We propose to use the defect creation energy loss in commonly used high energy physics solid state detectors as a tool to statistically identify dark matter signal from background. We simulate the energy loss in the process of defect creation using density functional theory and molecular dynamics methods and calculate the corresponding expected dark matter spectra. We show that in phonon-mediated solid state detectors, the energy loss due to defect creation convolved with the expected dark matter interaction signal results in a significant change in the expected spectra for common detector materials. With recent progress towards $\sim$10 eV threshold low-mass dark matter searches, this variation in expected dark matter spectrum can be used as a direct signature of dark matter interactions with atomic nuclei.

We propose a method using solid state detectors with directional sensitivity to dark matter interactions to detect low-mass Weakly Interacting Massive Particles (WIMPs) originating from galactic sources. In spite of a large body of literature for high-mass WIMP detectors with directional sensitivity, no available technique exists to cover WIMPs in the mass range <1 GeV. We argue that single-electron resolution semiconductor detectors allow for directional sensitivity once properly calibrated. We examine commonly used semiconductor material response to these low-mass WIMP interactions.