Normalized to: Dupuy, S.
[1]
oai:arXiv.org:0807.1067 [pdf] - 14270
The XMM-Newton Serendipitous Survey. V. The Second XMM-Newton
Serendipitous Source Catalogue
Watson, M. G.;
Schröder, A. C.;
Fyfe, D.;
Page, C. G.;
Lamer, G.;
Mateos, S.;
Pye, J.;
Sakano, M.;
Rosen, S.;
Ballet, J.;
Barcons, X.;
Barret, D.;
Boller, T.;
Brunner, H.;
Brusa, M.;
Caccianiga, A.;
Carrera, F. J.;
Ceballos, M.;
Della Ceca, R.;
Denby, M.;
Denkinson, G.;
Dupuy, S.;
Farrell, S.;
Fraschetti, F.;
Freyberg, M. J.;
Guillout, P.;
Hambaryan, V.;
Maccacaro, T.;
Mathiesen, B.;
McMahon, R.;
Michel, L.;
Motch, C.;
Osborne, J. P.;
Page, M.;
Pakull, M. W.;
Pietsch, W.;
Saxton, R.;
Schwope, A.;
Severgnini, P.;
Simpson, M.;
Sironi, G.;
Stewart, G.;
Stewart, I. M.;
Stobbart, A-M.;
Tedds, J.;
Warwick, R.;
Webb, N.;
West, R.;
Worrall, D.;
Yuan, W.
Submitted: 2008-07-07, last modified: 2008-10-21
Aims: Pointed observations with XMM-Newton provide the basis for creating
catalogues of X-ray sources detected serendipitously in each field. This paper
describes the creation and characteristics of the 2XMM catalogue. Methods: The
2XMM catalogue has been compiled from a new processing of the XMM-Newton EPIC
camera data. The main features of the processing pipeline are described in
detail. Results: The catalogue, the largest ever made at X-ray wavelengths,
contains 246,897 detections drawn from 3491 public XMM-Newton observations over
a 7-year interval, which relate to 191,870 unique sources. The catalogue fields
cover a sky area of more than 500 sq.deg. The non-overlapping sky area is ~360
sq.deg. (~1% of the sky) as many regions of the sky are observed more than once
by XMM-Newton. The catalogue probes a large sky area at the flux limit where
the bulk of the objects that contribute to the X-ray background lie and
provides a major resource for generating large, well-defined X-ray selected
source samples, studying the X-ray source population and identifying rare
object types. The main characteristics of the catalogue are presented,
including its photometric and astrometric properties .