Normalized to: Dool, T.
[1]
oai:arXiv.org:1407.3729 [pdf] - 1215653
Gaia on-board metrology: basic angle and best focus
Mora, A.;
Biermann, M.;
Brown, A. G. A.;
Busonero, D.;
Carminati, L.;
Carrasco, J. M.;
Chassat, F.;
Erdmann, M.;
Gielesen, W. L. M.;
Jordi, C.;
Katz, D.;
Kohley, R.;
Lindegren, L.;
Loeffler, W.;
Marchal, O.;
Panuzzo, P.;
Seabroke, G.;
Sahlmann, J.;
Serpell, E.;
Serraller, I.;
van Leeuwen, F.;
van Reeven, W.;
Dool, T. C. van den;
Vosteen, L. L. A.
Submitted: 2014-07-14
The Gaia payload ensures maximum passive stability using a single material,
SiC, for most of its elements. Dedicated metrology instruments are, however,
required to carry out two functions: monitoring the basic angle and refocusing
the telescope. Two interferometers fed by the same laser are used to measure
the basic angle changes at the level of $\mu$as (prad, micropixel), which is
the highest level ever achieved in space. Two Shack-Hartmann wavefront sensors,
combined with an ad-hoc analysis of the scientific data are used to define and
reach the overall best-focus. In this contribution, the systems, data analysis,
procedures and performance achieved during commissioning are presented