Normalized to: House, A.
[1]
oai:arXiv.org:1903.03663 [pdf] - 1920852
Characterization of the Hamamatsu VUV4 MPPCs for nEXO
Gallina, G.;
Giampa, P.;
Retiere, F.;
Kroeger, J.;
Zhang, G.;
Ward, M.;
Margetak, P.;
Lic, G.;
Tsang, T.;
Doria, L.;
Kharusi, S. Al;
Alfaris, M.;
Anton, G.;
Arnquist, I. J.;
Badhrees, I.;
Barbeau, P. S.;
Beck, D.;
Belov, V.;
Bhatta, T.;
Blatchford, J.;
Brodsky, J. P.;
Brown, E.;
Brunner, T.;
Cao, G. F.;
Cao, L.;
Cen, W. R.;
Chambers, C.;
Charlebois, S. A.;
Chiu, M.;
Cleveland, B.;
Coon, M.;
Craycraft, A.;
Dalmasson, J.;
Daniels, T.;
Darroch, L.;
Daugherty, S. J.;
Croix, A. De St.;
Der Mesrobian-Kabakian, A.;
DeVoe, R.;
Dilling, J.;
Ding, Y. Y.;
Dolinski, M. J.;
Dragone, A.;
Echevers, J.;
Elbeltagi, M.;
Fabris, L.;
Fairbank, D.;
Fairbank, W.;
Farine, J.;
Feyzbakhsh, S.;
Fontaine, R.;
Gautam, P.;
Giacomini, G.;
Gornea, R.;
Gratta, G.;
Hansen, E. V.;
Heffner, M.;
Hoppe, E. W.;
Hoßl, J.;
House, A.;
Hughes, M.;
Ito, Y.;
Iverson, A.;
Jamil, A.;
Jewell, M. J.;
Jiang, X. S.;
Karelin, A.;
Kaufman, L. J.;
Kodroff, D.;
Koffas, T.;
Krucken, R.;
Kuchenkov, A.;
Kumar, K. S.;
Lana, Y.;
Larson, A.;
Lenardo, B. G.;
Leonarda, D. S.;
Lik, S.;
Li, Z.;
Licciardi, C.;
Linw, Y. H.;
Lv, P.;
MacLellan, R.;
McElroy, T.;
Medina-Peregrina, M.;
Michel, T.;
Mong, B.;
Moore, D. C.;
Murray, K.;
Nakarmi, P.;
Newby, R. J.;
Ning, Z.;
Njoya, O.;
Nolet, F.;
Nusair, O.;
Odgers, K.;
Odian, A.;
Oriunno, M.;
Orrell, J. L.;
Ortega, G. S.;
Ostrovskiy, I.;
Overman, C. T.;
Parent, S.;
Piepkez, A.;
Pocar, A.;
Pratte, J. -F.;
Qiu, D.;
Radeka, V.;
Raguzin, E.;
Rescia, S.;
Richman, M.;
Robinson, A.;
Rossignol, T.;
Rowson, P. C.;
Roy, N.;
Saldanha, R.;
Sangiorgio, S.;
VIII, K. Skarpaas;
Soma, A. K.;
St-Hilaire, G.;
Stekhanov, V.;
Stiegler, T.;
Sun, X. L.;
Tarka, M.;
Todd, J.;
Tolba, T.;
Totev, T. I.;
Tsang, R.;
Vachon, F.;
Veeraraghavan, V.;
Visser, G.;
Vuilleumier, J. -L.;
Wagenpfeil, M.;
Walent, M.;
Wang, Q.;
Watkins, J.;
Weber, M.;
Wei, W.;
Wen, L. J.;
Wichoski, U.;
Wu, S. X.;
Wu, W. H.;
Wu, X.;
Xia, Q.;
Yang, H.;
Yang, L.;
Yen, Y. -R.;
Zeldovich, O.;
Zhao, J.;
Zhou, Y.;
Ziegler, T.
Submitted: 2019-03-08, last modified: 2019-06-07
In this paper we report on the characterization of the Hamamatsu VUV4 (S/N:
S13370-6152) Vacuum Ultra-Violet (VUV) sensitive Silicon Photo-Multipliers
(SiPMs) as part of the development of a solution for the detection of liquid
xenon scintillation light for the nEXO experiment. Various SiPM features, such
as: dark noise, gain, correlated avalanches, direct crosstalk and Photon
Detection Efficiency (PDE) were measured in a dedicated setup at TRIUMF. SiPMs
were characterized in the range $163 \text{ } \text{K} \leq \text{T}\leq 233
\text{ } \text{K}$. At an over voltage of $3.1\pm0.2$ V and at $\text{T}=163
\text{ }\text{K}$ we report a number of Correlated Avalanches (CAs) per pulse
in the $1 \upmu\text{s}$ interval following the trigger pulse of
$0.161\pm0.005$. At the same settings the Dark-Noise (DN) rate is
$0.137\pm0.002 \text{ Hz/mm}^{2}$. Both the number of CAs and the DN rate are
within nEXO specifications. The PDE of the Hamamatsu VUV4 was measured for two
different devices at $\text{T}=233 \text{ }\text{K}$ for a mean wavelength of
$189\pm7\text{ nm}$. At $3.6\pm0.2$ V and $3.5\pm0.2$ V of over voltage we
report a PDE of $13.4\pm2.6\text{ }\%$ and $11\pm2\%$, corresponding to a
saturation PDE of $14.8\pm2.8\text{ }\%$ and $12.2\pm2.3\%$, respectively. Both
values are well below the $24\text{ }\%$ saturation PDE advertised by
Hamamatsu. More generally, the second device tested at $3.5\pm0.2$ V of over
voltage is below the nEXO PDE requirement. The first one instead yields a PDE
that is marginally close to meeting the nEXO specifications. This suggests that
with modest improvements the Hamamatsu VUV4 MPPCs could be considered as an
alternative to the FBK-LF SiPMs for the final design of the nEXO detector.
