Lindenberger, A.
Normalized to: Lindenberger, A.
1 article(s) in total. 13 co-authors. Median position in authors list is 12,0.
[1]
oai:arXiv.org:astro-ph/0006295 [pdf] - 36675
The ORFEUS II Echelle Spectrometer: Instrument description, performance
and data reduction
Barnstedt, J.;
Kappelmann, N.;
Appenzeller, I.;
Fromm, A.;
Goelz, M.;
Grewing, M.;
Gringel, W.;
Haas, C.;
Hopfensitz, W.;
Kraemer, G.;
Krautter, J.;
Lindenberger, A.;
Mandel, H.;
Widmann, H.
Submitted: 2000-06-21
During the second flight of the ORFEUS-SPAS mission in November/December
1996, the Echelle spectrometer was used extensively by the Principal and Guest
Investigator teams as one of the two focal plane instruments of the ORFEUS
telescope. We present the in-flight performance and the principles of the data
reduction for this instrument. The wavelength range is 90 nm to 140 nm, the
spectral resolution is significantly better than lambda/(Delta lambda) = 10000,
where Delta lambda is measured as FWHM of the instrumental profile. The
effective area peaks at 1.3 cm^2 near 110 nm. The background is dominated by
straylight from the Echelle grating and is about 15% in an extracted spectrum
for spectra with a rather flat continuum. The internal accuracy of the
wavelength calibration is better than +/- 0.005 nm.
