Thanks to high-resolution and non-dispersive spectrometers onboard future X-ray missions such as XRISM and Athena, we are finally poised to answer important questions about the formation and evolution of galaxies and large-scale structure. However, we currently lack an adequate understanding of many atomic processes behind the spectral features we will soon observe. Large error bars on parameters as critical as transition energies and atomic cross sections can lead to unacceptable uncertainties in the calculations of e.g., elemental abundance, velocity, and temperature. Unless we address these issues, we risk limiting the full scientific potential of these missions. Laboratory astrophysics, which comprises theoretical and experimental studies of the underlying physics behind observable astrophysical processes, is therefore central to the success of these missions.

The dielectronic recombination rate coefficients of N V and Ne VIII ions have been measured at a heavy-ion storage ring. The investigated energy ranges covered all dielectronic recombination resonances attached to 2s -> 2p (Delta n=0) core excitations. The rate coefficients in a plasma are derived and parameterized by using a convenient fit formula. The experimentally derived rate coefficients are compared with theoretical data by Colgan et al. (2004, A&A, 417, 1183) and Nahar & Pradhan (1997, ApJ, 111, 339) as well as with the recommended rate coefficients by Mazzotta et al. (1998, A&A, 133, 403). The data of Colgan et al. and Nahar & Pradhan reproduce the experiment very well over the temperature ranges where N V and Ne VIII are expected to exist in photoionized as well as in collisionally ionized plasmas. In contrast, the recommendation of Mazzotta et al. agrees with the experimental rate coefficient only in the temperature range of collisional ionization. At lower temperatures it deviates from the measured rate coefficient by orders of magnitude. In addition the influence of external electric fields with field strengths up to 1300 V/cm on the dielectronic recombination rate coefficient has been investigated.