We observed the Galactic mixed-morphology supernova remnant G166.0+4.3 with Suzaku. The X-ray spectrum in the western part of the remnant is well represented by a one-component ionizing plasma model. The spectrum in the northeastern region can be explained by two components. One is the Fe-rich component with the electron temperature $kT_e = 0.87_{-0.03}^{+0.02}$ keV. The other is the recombining plasma component of lighter elements with $kT_e = 0.46\pm0.03$ keV, the initial temperature $kT_{init} = 3$ keV (fixed) and the ionization parameter $n_et = (6.1_{-0.4}^{+0.5}) \times 10^{11} \rm cm^{-3} s$. As the formation process of the recombining plasma, two scenarios, the rarefaction and thermal conduction, are considered. The former would not be favored since we found the recombining plasma only in the northeastern region whereas the latter would explain the origin of the RP. In the latter scenario, an RP is anticipated in a part of the remnant where blast waves are in contact with cool dense gas. The emission measure suggests higher ambient gas density in the northeastern region. The morphology of the radio shell and a GeV gamma-ray emission also suggest a molecular cloud in the region.

Gamma-ray polarization offers a unique probes into the geometry of the gamma-ray emission process in celestial objects. The Soft Gamma-ray Detector (SGD) onboard the X-ray observatory Hitomi is a Si/CdTe Compton camera and is expected to be an excellent polarimeter, as well as a highly sensitive spectrometer due to its good angular coverage and resolution for Compton scattering. A beam test of the final-prototype for the SGD Compton camera was conducted to demonstrate its polarimetric capability and to verify and calibrate the Monte Carlo simulation of the instrument. The modulation factor of the SGD prototype camera, evaluated for the inner and outer parts of the CdTe sensors as absorbers, was measured to be 0.649--0.701 (inner part) and 0.637--0.653 (outer part) at 122.2 keV and 0.610--0.651 (inner part) and 0.564--0.592 (outer part) at 194.5 keV at varying polarization angles with respect to the detector. This indicates that the relative systematic uncertainty of the modulation factor is as small as ~3%.

We have been developing X-ray SOI pixel Sensors, called "XRPIX", for future X-ray astronomy satellites that enable us to observe in the wide energy band of 0.5-40 keV. Since XRPIXs have the circuitry layer with a thickness of about 8 {\mu}m in the front side of the sensor, it is impossible to detect low energy X-rays with a front-illuminated type. So, we have been developing back-illuminated type of XRPIX with a less 1 {\mu}m dead layer in the back-side, which enables the sensitivity to reach 0.5 keV. We produced two types of back-side illuminated (BI) XRPIXs, one of which is produced in "Pizza process" which LBNL developed and the other is processed in the ion implantation and laser annealing. We irradiated both of the BI-XRPIXs with soft X-ray and investigate soft X-ray performance of them. We report results from soft X-ray evaluation test of the device.