Normalized to: Dunscombe, C.
[1]
oai:arXiv.org:1603.03309 [pdf] - 1372118
Optical Response of Strained- and Unstrained-Silicon Cold-Electron
Bolometers
Brien, T. L. R.;
Ade, P. A. R.;
Barry, P. S.;
Dunscombe, C. J.;
Leadley, D. R.;
Morozov, D. V.;
Myronov, M.;
Parker, E. H. C.;
Prest, M. J.;
Prunnila, M.;
Sudiwala, R. V.;
Whall, T. E.;
Mauskopf, P. D.
Submitted: 2016-03-10
We describe the optical characterisation of two silicon cold-electron
bolometers each consisting of a small ($32 \times 14~\mathrm{\mu m}$) island of
degenerately doped silicon with superconducting aluminium contacts. Radiation
is coupled into the silicon absorber with a twin-slot antenna designed to
couple to 160-GHz radiation through a silicon lens.The first device has a
highly doped silicon absorber, the second has a highly doped strained-silicon
absorber.Using a novel method of cross-correlating the outputs from two
parallel amplifiers, we measure noise-equivalent powers of $3.0 \times
10^{-16}$ and $6.6 \times 10^{-17}~\mathrm{W\,Hz^{-1/2}}$ for the control and
strained device, respectively, when observing radiation from a 77-K source. In
the case of the strained device, the noise-equivalent power is limited by the
photon noise.
[2]
oai:arXiv.org:1511.06011 [pdf] - 1378697
A passive THz video camera based on lumped element kinetic inductance
detectors
Rowe, Sam;
Pascale, Enzo;
Doyle, Simon;
Dunscombe, Chris;
Hargrave, Peter;
Papageorgio, Andreas;
Wood, Ken;
Ade, Peter A. R.;
Barry, Peter;
Bideaud, Aurélien;
Brien, Tom;
Dodd, Chris;
Grainger, William;
House, Julian;
Mauskopf, Philip;
Moseley, Paul;
Spencer, Locke;
Sudiwala, Rashmi;
Tucker, Carole;
Walker, Ian
Submitted: 2015-11-18
We have developed a passive 350 GHz (850 {\mu}m) video-camera to demonstrate
lumped element kinetic inductance detectors (LEKIDs) -- designed originally for
far-infrared astronomy -- as an option for general purpose terrestrial
terahertz imaging applications. The camera currently operates at a quasi-video
frame rate of 2 Hz with a noise equivalent temperature difference per frame of
$\sim$0.1 K, which is close to the background limit. The 152 element
superconducting LEKID array is fabricated from a simple 40 nm aluminum film on
a silicon dielectric substrate and is read out through a single microwave
feedline with a cryogenic low noise amplifier and room temperature frequency
domain multiplexing electronics.
[3]
oai:arXiv.org:1407.2113 [pdf] - 860359
A Strained Silicon Cold Electron Bolometer using Schottky Contacts
Brien, T. L. R.;
Ade, P. A. R.;
Barry, P. S.;
Dunscombe, C.;
Leadley, D. R.;
Morozov, D. V.;
Myronov, M.;
Parker, E. H. C.;
Prunnila, M.;
Prest, M. J.;
Sudiwala, R. V.;
Whall, T. E.;
Mauskopf, P. D.
Submitted: 2014-07-08, last modified: 2014-07-31
We describe optical characterisation of a Strained Silicon Cold Electron
Bolometer (CEB), operating on a $350~\mathrm{mK}$ stage, designed for
absorption of millimetre-wave radiation. The silicon Cold Electron Bolometer
utilises Schottky contacts between a superconductor and an n++ doped silicon
island to detect changes in the temperature of the charge carriers in the
silicon, due to variations in absorbed radiation. By using strained silicon as
the absorber, we decrease the electron-phonon coupling in the device and
increase the responsivity to incoming power. The strained silicon absorber is
coupled to a planar aluminium twin-slot antenna designed to couple to
$160~\mathrm{GHz}$ and that serves as the superconducting contacts. From the
measured optical responsivity and spectral response, we calculate a maximum
optical efficiency of $50~\%$ for radiation coupled into the device by the
planar antenna and an overall noise equivalent power (NEP), referred to
absorbed optical power, of $1.1 \times 10^{-16}~\mathrm{\mbox{W Hz}^{-1/2}}$
when the detector is observing a $300~\mathrm{K}$ source through a
$4~\mathrm{K}$ throughput limiting aperture. Even though this optical system is
not optimised we measure a system noise equivalent temperature difference
(NETD) of $6~\mathrm{\mbox{mK Hz}^{-1/2}}$. We measure the noise of the device
using a cross-correlation of time stream data measured simultaneously with two
junction field-effect transistor (JFET) amplifiers, with a base correlated
noise level of $300~\mathrm{\mbox{pV Hz}^{-1/2}}$ and find that the total noise
is consistent with a combination of photon noise, current shot noise and
electron-phonon thermal noise.