Sensor pattern noise has been found to be a reliable tool for providing information relating to the provenance of an image. Conventionally sensor pattern noise is modelled as a mutual interaction of pixel non-uniformity noise and dark current. By using a wavelet denoising filter it is possible to isolate a unique signal within a sensor caused by the way the silicon reacts non-uniformly to light. This signal is often referred to as a fingerprint. To obtain the estimate of this photo response non-uniformity multiple sample images are averaged and filtered to derive a noise residue. This process and model, while useful at providing insight into an images provenance, fails to take into account additional sources of noise that are obtained during this process. These other sources of noise include digital processing artefacts collectively known as camera noise, image compression artefacts, lens artefacts, and image content. By analysing the diversity of sources of noise remaining within the noise residue, we show that further insight is possible within a unified sensor pattern noise concept which opens the field to approaches for obtaining fingerprints utilising fewer resources with comparable performance to existing methods.