During the past decade, semi-conductor photo sensors have replaced photo multiplier tubes in numerous applications featuring single-photon resolution, insensitivity to magnetic fields, higher robustness and enhanced photo detection efficiency at lower operation voltage and lower costs. This paper presents a measurement of gain, optical crosstalk and dark count rate of 127 Silicon Photo Multipliers (SiPMs) of type SensL MicroFJ-60035-TSV at nominal bias voltage. In SiPMs, optical crosstalk can fake higher multiplicities for single-photon hits. This paper demonstrates that optically coupled light guides reduce this probability significantly. The measured sensors offer a comparably small variation of their breakdown voltage with temperature of only $21.5\,\mathrm{mV/K}$. The manufacturer specifies a limited range of only $\pm 250\,\mathrm{mV/K}$ for their nominal breakdown voltage. This should allow for operation with small systematic errors without major efforts on temperature-based bias voltage compensation and without calibration of their individual breakdown voltages. This paper proves that the gain distribution of the measured sensors is consistent with the data sheet values.