Normalized to: Nakamura, H.
[1]
oai:arXiv.org:astro-ph/0410126 [pdf] - 67976
A Prototype Si/CdTe Compton Camera and the Polarization Measurement
Mitani, Takefumi;
Tanaka, Takaaki;
Nakazawa, Kazuhiro;
Takahashi, Tadayuki;
Takashima, Takeshi;
Tajima, Hiroyasu;
Nakamura, Hidehito;
Nomachi, Masaharu;
Nakamoto, Tatsuya;
Fukazawa, Yasushi
Submitted: 2004-10-05
A Compton camera is the most promising approach for gamma-ray detection in
the energy region from several hundred keV to MeV, especially for application
in high energy astrophysics. In order to obtain good angular resolution,
semiconductor detectors such as silicon, germanium and cadmium telluride(CdTe)
have several advantages over scintillation detectors, which have been used so
far. Based on the recent advances of high resolution CdTe and silicon imaging
detectors, we are working on a Si/CdTe Compton camera. We have developed
64-pixel CdTe detectors with a pixel size of 2mmx2mm and double-sided Si strip
detectors(DSSDs) with a position resolution of 800 micron. As a prototype
Si/CdTe Compton camera, we use a DSSD as a scatterer and two CdTe pixel
detectors as an absorber. In order to verify its performance, we irradiate the
camera with 100% linearly polarised 170keV gamma-rays and demonstrate the
system works properly as a Compton camera. The resolution of the reconstructed
scattering angle is 22 degrees(FWHM). Measurement of polarization is also
reported. The polarimetric modulation factor is obtained to be 43%, which is
consistent with the prediction of Monte Carlo simulations.
[2]
oai:arXiv.org:astro-ph/0410058 [pdf] - 67908
Development of a Si/CdTe semiconductor Compton telescope
Tanaka, Takaaki;
Mitani, Takefumi;
Watanabe, Shin;
Nakazawa, Kazuhiro;
Oonuki, Kousuke;
Sato, Goro;
Takahashi, Tadayuki;
Tamura, Ken'ichi;
Tajima, Hiroyasu;
Nakamura, Hidehito;
Nomachi, Masaharu;
Nakamoto, Tatsuya;
Fukazawa, Yasushi
Submitted: 2004-10-03
We are developing a Compton telescope based on high resolution Si and CdTe
imaging devices in order to obtain a high sensitivity astrophysical observation
in sub-MeV gamma-ray region. In this paper, recent results from the prototype
Si/CdTe semiconductor Compton telescope are reported. The Compton telescope
consists of a double-sided Si strip detector (DSSD) and CdTe pixel detectors,
combined with low noise analog LSI, VA32TA. With this detector, we obtained
Compton reconstructed images and spectra from line gamma-rays ranging from 81
keV up to 356 keV. The energy resolution is 3.8 keV and 7.9 keV at 122 keV and
356 keV, respectively, and the angular resolution is 9.9 degrees and 5.7
degrees at 122 keV and 356 keV, respectively.
[3]
oai:arXiv.org:astro-ph/0407114 [pdf] - 65956
Gamma-ray Polarimetry with Compton Telescope
Tajima, Hiroyasu;
Madejski, Grzegorz;
Mitani, Takefumi;
Tanaka, Takaaki;
Nakamura, Hidehito;
Nakazawa, Kazuhiro;
Takahashi, Tadayuki;
Fukazawa, Yasushi;
Kamae, Tuneyoshi;
Kokubun, Motohide;
Marlow, Daniel;
Nomachi, Masaharu;
Silva, Eduardo do Couto e
Submitted: 2004-07-06
Compton telescope is a promising technology to achieve very high sensitivity
in the soft gamma-ray band (0.1-10 MeV) by utilizing Compton kinematics.
Compton kinematics also enables polarization measurement which will open new
windows to study gamma-ray production mechanism in the universe. CdTe and Si
semiconductor technologies are key technologies to realize the Compton
telescope in which their high energy resolution is crucial for high angular
resolution and background rejection capability. We have assembled a prototype
module using a double-sided silicon strip detector and CdTe pixel detectors. In
this paper, we present expected polarization performance of a proposed mission
(NeXT/SGD). We also report results from polarization measurements using
polarized synchrotron light and validation of EGS4 MC simulation.