The in-orbit performance and calibration of the Hard X-ray Detector (HXD) on board the X-ray astronomy satellite Suzaku are described. Its basic performances, including a wide energy bandpass of 10-600 keV, energy resolutions of ~4 keV (FWHM) at 40 keV and ~11% at 511 keV, and a high background rejection efficiency, have been confirmed by extensive in-orbit calibrations. The long-term gains of PIN-Si diodes have been stable within 1% for half a year, and those of scintillators have decreased by 5-20%. The residual non-X-ray background of the HXD is the lowest among past non-imaging hard X-ray instruments in energy ranges of 15-70 and 150-500 keV. We provide accurate calibrations of energy responses, angular responses, timing accuracy of the HXD, and relative normalizations to the X-ray CCD cameras using multiple observations of the Crab Nebula.

The Hard X-ray Detector (HXD) on board Suzaku covers a wide energy range from 10 keV to 600 keV by combination of silicon PIN diodes and GSO scintillators. The HXD is designed to achieve an extremely low in-orbit back ground based on a combination of new techniques, including the concept of well-type active shield counter. With an effective area of 142 cm^2 at 20 keV and 273 cm2 at 150 keV, the background level at the sea level reached ~1x10^{-5} cts s^{-1} cm^{-2} keV^{-1} at 30 keV for the PI N diodes, and ~2x10^{-5} cts s^{-1} cm^{-2} keV^{-1} at 100 keV, and ~7x10^{-6} cts s^{-1} cm^{-2} keV^{-1} at 200 keV for the phoswich counter. Tight active shielding of the HXD results in a large array of guard counters surrounding the main detector parts. These anti-coincidence counters, made of ~4 cm thick BGO crystals, have a large effective area for sub-MeV to MeV gamma-rays. They work as an excellent gamma-ray burst monitor with limited angular resolution (~5 degree). The on-board signal-processing system and the data transmitted to the ground are also described.

The Soft Gamma-ray Detector (SGD) on board the NeXT (Japanese future high energy astrophysics mission) is a Compton telescope with narrow field of view (FOV), which utilizes Compton kinematics to enhance its background rejection capabilities. It is realized as a hybrid semiconductor gamma-ray detector which consists of silicon and CdTe (cadmium telluride) detectors. It can detect photons in a wide energy band (0.05-1 MeV) at a background level of 5 x 10^-7 counts/cm^2/s; the silicon layers are required to improve the performance at a lower energy band (<0.3 MeV). Excellent energy resolution is the key feature of the SGD, allowing it to achieve both high angular resolution and good background rejection capability. An additional capability of the SGD, its ability to measure gamma-ray polarization, opens up a new window to study properties of astronomical objects. We will present the development of key technologies to realize the SGD: high quality CdTe, low noise front-end ASIC and bump bonding technology. Energy resolutions of 1.7 keV (FWHM) for CdTe pixel detectors and 1.1 keV for Si strip detectors have been measured. We also present the validation of Monte Carlo simulation used to evaluate the performance of the SGD.

We have been developing a semiconductor Compton telescope to explore the universe in the energy band from several tens of keV to a few MeV. We use a Si strip and CdTe pixel detector for the Compton telescope to cover an energy range from 60 keV. For energies above several hundred keV, the higher efficiency of CdTe semiconductor in comparison with Si is expected to play an important role as an absorber and a scatterer. In order to demonstrate the spectral and imaging capability of a CdTe-based Compton Telescope, we have developed a Compton telescope consisting of a stack of CdTe pixel detectors as a small scale prototype. With this prototype, we succeeded in reconstructing images and spectra by solving the Compton equation from 122 keV to 662 keV. The energy resolution (FWHM) of reconstructed spectra is 7.3 keV at 511 keV and 3.1 keV at 122 keV, respectively. The angular resolution obtained at 511 keV is measured to be 12.2 degree (FWHM).

