Normalized to: Kan, H.
[1]
oai:arXiv.org:1307.3221 [pdf] - 691775
Single event effect characterization of the mixed-signal ASIC developed
for CCD camera in space use
Nakajima, Hiroshi;
Fujikawa, Mari;
Mori, Hideki;
Kan, Hiroaki;
Ueda, Shutaro;
Kosugi, Hiroko;
Anabuki, Naohisa;
Hayashida, Kiyoshi;
Tsunemi, Hiroshi;
Doty, John P.;
Ikeda, Hirokazu;
Kitamura, Hisashi;
Uchihori, Yukio
Submitted: 2013-07-11
We present the single event effect (SEE) tolerance of a mixed-signal
application-specific integrated circuit (ASIC) developed for a charge-coupled
device camera onboard a future X-ray astronomical mission. We adopted proton
and heavy ion beams at HIMAC/NIRS in Japan. The particles with high linear
energy transfer (LET) of 57.9 MeV cm^{2}/mg is used to measure the single event
latch-up (SEL) tolerance, which results in a sufficiently low cross-section of
sigma_{SEL} < 4.2x10^{-11} cm^{2}/(IonxASIC). The single event upset (SEU)
tolerance is estimated with various kinds of species with wide range of energy.
Taking into account that a part of the protons creates recoiled heavy ions that
has higher LET than that of the incident protons, we derived the probability of
SEU event as a function of LET. Then the SEE event rate in a low-earth orbit is
estimated considering a simulation result of LET spectrum. SEL rate is below
once per 49 years, which satisfies the required latch-up tolerance. The upper
limit of the SEU rate is derived to be 1.3x10^{-3}events/sec. Although the SEU
events cannot be distinguished from the signals of X-ray photons from
astronomical objects, the derived SEU rate is below 1.3% of expected non-X-ray
background rate of the detector and hence these events should not be a major
component of the instrumental background.
[2]
oai:arXiv.org:1306.5400 [pdf] - 683985
Proton Radiation Damage Experiment on P-Channel CCD for an X-ray CCD
camera onboard the Astro-H satellite
Mori, Koji;
Nishioka, Yusuke;
Ohura, Satoshi;
Koura, Yoshiaki;
Yamauchi, Makoto;
Nakajima, Hiroshi;
Ueda, Shutaro;
Kan, Hiroaki;
Anabuki, Naohisa;
Nagino, Ryo;
Hayashida, Kiyoshi;
Tsunemi, Hiroshi;
Kohmura, Takayoshi;
Ikeda, Shoma;
Murakami, Hiroshi;
Ozaki, Masanobu;
Dotani, Tadayasu;
Maeda, Yukie;
Sagara, Kenshi
Submitted: 2013-06-23
We report on a proton radiation damage experiment on P-channel CCD newly
developed for an X-ray CCD camera onboard the Astro-H satellite. The device was
exposed up to 10^9 protons cm^{-2} at 6.7 MeV. The charge transfer inefficiency
(CTI) was measured as a function of radiation dose. In comparison with the CTI
currently measured in the CCD camera onboard the Suzaku satellite for 6 years,
we confirmed that the new type of P-channel CCD is radiation tolerant enough
for space use. We also confirmed that a charge-injection technique and lowering
the operating temperature efficiently work to reduce the CTI for our device. A
comparison with other P-channel CCD experiments is also discussed.