Normalized to: Otani, M.
[1]
oai:arXiv.org:1405.6190 [pdf] - 1323331
7Be Solar Neutrino Measurement with KamLAND
Gando, A.;
Gando, Y.;
Hanakago, H.;
Ikeda, H.;
Inoue, K.;
Ishidoshiro, K.;
Ishikawa, H.;
Kishimoto, Y.;
Koga, M.;
Matsuda, R.;
Matsuda, S.;
Mitsui, T.;
Motoki, D.;
Nakajima, K.;
Nakamura, K.;
Obata, A.;
Oki, A.;
Oki, Y.;
Otani, M.;
Shimizu, I.;
Shirai, J.;
Suzuki, A.;
Tamae, K.;
Ueshima, K.;
Watanabe, H.;
Xu, B. D.;
Yamada, S.;
Yamauchi, Y.;
Yoshida, H.;
Kozlov, A.;
Takemoto, Y.;
Yoshida, S.;
Grant, C.;
Keefer, G.;
McKee, D. W.;
Piepke, A.;
Banks, T. I.;
Bloxham, T.;
Freedman, S. J.;
Fujikawa, B. K.;
Han, K.;
Hsu, L.;
Ichimura, K.;
Murayama, H.;
O'Donnell, T.;
Steiner, H. M.;
Winslow, L. A.;
Dwyer, D.;
Mauger, C.;
McKeown, R. D.;
Zhang, C.;
Berger, B. E.;
Lane, C. E.;
Maricic, J.;
Miletic, T.;
Learned, J. G.;
Sakai, M.;
Horton-Smith, G. A.;
Tang, A.;
Downum, K. E.;
Tolich, K.;
Efremenko, Y.;
Kamyshkov, Y.;
Perevozchikov, O.;
Karwowski, H. J.;
Markoff, D. M.;
Tornow, W.;
Detwiler, J. A.;
Enomoto, S.;
Heeger, K.;
Decowski, M. P.
Submitted: 2014-05-23, last modified: 2015-09-30
We report a measurement of the neutrino-electron elastic scattering rate of
862 keV 7Be solar neutrinos based on a 165.4 kton-day exposure of KamLAND. The
observed rate is 582 +/- 90 (kton-day)^-1, which corresponds to a 862 keV 7Be
solar neutrino flux of (3.26 +/- 0.50) x 10^9 cm^-2s^-1, assuming a pure
electron flavor flux. Comparing this flux with the standard solar model
prediction and further assuming three flavor mixing, a nu_e survival
probability of 0.66 +/- 0.14 is determined from the KamLAND data. Utilizing a
global three flavor oscillation analysis, we obtain a total 7Be solar neutrino
flux of (5.82 +/- 0.98) x 10^9 cm^-2s^-1, which is consistent with the standard
solar model predictions.
[2]
oai:arXiv.org:1307.0162 [pdf] - 762222
Calibration of the Super-Kamiokande Detector
Abe, K.;
Hayato, Y.;
Iida, T.;
Iyogi, K.;
Kameda, J.;
Kishimoto, Y.;
Koshio, Y.;
Marti, Ll.;
Miura, M.;
Moriyama, S.;
Nakahata, M.;
Nakano, Y.;
Nakayama, S.;
Obayashi, Y.;
Sekiya, H.;
Shiozawa, M.;
Suzuki, Y.;
Takeda, A.;
Takenaga, Y.;
Tanaka, H.;
Tomura, T.;
Ueno, K.;
Wendell, R. A.;
Yokozawa, T.;
Irvine, T. J.;
Kaji, H.;
Kajita, T.;
Kaneyuki, K.;
Lee, K. P.;
Nishimura, Y.;
Okumura, K.;
McLachlan, T.;
Labarga, L.;
Kearns, E.;
Raaf, J. L.;
Stone, J. L.;
Sulak, L. R.;
Berkman, S.;
Tanaka, H. A.;
Tobayama, S.;
Goldhaber, M.;
Bays, K.;
Carminati, G.;
Kropp, W. R.;
Mine, S.;
Renshaw, A.;
Smy, M. B.;
Sobel, H. W.;
Ganezer, K. S.;
Hill, J.;
Keig, W. E.;
Jang, J. S.;
Kim, J. Y.;
Lim, I. T.;
Hong, N.;
Akiri, T.;
Albert, J. B.;
Himmel, A.;
Scholberg, K.;
Walter, C. W.;
Wongjirad, T.;
Ishizuka, T.;
Tasaka, S.;
Learned, J. G.;
Matsuno, S.;
Smith, S. N.;
Hasegawa, T.;
Ishida, T.;
Ishii, T.;
Kobayashi, T.;
Nakadaira, T.;
Nakamura, K.;
Nishikawa, K.;
Oyama, Y.;
Sakashita, K.;
Sekiguchi, T.;
Tsukamoto, T.;
Suzuki, A. T.;
Takeuchi, Y.;
Huang, K.;
Ieki, K.;
Ikeda, M.;
Kikawa, T.;
Kubo, H.;
Minamino, A.;
Murakami, A.;
Nakaya, T.;
Otani, M.;
Suzuki, K.;
Takahashi, S.;
Fukuda, Y.;
Choi, K.;
Itow, Y.;
Mitsuka, G.;
Miyake, M.;
Mijakowski, P.;
Tacik, R.;
Hignight, J.;
Imber, J.;
Jung, C. K.;
Taylor, I.;
Yanagisawa, C.;
Idehara, Y.;
Ishino, H.;
Kibayashi, A.;
