Normalized to: Simionovici, A.
[1]
oai:arXiv.org:1705.02157 [pdf] - 1573296
X-ray induced deuterium enrichment on N-rich organics in protoplanetary
disks: an experimental investigation using synchrotron light
Gavilan, Lisseth;
Remusat, Laurent;
Roskosz, Mathieu;
Popescu, Horia;
Jaouen, Nicolas;
Sandt, Christophe;
Jager, Cornelia;
Henning, Thomas;
Simionovici, Alexandre;
Lemaire, Jean Louis;
Mangin, Denis;
Carrasco, Nathalie
Submitted: 2017-05-05
The deuterium enrichment of organics in the interstellar medium,
protoplanetary disks and meteorites has been proposed to be the result of
ionizing radiation. The goal of this study is to quantify the effects of soft
X-rays (0.1 - 2 keV), a component of stellar radiation fields illuminating
protoplanetary disks, on the refractory organics present in the disks. We
prepared tholins, nitrogen-rich complex organics, via plasma deposition and
used synchrotron radiation to simulate X-ray fluences in protoplanetary disks.
Controlled irradiation experiments at 0.5 and 1.3 keV were performed at the
SEXTANTS beam line of the SOLEIL synchrotron, and were followed by ex-situ
infrared, Raman and isotopic diagnostics. Infrared spectroscopy revealed the
loss of singly-bonded groups (N-H, C-H and R-N$\equiv$C) and the formation of
sp$^3$ carbon defects. Raman analysis revealed the introduction of defects and
structural amorphization. Finally, tholins were measured via secondary ion mass
spectrometry (SIMS), revealing that significant D-enrichment is induced by
X-ray irradiation. Our results are compared to previous experimental studies
involving the thermal degradation and electron irradiation of organics. The
penetration depth of soft X-rays in $\mu$m-sized tholins leads to volume rather
than surface modifications: lower energy X-rays (0.5 keV) induce a larger
D-enrichment than 1.3 keV X-rays, reaching a plateau for doses larger than 5
$\times$ 10$^{27}$ eV cm$^{-3}$. Our work provides experimental evidence of a
new non-thermal pathway to deuterium fractionation of organic matter.
[2]
oai:arXiv.org:1601.05464 [pdf] - 1370362
Hard X-ray irradiation of cosmic silicate analogs: structural evolution
and astrophysical implications
Gavilan, L.;
Jäger, C.;
Simionovici, A.;
Lemaire, J. L.;
Sabri, T.;
Foy, E.;
Yagoubi, S.;
Henning, T.;
Salomon, D.;
Martinez-Criado, G.
Submitted: 2016-01-20
Protoplanetary disks, interstellar clouds, and active galactic nuclei,
contain X-ray dominated regions. X-rays interact with the dust and gas present
in such environments. While a few laboratory X-ray irradiation experiments have
been performed on ices, X-ray irradiation experiments on bare cosmic dust
analogs have been scarce up to now. Our goal is to study the effects of hard
X-rays on cosmic dust analogs via in-situ X-ray diffraction. By using a hard
X-ray synchrotron nanobeam, we seek to simulate cumulative X-ray exposure on
dust grains during their lifetime in these astrophysical environments, and
provide an upper limit on the effect of hard X-rays on dust grain structure.
We prepared enstatite nanograins, analogs to cosmic silicates, via the
melting-quenching technique. These amorphous grains were then annealed to
obtain polycrystalline grains. These were characterized via scanning electron
microscopy and high-resolution transmission electron microscopy before
irradiation. Powder samples were prepared in X-ray transparent substrates and
were irradiated with hard X-rays nanobeams (29.4 keV) provided by beamline
ID16B of the European Synchrotron Radiation Facility. X-ray diffraction images
were recorded in transmission mode. We detected the amorphization of
polycrystalline silicates embedded in an organic matrix after an accumulated
X-ray exposure of 6.4 x 10$^{27}$ eV cm$^{-2}$. Pure crystalline silicate
grains (without resin) did not exhibit amorphization. None of the amorphous
silicate samples (pure and embedded in resin) underwent crystallization. We
analyzed the evolution of the polycrystalline sample embedded in an organic
matrix as a function of X-ray exposure. Loss of diffraction peak intensity,
peak broadening, and the disappearance of discrete spots and arcs, revealed the
amorphization of the resin embedded (originally polycrystalline) silicate
sample.