A Compton camera is the most promising approach for gamma-ray detection in the energy region from several hundred keV to MeV, especially for application in high energy astrophysics. In order to obtain good angular resolution, semiconductor detectors such as silicon, germanium and cadmium telluride(CdTe) have several advantages over scintillation detectors, which have been used so far. Based on the recent advances of high resolution CdTe and silicon imaging detectors, we are working on a Si/CdTe Compton camera. We have developed 64-pixel CdTe detectors with a pixel size of 2mmx2mm and double-sided Si strip detectors(DSSDs) with a position resolution of 800 micron. As a prototype Si/CdTe Compton camera, we use a DSSD as a scatterer and two CdTe pixel detectors as an absorber. In order to verify its performance, we irradiate the camera with 100% linearly polarised 170keV gamma-rays and demonstrate the system works properly as a Compton camera. The resolution of the reconstructed scattering angle is 22 degrees(FWHM). Measurement of polarization is also reported. The polarimetric modulation factor is obtained to be 43%, which is consistent with the prediction of Monte Carlo simulations.

We are developing a Compton telescope based on high resolution Si and CdTe imaging devices in order to obtain a high sensitivity astrophysical observation in sub-MeV gamma-ray region. In this paper, recent results from the prototype Si/CdTe semiconductor Compton telescope are reported. The Compton telescope consists of a double-sided Si strip detector (DSSD) and CdTe pixel detectors, combined with low noise analog LSI, VA32TA. With this detector, we obtained Compton reconstructed images and spectra from line gamma-rays ranging from 81 keV up to 356 keV. The energy resolution is 3.8 keV and 7.9 keV at 122 keV and 356 keV, respectively, and the angular resolution is 9.9 degrees and 5.7 degrees at 122 keV and 356 keV, respectively.

We have developed a large CdTe pixel detector with dimensions of 23.7 x 13.0 mm and a pixel size of 448 x 448 um^2. The detector is based on recent technologies of an uniform CdTe single crystal, a two-dimensional ASIC, and stud bump-bonding to connect pixel electrodes on the CdTe surface to the ASIC. Good spectra are obtained from 1051 pixels out of total 1056 pixels. When we operate the detector at -50 C, the energy resolution is 0.67 keV and 0.99 keV at 14 keV and 60 keV, respectively. Week-long stability of the detector is confirmed at operating temperatures of both -50 C and -20 C. The detector also shows high uniformity: the peak positions for all pixels agree to within 0.82%, and the average of the energy resolution is 1.04 keV at a temperature of -50 C. When we normalized the peak area by the total counts detected by each pixel, a variation of 2.1 % is obtained.

Compton telescope is a promising technology to achieve very high sensitivity in the soft gamma-ray band (0.1-10 MeV) by utilizing Compton kinematics. Compton kinematics also enables polarization measurement which will open new windows to study gamma-ray production mechanism in the universe. CdTe and Si semiconductor technologies are key technologies to realize the Compton telescope in which their high energy resolution is crucial for high angular resolution and background rejection capability. We have assembled a prototype module using a double-sided silicon strip detector and CdTe pixel detectors. In this paper, we present expected polarization performance of a proposed mission (NeXT/SGD). We also report results from polarization measurements using polarized synchrotron light and validation of EGS4 MC simulation.

Compton telescopes based on semiconductor technologies are being developed to explore the gamma-ray universe in an energy band 0.1--20 MeV, which is not well covered by the present or near-future gamma-ray telescopes. The key feature of such Compton telescopes is the high energy resolution that is crucial for high angular resolution and high background rejection capability. The energy resolution around 1 keV is required to approach physical limit of the angular resolution due to Doppler broadening. We have developed a low noise front-end ASIC (Application-Specific Integrated Circuit), VA32TA, to realize this goal for the readout of Double-sided Silicon Strip Detector (DSSD) and Cadmium Telluride (CdTe) pixel detector which are essential elements of the semiconductor Compton telescope. We report on the design and test results of the VA32TA. We have reached an energy resolution of 1.3 keV (FWHM) for 60 keV and 122 keV at 0 degree C with a DSSD and 1.7 keV (FWHM) with a CdTe detector.

A Semiconductor Multiple-Compton Telescope (SMCT) is being developed to explore the gamma-ray universe in an energy band 0.1--20 MeV, which is not well covered by the present or near-future gamma-ray telescopes. The key feature of the SMCT is the high energy resolution that is crucial for high angular resolution and high background rejection capability. We have developed prototype modules for a low noise Double-sided Silicon Strip Detector (DSSD) system which is an essential element of the SMCT. The geometry of the DSSD is optimized to achieve the lowest noise possible. A new front-end VLSI device optimized for low noise operation is also developed. We report on the design and test results of the prototype system. We have reached an energy resolution of 1.3 keV (FWHM) for 60 keV and 122 keV at 0 degree C.