Normalized to: Gillaspy, J.
[1]
oai:arXiv.org:1902.01234 [pdf] - 1842520
EBIT Observation of Ar Dielectronic Recombination Lines Near the Unknown
Faint X-Ray Feature Found in the Stacked Spectrum of Galaxy Clusters
Gall, Amy C.;
Foster, Adam R.;
Silwal, Roshani;
Dreiling, Joan M.;
Borovik, Alexander;
Kilgore, Ethan;
Ajello, Marco;
Gillaspy, John D.;
Ralchenko, Yuri;
Takacs, Endre
Submitted: 2019-02-04
Motivated by possible atomic origins of the unidentified emission line
detected at 3.55 keV to 3.57 keV in a stacked spectrum of galaxy clusters
(Bulbul et al. 2014), an electron beam ion trap (EBIT) was used to investigate
the resonant dielectronic recombination (DR) process in highly-charged argon
ions as a possible contributor to the emission feature. The He-like Ar
DR-induced transition 1s$^2$2l - 1s2l3l$^\prime$ was suggested to produce a
3.62 keV photon (Bulbul et al. 2014) near the unidentified line at 3.57 keV and
was the starting point of our investigation. The collisional-radiative model
NOMAD was used to create synthetic spectra for comparison with both our EBIT
measurements and with spectra produced with the AtomDB database/Astrophysical
Plasma Emission Code (APEC) used in the Bulbul et al. (2014) work. Excellent
agreement was found between the NOMAD and EBIT spectra, providing a high level
of confidence in the atomic data used. Comparison of the NOMAD and APEC spectra
revealed a number of missing features in the AtomDB database near the
unidentified line. At an electron temperature of $T_e$ = 1.72 keV, the
inclusion of the missing lines in AtomDB increases the total flux in the 3.5
keV to 3.66 keV energy band by a factor of 2. While important, this extra
emission is not enough to explain the unidentified line found in the galaxy
cluster spectra.
[2]
oai:arXiv.org:1106.2782 [pdf] - 372586
Fe XVII X-ray Line Ratios for Accurate Astrophysical Plasma Diagnostics
Submitted: 2011-06-14
New laboratory measurements using an Electron Beam Ion Trap (EBIT) and an
x-ray microcalorimeter are presented for the n=3 to n=2 Fe XVII emission lines
in the 15 {\AA} to 17 {\AA} range, along with new theoretical predictions for a
variety of electron energy distributions. This work improves upon our earlier
work on these lines by providing measurements at more electron impact energies
(seven values from 846 to 1185 eV), performing an in situ determination of the
x-ray window transmission, taking steps to minimize the ion impurity
concentrations, correcting the electron energies for space charge shifts, and
estimating the residual electron energy uncertainties. The results for the
3C/3D and 3s/3C line ratios are generally in agreement with the closest theory
to within 10%, and in agreement with previous measurements from an independent
group to within 20%. Better consistency between the two experimental groups is
obtained at the lowest electron energies by using theory to interpolate, taking
into account the significantly different electron energy distributions.
Evidence for resonance collision effects in the spectra is discussed.
Renormalized values for the absolute cross sections of the 3C and 3D lines are
obtained by combining previously published results, and shown to be in
agreement with the predictions of converged R-matrix theory. This work
establishes consistency between results from independent laboratories and
improves the reliability of these lines for astrophysical diagnostics. Factors
that should be taken into account for accurate diagnostics are discussed,
including electron energy distribution, polarization, absorption/scattering,
and line blends.
[3]
oai:arXiv.org:physics/0603131 [pdf] - 1456485
Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility
Gillaspy, J. D.;
Blagojevic, B.;
Dalgarno, A.;
Fahey, K.;
Kharchenko, V.;
Laming, J. M.;
Bigot, E. -O. Le;
Lugosi, L.;
Makonyi, K.;
Ratliff, L. P.;
Schnopper, H. W.;
Silver, E. H.;
Takacs, E.;
Tan, J. N.;
Tawara, H.;
Tokési, K.
Submitted: 2006-03-16
After a brief introduction to the NIST EBIT facility, we present the results
of three different types of experiments that have been carried out there
recently: EUV and visible spectroscopy in support of the microelectronics
industry, laboratory astrophysics using an x-ray microcalorimeter, and charge
exchange studies using extracted beams of highly charged ions.