Normalized to: Pycke, J.
[1]
oai:arXiv.org:1612.03180 [pdf] - 1533215
Lognormal Distribution of Cosmic Voids in Simulations and Mocks
Submitted: 2016-12-09
Following up on previous studies, we here complete a full analysis of the
void size distributions of the Cosmic Void Catalog (CVC) based on three
different simulation and mock catalogs; dark matter, haloes and galaxies. Based
on this analysis, we attempt to answer two questions: Is a 3-parameter
log-normal distribution a good candidate to satisfy the void size distributions
obtained from different types of environments? Is there a direct relation
between the shape parameters of the void size distribution and the
environmental effects? In an attempt to answer these questions, we here find
that all void size distributions of these data samples satisfy the 3-parameter
log-normal distribution whether the environment is dominated by dark matter,
haloes or galaxies. In addition, the shape parameters of the 3-parameter
log-normal void size distribution seem highly affected by environment,
particularly existing substructures. Therefore, we show two quantitative
relations given by linear equations between the skewness and the maximum tree
depth, and variance of the void size distribution and the maximum tree depth
directly from the simulated data. In addition to this, we find that the
percentage of the voids with nonzero central density in the data sets has a
critical importance. If the number of voids with nonzero central densities
reaches greater and or equal to 3.84 percentage in a simulation/mock sample,
then a second population is observed in the void size distributions. This
second population emerges as a second peak in the log-normal void size
distribution at larger radius.
[2]
oai:arXiv.org:1602.08770 [pdf] - 1396906
New Statistical Perspective to The Cosmic Void Distribution
Submitted: 2016-02-28
In this study, we obtain the size distribution of voids as a 3-parameter
redshift independent log-normal void probability function (VPF) directly from
the Cosmic Void Catalog (CVC). Although many statistical models of void
distributions are based on the counts in randomly placed cells, the log-normal
VPF that we here obtain is independent of the shape of the voids due to the
parameter-free void finder of the CVC. We use three void populations drawn from
the CVC generated by the Halo Occupation Distribution (HOD) Mocks which are
tuned to three mock SDSS samples to investigate the void distribution
statistically and the effects of the environments on the size distribution. As
a result, it is shown that void size distributions obtained from the HOD Mock
samples are satisfied by the 3-parameter log-normal distribution. In addition,
we find that there may be a relation between hierarchical formation, skewness
and kurtosis of the log-normal distribution for each catalog. We also show that
the shape of the 3-parameter distribution from the samples is strikingly
similar to the galaxy log-normal mass distribution obtained from numerical
studies. This similarity of void size and galaxy mass distributions may
possibly indicate evidence of nonlinear mechanisms affecting both voids and
galaxies, such as large scale accretion and tidal effects. Considering in this
study all voids are generated by galaxy mocks and show hierarchical structures
in different levels, it may be possible that the same nonlinear mechanisms of
mass distribution affect the void size distribution.