We discuss a robust method to simultaneously fit a complex model both to the complex impedance and the noise data for transition-edge sensors (TES). It is based on a differential evolution (DE) algorithm, providing accurate and repeatable results with only a small increase in computational cost compared to the standard least squares (LS) fitting method. Test fits are made using both DE and LS methods, and the results compared with previously determined best fits, with varying initial value deviations and limit ranges for the parameters. The robustness of DE is demonstrated with successful fits even when parameter limits up to a factor of 5 from the known values were used. It is shown that the least squares fitting becomes unreliable beyond a 10% deviation from the known values.

In order to investigate the origin of the until now unaccounted excess noise and to minimize the uncontrollable phenomena at the transition in X-ray microcalorimeters we have developed superconducting transition-edge sensors into an edgeless geometry, the so-called Corbino disk (CorTES), with superconducting contacts in the centre and at the outer perimeter. The measured rms current noise and its spectral density can be modeled as resistance noise resulting from fluctuations near the equilibrium superconductor-normal metal boundary