The development of single charge resolving, macroscopic silicon detectors has opened a window into rare processes at the O(eV) scale. In order to reconstruct the energy of a given event, or model the charge signal obtained for a given amount of energy absorbed by the electrons in a detector, an accurate charge yield model is needed. In this paper we review existing measurements of charge yield in Silicon, focusing in particular on the region below 1 keV. We highlight a calibration gap between 12-50 eV (referred to as the "UV-gap") and employ a phenomenological model of impact ionization to explore the likely charge yield in this energy regime. Finally, we explore the impact of variations in this model on a test case, that of dark matter scattering off electrons, to illustrate the scientific impact of uncertainties in charge yield.

We report direct-detection constraints on light dark matter particles interacting with electrons. The results are based on a method that exploits the extremely low levels of leakage current of the DAMIC detector at SNOLAB of 2-6$\times$10$^{-22}$ A cm$^{-2}$. We evaluate the charge distribution of pixels that collect $<10~\rm{e^-}$ for contributions beyond the leakage current that may be attributed to dark matter interactions. Constraints are placed on so-far unexplored parameter space for dark matter masses between 0.6 and 100 MeV$c^{-2}$. We also present new constraints on hidden-photon dark matter with masses in the range $1.2$-$30$ eV$c^{-2}$.

An important source of background in direct searches for low-mass dark matter particles are the energy deposits by small-angle scattering of environmental $\gamma$ rays. We report detailed measurements of low-energy spectra from Compton scattering of $\gamma$ rays in the bulk silicon of a charge-coupled device (CCD). Electron recoils produced by $\gamma$ rays from $^{57}$Co and $^{241}$Am radioactive sources are measured between 60 eV and 4 keV. The observed spectra agree qualitatively with theoretical predictions, and characteristic spectral features associated with the atomic structure of the silicon target are accurately measured for the first time. A theoretically-motivated parametrization of the data that describes the Compton spectrum at low energies for any incident $\gamma$-ray flux is derived. The result is directly applicable to background estimations for low-mass dark matter direct-detection experiments based on silicon detectors, in particular for the DAMIC experiment down to its current energy threshold.

We present direct detection constraints on the absorption of hidden-photon dark matter with particle masses in the range 1.2-30 eV$c^{-2}$ with the DAMIC experiment at SNOLAB. Under the assumption that the local dark matter is entirely constituted of hidden photons, the sensitivity to the kinetic mixing parameter $\kappa$ is competitive with constraints from solar emission, reaching a minimum value of 2.2$\times$$10^{-14}$ at 17 eV$c^{-2}$. These results are the most stringent direct detection constraints on hidden-photon dark matter in the galactic halo with masses 3-12 eV$c^{-2}$ and the first demonstration of direct experimental sensitivity to ionization signals $<$12 eV from dark matter interactions.

We present results of a dark matter search performed with a 0.6 kg day exposure of the DAMIC experiment at the SNOLAB underground laboratory. We measure the energy spectrum of ionization events in the bulk silicon of charge-coupled devices down to a signal of 60 eV electron equivalent. The data are consistent with radiogenic backgrounds, and constraints on the spin-independent WIMP-nucleon elastic-scattering cross section are accordingly placed. A region of parameter space relevant to the potential signal from the CDMS-II Si experiment is excluded using the same target for the first time. This result obtained with a limited exposure demonstrates the potential to explore the low-mass WIMP region (<10 GeV/$c^{2}$) of the upcoming DAMIC100, a 100 g detector currently being installed in SNOLAB.