Mori, T.;
Sakuda, M.;
Yamaguchi, R.;
Yano, T.;
Kuno, Y.;
Kim, S. B.;
Yang, B. S.;
Okazawa, H.;
Choi, Y.;
Nishijima, K.;
Koshiba, M.;
Totsuka, Y.;
Yokoyama, M.;
Martens, K.;
Vagins, M. R.;
Martin, J. F.;
de Perio, P.;
Konaka, A.;
Wilking, M. J.;
Chen, S.;
Heng, Y.;
Sui, H.;
Yang, Z.;
Zhang, H.;
Zhenwei, Y.;
Connolly, K.;
Dziomba, M.;
Wilkes, R. J.
Submitted: 2013-06-29, last modified: 2013-12-20
Procedures and results on hardware level detector calibration in
Super-Kamiokande (SK) are presented in this paper. In particular, we report
improvements made in our calibration methods for the experimental phase IV in
which new readout electronics have been operating since 2008. The topics are
separated into two parts. The first part describes the determination of
constants needed to interpret the digitized output of our electronics so that
we can obtain physical numbers such as photon counts and their arrival times
for each photomultiplier tube (PMT). In this context, we developed an in-situ
procedure to determine high-voltage settings for PMTs in large detectors like
SK, as well as a new method for measuring PMT quantum efficiency and gain in
such a detector. The second part describes the modeling of the detector in our
Monte Carlo simulation, including in particular the optical properties of its
water target and their variability over time. Detailed studies on the water
quality are also presented. As a result of this work, we achieved a precision
sufficient for physics analysis over a wide energy range (from a few MeV to
above a TeV). For example, the charge determination was understood at the 1%
level, and the timing resolution was 2.1 nsec at the one-photoelectron charge
level and 0.5 nsec at the 100-photoelectron charge level.
[3]
oai:arXiv.org:0807.3145 [pdf] - 14684
Application of Hamamatsu MPPC to T2K Neutrino Detectors
Yokoyama, M.;
Nakaya, T.;
Gomi, S.;
Minamino, A.;
Nagai, N.;
Nitta, K.;
Orme, D.;
Otani, M.;
Murakami, T.;
Nakadaira, T.;
Tanaka, M.;
Kudenko, Yu.;
Retiere, F.;
Vacheret, A.
Submitted: 2008-07-20
A special type of Hamamatsu MPPC, with a sensitive area of 1.3x1.3mm^2
containing 667 pixels with 50x50um^2 each, has been developed for the near
neutrino detector in the T2K long baseline neutrino experiment. About 60 000
MPPCs will be used in total to read out the plastic scintillator detectors with
wavelength shifting fibers. We report on the basic performance of MPPCs
produced for T2K.
[4]
oai:arXiv.org:0807.3147 [pdf] - 14685
Mass production test of Hamamatsu MPPC for T2K neutrino oscillation
experiment
Yokoyama, M.;
Nakaya, T.;
Gomi, S.;
Minamino, A.;
Nagai, N.;
Nitta, K.;
Orme, D.;
Otani, M.;
Murakami, T.;
Nakadaira, T.;
Tanaka, M.
Submitted: 2008-07-20
In the T2K near neutrino detectors, about 60 000 Hamamatsu Multi-Pixel Photon
Counters (MPPCs) will be used. The mass production of MPPC has started in
February 2008.In order to perform quality assurance and to characterize each
device, we have developed an MPPC test system. For each MPPC, gain, breakdown
voltage, noise rate, photo detection efficiency, and cross-talk and after-pulse
rate are measured as functions of the bias voltage and temperature. The design
of the test system and the measurement procedure are described.