One of the problems often encountered in X-ray mirror manufacturing is setting proper manufacturing tolerances to guarantee an angular resolution - often expressed in terms of Point Spread Function (PSF) - as needed by the specific science goal. To do this, we need an accurate metrological apparatus, covering a very broad range of spatial frequencies, and an affordable method to compute the PSF from the metrology dataset. [...] However, the separation between these spectral ranges is difficult do define exactly, and it is also unclear how to affordably combine the PSFs, computed with different methods in different spectral ranges, into a PSF expectation at a given X-ray energy. For this reason, we have proposed a method entirely based on the Huygens-Fresnel principle to compute the diffracted field of real Wolter-I optics, including measured defects over a wide range of spatial frequencies. Owing to the shallow angles at play, the computation can be simplified limiting the computation to the longitudinal profiles, neglecting completely the effect of roundness errors. Other authors had already proposed similar approaches in the past, but only in far-field approximation, therefore they could not be applied to the case of Wolter-I optics, in which two reflections occur in sequence within a short range. The method we suggest is versatile, as it can be applied to multiple reflection systems, at any X-ray energy, and regardless of the nominal shape of the mirrors in the optical system. The method has been implemented in the WISE code, successfully used to explain the measured PSFs of multilayer-coated optics for astronomic use, and of a K-B optical system in use at the FERMI free electron laser.

The realization of X-ray telescopes with imaging capabilities in the hard (> 10 keV) X-ray band requires the adoption of optics with shallow (< 0.25 deg) grazing angles to enhance the reflectivity of reflective coatings. On the other hand, to obtain large collecting area, large mirror diameters (< 350 mm) are necessary. This implies that mirrors with focal lengths >10 m shall be produced and tested. Full-illumination tests of such mirrors are usually performed with on- ground X-ray facilities, aimed at measuring their effective area and the angular resolution; however, they in general suffer from effects of the finite distance of the X-ray source, e.g. a loss of effective area for double reflection. These effects increase with the focal length of the mirror under test; hence a "partial" full-illumination measurement might not be fully representative of the in-flight performances. Indeed, a pencil beam test can be adopted to overcome this shortcoming, because a sector at a time is exposed to the X-ray flux, and the compensation of the beam divergence is achieved by tilting the optic. In this work we present the result of a hard X-ray test campaign performed at the BL20B2 beamline of the SPring-8 synchrotron radiation facility, aimed at characterizing the Point Spread Function (PSF) of a multilayer-coated Wolter-I mirror shell manufactured by Nickel electroforming. The mirror shell is a demonstrator for the NHXM hard X-ray imaging telescope (0.3 - 80 keV), with a predicted HEW (Half Energy Width) close to 20 arcsec. We show some reconstructed PSFs at monochromatic X-ray energies of 15 to 63 keV, and compare them with the PSFs computed from post-campaign metrology data, self-consistently treating profile and roughness data by means of a method based on the Fresnel diffraction theory. The modeling matches the measured PSFs accurately.

The imaging sharpness of an X-ray telescope is chiefly determined by the optical quality of its focusing optics, which in turn mostly depends on the shape accuracy and the surface finishing of the grazing-incidence X-ray mirrors that compose the optical modules. To ensure the imaging performance during the mirror manufacturing, a fundamental step is predicting the mirror point spread function (PSF) from the metrology of its surface. Traditionally, the PSF computation in X-rays is assumed to be different depending on whether the surface defects are classified as figure errors or roughness. [...] The aim of this work is to overcome this limit by providing analytical formulae that are valid at any light wavelength, for computing the PSF of an X-ray mirror shell from the measured longitudinal profiles and the roughness power spectral density (PSD), without distinguishing spectral ranges with different treatments. The method we adopted is based on the Huygens-Fresnel principle for computing the diffracted intensity from measured or modeled profiles. In particular, we have simplified the computation of the surface integral to only one dimension, owing to the grazing incidence that reduces the influence of the azimuthal errors by orders of magnitude. The method can be extended to optical systems with an arbitrary number of reflections - in particular the Wolter-I, which is frequently used in X-ray astronomy - and can be used in both near- and far-field approximation. Finally, it accounts simultaneously for profile, roughness, and aperture diffraction. We describe the formalism with which one can self-consistently compute the PSF of grazing-incidence mirrors, [...] Finally, we validate this by comparing the simulated PSF of a real Wolter-I mirror shell with the measured PSF in hard X-rays.

X-ray mirrors with high focusing performances are in use in both mirror modules for X-ray telescopes and in synchrotron and FEL (Free Electron Laser) beamlines. A degradation of the focus sharpness arises in general from geometrical deformations and surface roughness, the former usually described by geometrical optics and the latter by physical optics. In general, technological developments are aimed at a very tight focusing, which requires the mirror profile to comply with the nominal shape as much as possible and to keep the roughness at a negligible level. However, a deliberate deformation of the mirror can be made to endow the focus with a desired size and distribution, via piezo actuators as done at the EIS-TIMEX beamline of FERMI@Elettra. The resulting profile can be characterized with a Long Trace Profilometer and correlated with the expected optical quality via a wavefront propagation code. However, if the roughness contribution can be neglected, the computation can be performed via a ray-tracing routine, and, under opportune assumptions, the focal spot profile (the Point Spread Function, PSF) can even be predicted analytically. The advantage of this approach is that the analytical relation can be reversed; i.e, from the desired PSF the required mirror profile can be computed easily, thereby avoiding the use of complex and time-consuming numerical codes. The method can also be suited in the case of spatially inhomogeneous beam intensities, as commonly experienced at Synchrotrons and FELs. In this work we expose the analytical method and the application to the beam shaping problem.

To enhance the reflectivity of X-ray mirrors beyond the critical angle, multilayer coatings are required. Interface imperfections in the multilayer growth process are known to cause non-specular scattering and degrade the mirror optical performance; therefore, it is important to predict the amount of X-ray scattering from the rough topography of the outer surface of the coating, which can be directly measured, e.g., with an Atomic Force Microscope (AFM). This kind of characterization, combined with X-ray reflectivity measurements to assess the deep multilayer stack structure, can be used to model the layer roughening during the growth process via a well-known roughness evolution model. In this work, X-ray scattering measurements are performed and compared with simulations obtained from the modeled interfacial Power Spectral Densities (PSDs) and the modeled Crossed Spectral Densities for all the couples of interfaces. We already used this approach in a previous work for periodic multilayers; we now show how this method can be extended to graded multilayers. The upgraded code is validated for both periodic and graded multilayers, with a good accord between experimental data and model findings. Doing this, different kind of defects observed in AFM scans are included in the PSD analysis. The subsequent data-model comparison enables us to recognize them as surface contamination or interfacial defects that contribute to the X-ray scattering of the multilayer.