Normalized to: Mayr, C.
[1]
oai:arXiv.org:1408.1926 [pdf] - 863317
65 nm CMOS Sensors Applied to Mathematically Exact Colorimetric
Reconstruction
Submitted: 2014-08-08
Extracting colorimetric image information from the spectral characteristics
of image sensors is a key issue in accurate image acquisition. Technically
feasible filter/sensor combinations usually do not replicate colorimetric
responses with sufficient accuracy to be directly applicable to color
representation. A variety of transformations have been proposed in the
literature to compensate for this. However, most of those rely on heuristics
and/or introduce a reconstruction dependent on the composition of the incoming
illumination. In this work, we present a spectral reconstruction method that is
independent of illumination and is derived in a mathematically strict way. It
provides a deterministic method to arrive at a least mean squared error
approximation of a target spectral characteristic from arbitrary sensor
response curves. Further, we present a new CMOS sensor design in a standard
digital 65nm CMOS technology. Novel circuit techniques are used to achieve
performance comparable with much larger-sized specialized photo-CMOS processes.
The sensor is utilized as testbed for the spectral reconstruction method.