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Pycke, Jean-Renaud

Normalized to: Pycke, J.

2 article(s) in total. 1 co-authors. Median position in authors list is 1,5.

[1]  oai:arXiv.org:1612.03180  [pdf] - 1533215
Lognormal Distribution of Cosmic Voids in Simulations and Mocks
Comments: 11 pages, 6 figures, accepted to ApJ main journal
Submitted: 2016-12-09
Following up on previous studies, we here complete a full analysis of the void size distributions of the Cosmic Void Catalog (CVC) based on three different simulation and mock catalogs; dark matter, haloes and galaxies. Based on this analysis, we attempt to answer two questions: Is a 3-parameter log-normal distribution a good candidate to satisfy the void size distributions obtained from different types of environments? Is there a direct relation between the shape parameters of the void size distribution and the environmental effects? In an attempt to answer these questions, we here find that all void size distributions of these data samples satisfy the 3-parameter log-normal distribution whether the environment is dominated by dark matter, haloes or galaxies. In addition, the shape parameters of the 3-parameter log-normal void size distribution seem highly affected by environment, particularly existing substructures. Therefore, we show two quantitative relations given by linear equations between the skewness and the maximum tree depth, and variance of the void size distribution and the maximum tree depth directly from the simulated data. In addition to this, we find that the percentage of the voids with nonzero central density in the data sets has a critical importance. If the number of voids with nonzero central densities reaches greater and or equal to 3.84 percentage in a simulation/mock sample, then a second population is observed in the void size distributions. This second population emerges as a second peak in the log-normal void size distribution at larger radius.
[2]  oai:arXiv.org:1602.08770  [pdf] - 1396906
New Statistical Perspective to The Cosmic Void Distribution
Comments: Accepted in ApJ main journal, 7 pages, 3 figures
Submitted: 2016-02-28
In this study, we obtain the size distribution of voids as a 3-parameter redshift independent log-normal void probability function (VPF) directly from the Cosmic Void Catalog (CVC). Although many statistical models of void distributions are based on the counts in randomly placed cells, the log-normal VPF that we here obtain is independent of the shape of the voids due to the parameter-free void finder of the CVC. We use three void populations drawn from the CVC generated by the Halo Occupation Distribution (HOD) Mocks which are tuned to three mock SDSS samples to investigate the void distribution statistically and the effects of the environments on the size distribution. As a result, it is shown that void size distributions obtained from the HOD Mock samples are satisfied by the 3-parameter log-normal distribution. In addition, we find that there may be a relation between hierarchical formation, skewness and kurtosis of the log-normal distribution for each catalog. We also show that the shape of the 3-parameter distribution from the samples is strikingly similar to the galaxy log-normal mass distribution obtained from numerical studies. This similarity of void size and galaxy mass distributions may possibly indicate evidence of nonlinear mechanisms affecting both voids and galaxies, such as large scale accretion and tidal effects. Considering in this study all voids are generated by galaxy mocks and show hierarchical structures in different levels, it may be possible that the same nonlinear mechanisms of mass distribution affect the void size distribution.