a H(E) requirement into a surface PSD. This PSD represents the maximum tolerable microroughness level in order to meet the H(E) requirement in the energy band of a given X-ray telescope. We have thereby found a new, analytical and widely applicable formalism to compute the XRS contribution to the HEW from the surface PSD, provided that the PSD had been measured in a wide range of spatial frequencies. The inverse problem was also solved, allowing the immediate evaluation of the mirror surface PSD from a measured function H(E). The same formalism allows establishing the maximum allowed PSD of the mirror in order to fulfill a given H(E) requirement. [...]
[44]  oai:arXiv.org:astro-ph/0609573  [pdf] - 85165
An X-ray polarimeter for hard X-ray optics
Comments: 12 pages, 7 figures
Submitted: 2006-09-20
Development of multi-layer optics makes feasible the use of X-ray telescope at energy up to 60-80 keV: in this paper we discuss the extension of photoelectric polarimeter based on Micro Pattern Gas Chamber to high energy X-rays. We calculated the sensitivity with Neon and Argon based mixtures at high pressure with thick absorption gap: placing the MPGC at focus of a next generation multi-layer optics, galatic and extragalactic X-ray polarimetry can be done up till 30 keV.
[45]  oai:arXiv.org:astro-ph/0202292  [pdf] - 47786
CMB Observations: improvements of the performance of correlation radiometers by signal modulation and synchronous detection
Comments: 18 pages, 3 figures, New Astronomy accepted
Submitted: 2002-02-15
Observation of the fine structures (anisotropies, polarization, spectral distortions) of the Cosmic Microwave Background (CMB) is hampered by instabilities, 1/f noise and asymmetries of the radiometers used to carry on the measurements. Addition of modulation and synchronous detection allows to increase the overall stability and the noise rejection of the radiometers used for CMB studies. In this paper we discuss the advantages this technique has when we try to detect CMB polarization. The behaviour of a two channel correlation receiver to which phase modulation and synchronous detection have been added is examined. Practical formulae for evaluating the improvements are presented.