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Simionovici, A.

Normalized to: Simionovici, A.

2 article(s) in total. 17 co-authors, from 1 to 2 common article(s). Median position in authors list is 6,0.

[1]  oai:arXiv.org:1705.02157  [pdf] - 1573296
X-ray induced deuterium enrichment on N-rich organics in protoplanetary disks: an experimental investigation using synchrotron light
Comments: 14 pages, 23 figures. Accepted for publication in ApJ
Submitted: 2017-05-05
The deuterium enrichment of organics in the interstellar medium, protoplanetary disks and meteorites has been proposed to be the result of ionizing radiation. The goal of this study is to quantify the effects of soft X-rays (0.1 - 2 keV), a component of stellar radiation fields illuminating protoplanetary disks, on the refractory organics present in the disks. We prepared tholins, nitrogen-rich complex organics, via plasma deposition and used synchrotron radiation to simulate X-ray fluences in protoplanetary disks. Controlled irradiation experiments at 0.5 and 1.3 keV were performed at the SEXTANTS beam line of the SOLEIL synchrotron, and were followed by ex-situ infrared, Raman and isotopic diagnostics. Infrared spectroscopy revealed the loss of singly-bonded groups (N-H, C-H and R-N$\equiv$C) and the formation of sp$^3$ carbon defects. Raman analysis revealed the introduction of defects and structural amorphization. Finally, tholins were measured via secondary ion mass spectrometry (SIMS), revealing that significant D-enrichment is induced by X-ray irradiation. Our results are compared to previous experimental studies involving the thermal degradation and electron irradiation of organics. The penetration depth of soft X-rays in $\mu$m-sized tholins leads to volume rather than surface modifications: lower energy X-rays (0.5 keV) induce a larger D-enrichment than 1.3 keV X-rays, reaching a plateau for doses larger than 5 $\times$ 10$^{27}$ eV cm$^{-3}$. Our work provides experimental evidence of a new non-thermal pathway to deuterium fractionation of organic matter.
[2]  oai:arXiv.org:1601.05464  [pdf] - 1370362
Hard X-ray irradiation of cosmic silicate analogs: structural evolution and astrophysical implications
Comments: Accepted for publication in Astronomy & Astrophysics on 19/01/2016
Submitted: 2016-01-20
Protoplanetary disks, interstellar clouds, and active galactic nuclei, contain X-ray dominated regions. X-rays interact with the dust and gas present in such environments. While a few laboratory X-ray irradiation experiments have been performed on ices, X-ray irradiation experiments on bare cosmic dust analogs have been scarce up to now. Our goal is to study the effects of hard X-rays on cosmic dust analogs via in-situ X-ray diffraction. By using a hard X-ray synchrotron nanobeam, we seek to simulate cumulative X-ray exposure on dust grains during their lifetime in these astrophysical environments, and provide an upper limit on the effect of hard X-rays on dust grain structure. We prepared enstatite nanograins, analogs to cosmic silicates, via the melting-quenching technique. These amorphous grains were then annealed to obtain polycrystalline grains. These were characterized via scanning electron microscopy and high-resolution transmission electron microscopy before irradiation. Powder samples were prepared in X-ray transparent substrates and were irradiated with hard X-rays nanobeams (29.4 keV) provided by beamline ID16B of the European Synchrotron Radiation Facility. X-ray diffraction images were recorded in transmission mode. We detected the amorphization of polycrystalline silicates embedded in an organic matrix after an accumulated X-ray exposure of 6.4 x 10$^{27}$ eV cm$^{-2}$. Pure crystalline silicate grains (without resin) did not exhibit amorphization. None of the amorphous silicate samples (pure and embedded in resin) underwent crystallization. We analyzed the evolution of the polycrystalline sample embedded in an organic matrix as a function of X-ray exposure. Loss of diffraction peak intensity, peak broadening, and the disappearance of discrete spots and arcs, revealed the amorphization of the resin embedded (originally polycrystalline) silicate sample.