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Kley, Ernst-Bernhard

Normalized to: Kley, E.

2 article(s) in total. 20 co-authors, from 1 to 2 common article(s). Median position in authors list is 4,5.

[1]  oai:arXiv.org:1410.1808  [pdf] - 1451808
Upper Limit to the Transverse to Longitudinal Motion Coupling of a Waveguide Mirror
Comments:
Submitted: 2014-10-06, last modified: 2015-08-10
Waveguide mirrors possess nano-structured surfaces which can potentially provide a significant reduction in thermal noise over conventional dielectric mirrors. To avoid introducing additional phase noise from motion of the mirror transverse to the reflected light, however, they must possess a mechanism to suppress the phase effects associated with the incident light translating across the nano-structured surface. It has been shown that with carefully chosen parameters this additional phase noise can be suppressed. We present an experimental measurement of the coupling of transverse to longitudinal displacements in such a waveguide mirror designed for 1064 nm light. We place an upper limit on the level of measured transverse to longitudinal coupling of one part in seventeen thousand with 95% confidence, representing a significant improvement over a previously measured grating mirror.
[2]  oai:arXiv.org:1308.6677  [pdf] - 713370
Calculation of thermal noise in grating reflectors
Comments: 17 pages, 11 figures
Submitted: 2013-08-30
Grating reflectors have been repeatedly discussed to improve the noise performance of metrological applications due to the reduction or absence of any coating material. So far, however, no quantitative estimate on the thermal noise of these reflective structures exists. In this work we present a theoretical calculation of a grating reflector's noise. We further apply it to a proposed 3rd generation gravitational wave detector. Depending on the grating geometry, the grating material and the temperature we obtain a thermal noise decrease by up to a factor of ten compared to conventional dielectric mirrors. Thus the use of grating reflectors can substantially improve the noise performance in metrological applications.