Normalized to: Netzel, A.
[1]
oai:arXiv.org:1209.0123 [pdf] - 1151036
EUV and HXR Signatures of Electron Acceleration During the Failed
Eruption of a Filament
Submitted: 2012-09-01, last modified: 2012-09-26
We search for EUV brightenings in TRACE 171 {\AA} images and HXR bursts
observed during failed eruptions. We expect that if an eruption is confined due
to interaction with overlying magnetic structures then we should observe
effects connected with reconnection between magnetic structures and
acceleration of particles. We utilized TRACE observations of three well
observed failed eruptions. EUV images were compared to HXR spatial distribution
reconstructed from Yohkoh/HXT and RHESSI data. The EUV light curves of a
selected area were compared to height profiles of eruption, HXR emission and
HXR photon spectral index of power-law fit to HXR data. We have found that EUV
brightenings are closely related to the eruption velocity decrease, to HXR
bursts and to episodes of hardening of HXR spectra. The EUV brightened areas
are observed far from the flaring structure, in footpoints of large systems of
loops observed 30-60 minutes after the maximum of a flare. These are not
`post-flare' loops that are also observed but at significantly lower heights.
The high lying systems of loops are observed at heights equal to height, at
which eruption was observed to stop. We observed HXR source spatially
correlated with EUV brightening only once. For other EUV brightened areas we
estimated the expected brightness of HXR sources. We find that EUV brightenings
are produced due to interaction between the erupting structure with overlying
loops. The interaction is strong enough to heat the system of high loops. These
loops cool down and are visible in EUV range about 30-60 minutes later. The
estimated brightness of HXR sources associated with EUV brightenings shows that
they are too weak to be detected with present instruments. However, next
generation instruments will have enough dynamic range and sensitivity to enable
such observations.