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Gillaspy, J. D.

Normalized to: Gillaspy, J.

3 article(s) in total. 28 co-authors, from 1 to 2 common article(s). Median position in authors list is 1,0.

[1]  oai:arXiv.org:1902.01234  [pdf] - 1842520
EBIT Observation of Ar Dielectronic Recombination Lines Near the Unknown Faint X-Ray Feature Found in the Stacked Spectrum of Galaxy Clusters
Comments:
Submitted: 2019-02-04
Motivated by possible atomic origins of the unidentified emission line detected at 3.55 keV to 3.57 keV in a stacked spectrum of galaxy clusters (Bulbul et al. 2014), an electron beam ion trap (EBIT) was used to investigate the resonant dielectronic recombination (DR) process in highly-charged argon ions as a possible contributor to the emission feature. The He-like Ar DR-induced transition 1s$^2$2l - 1s2l3l$^\prime$ was suggested to produce a 3.62 keV photon (Bulbul et al. 2014) near the unidentified line at 3.57 keV and was the starting point of our investigation. The collisional-radiative model NOMAD was used to create synthetic spectra for comparison with both our EBIT measurements and with spectra produced with the AtomDB database/Astrophysical Plasma Emission Code (APEC) used in the Bulbul et al. (2014) work. Excellent agreement was found between the NOMAD and EBIT spectra, providing a high level of confidence in the atomic data used. Comparison of the NOMAD and APEC spectra revealed a number of missing features in the AtomDB database near the unidentified line. At an electron temperature of $T_e$ = 1.72 keV, the inclusion of the missing lines in AtomDB increases the total flux in the 3.5 keV to 3.66 keV energy band by a factor of 2. While important, this extra emission is not enough to explain the unidentified line found in the galaxy cluster spectra.
[2]  oai:arXiv.org:1106.2782  [pdf] - 372586
Fe XVII X-ray Line Ratios for Accurate Astrophysical Plasma Diagnostics
Comments: 29 pages, including 7 figures
Submitted: 2011-06-14
New laboratory measurements using an Electron Beam Ion Trap (EBIT) and an x-ray microcalorimeter are presented for the n=3 to n=2 Fe XVII emission lines in the 15 {\AA} to 17 {\AA} range, along with new theoretical predictions for a variety of electron energy distributions. This work improves upon our earlier work on these lines by providing measurements at more electron impact energies (seven values from 846 to 1185 eV), performing an in situ determination of the x-ray window transmission, taking steps to minimize the ion impurity concentrations, correcting the electron energies for space charge shifts, and estimating the residual electron energy uncertainties. The results for the 3C/3D and 3s/3C line ratios are generally in agreement with the closest theory to within 10%, and in agreement with previous measurements from an independent group to within 20%. Better consistency between the two experimental groups is obtained at the lowest electron energies by using theory to interpolate, taking into account the significantly different electron energy distributions. Evidence for resonance collision effects in the spectra is discussed. Renormalized values for the absolute cross sections of the 3C and 3D lines are obtained by combining previously published results, and shown to be in agreement with the predictions of converged R-matrix theory. This work establishes consistency between results from independent laboratories and improves the reliability of these lines for astrophysical diagnostics. Factors that should be taken into account for accurate diagnostics are discussed, including electron energy distribution, polarization, absorption/scattering, and line blends.
[3]  oai:arXiv.org:physics/0603131  [pdf] - 1456485
Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility
Comments: 10 pages
Submitted: 2006-03-16
After a brief introduction to the NIST EBIT facility, we present the results of three different types of experiments that have been carried out there recently: EUV and visible spectroscopy in support of the microelectronics industry, laboratory astrophysics using an x-ray microcalorimeter, and charge exchange studies using extracted beams of highly charged ions.