Polarization measurements done using Imaging Polarimeters such as the Robotic Polarimeter are very sensitive to the presence of artefacts in images. Artefacts can range from internal reflections in a telescope to satellite trails that could contaminate an area of interest in the image. With the advent of wide-field polarimetry surveys, it is imperative to develop methods that automatically flag artefacts in images. In this paper, we implement a Convolutional Neural Network to identify the most dominant artefacts in the images. We find that our model can successfully classify sources with 98\% true positive and 97\% true negative rates. Such models, combined with transfer learning, will give us a running start in artefact elimination for near-future surveys like WALOP.

IUCAA Digital Sampling Array Controller (IDSAC) is a flexible and generic yet powerful CCD controller which can handle a wide range of scientific detectors. Based on an easily scalable modular backplane architecture consisting of Single Board Controllers (SBC), IDSAC can control large detector arrays and mosaics. Each of the SBCs offers the full functionality required to control a CCD independently. The SBCs can be cold swapped without the need to reconfigure them. Each SBC can handle data from up to four video channels with or without dummy outputs at speeds up to 500 kilo Pixels Per Second (kPPS) Per Channel with a resolution of 16 bits. Communication with Linux based host computer is through a USB3.0 interface, with the option of using copper or optical fibers. A Field Programmable Gate Array (FPGA) is used as the master controller in each SBC which allows great flexibility in optimizing performance by adjusting gain, timing signals, bias levels, etc. using user-editable configuration files without altering the circuit topology. Elimination of thermal kTC noise is achieved via Digital Correlated Double Sampling (DCDS). We present the results of noise performance characterization of IDSAC through simulation, theoretical modeling, and actual measurements. The contribution of different types of noise sources is modeled using a tool to predict noise of a generic DCDS signal chain analytically. The analytical model predicts the net input referenced noise of the signal chain to be 5 electrons for 200k pixels per second per channel readout rate with 3 samples per pixel. Using a cryogenic test set up in the lab, the noise is measured to be 5.4 e (24.3 \muV), for the same readout configuration.