We characterize the astrometric distortion at the edges of thick, fully-depleted CCDs in the lab using a bench-top simulation of LSST observing. By illuminating an array of forty thousand pinholes (30mu m diameter) at the object plane of a f/1.2 optical reimager, thousands of PSFs can be imaged over a 4Kx4K pixel CCD. Each high purity silicon pixel, 10mu m square by 100mu m deep, can then be individually characterized through a series of sub-pixel dithers in the X/Y plane. The unique character [response, position, shape] of each pixel as a function of flux, wavelength, back side bias, etc. can be investigated. We measure the magnitude and onset of astrometric error at the edges of the detector as a test of the experimental setup, using a LSST prototype CCD. We show that this astrometric error at the edge is sourced from non-uniformities in the electric field lines that define pixel boundaries. This edge distortion must be corrected in order to optimize the science output of weak gravitational lensing and large scale structure measurements for the LSST.

We describe a camera beam simulator for the LSST which is capable of illuminating a 60mm field at f/1.2 with realistic astronomical scenes, enabling studies of CCD astrometric and photometric performance. The goal is to fully simulate LSST observing, in order to characterize charge transport and other features in the thick fully depleted CCDs and to probe low level systematics under realistic conditions. The automated system simulates the centrally obscured LSST beam and sky scenes, including the spectral shape of the night sky. The doubly telecentric design uses a nearly unit magnification design consisting of a spherical mirror, three BK7 lenses, and one beam-splitter window. To achieve the relatively large field the beam-splitter window is used twice. The motivation for this LSST beam test facility was driven by the need to fully characterize a new generation of thick fully-depleted CCDs, and assess their suitability for the broad range of science which is planned for LSST. Due to the fast beam illumination and the thick silicon design [each pixel is 10 microns wide and over 100 microns deep] at long wavelengths there can be effects of photon transport and charge transport in the high purity silicon. The focal surface covers a field more than sufficient for a 40x40 mm LSST CCD. Delivered optical quality meets design goals, with 50% energy within a 5 micron circle. The tests of CCD performance are briefly described.