Normalized to: Cotroneo, V.
[1]
oai:arXiv.org:1509.03478 [pdf] - 1275564
Angular resolution measurements at SPring-8 of a hard X-ray optic for
the New Hard X-ray Mission
Spiga, D.;
Raimondi, L.;
Furuzawa, A.;
Basso, S.;
Binda, R.;
Borghi, G.;
Cotroneo, V.;
Grisoni, G.;
Kunieda, H.;
Marioni, F.;
Matsumoto, H.;
Mori, H.;
Miyazawa, T.;
Negri, B.;
Orlandi, A.;
Pareschi, G.;
Salmaso, B.;
Tagliaferri, G.;
Uesugi, K.;
Valsecchi, G.;
Vernani, D.
Submitted: 2015-09-11
The realization of X-ray telescopes with imaging capabilities in the hard (>
10 keV) X-ray band requires the adoption of optics with shallow (< 0.25 deg)
grazing angles to enhance the reflectivity of reflective coatings. On the other
hand, to obtain large collecting area, large mirror diameters (< 350 mm) are
necessary. This implies that mirrors with focal lengths >10 m shall be produced
and tested. Full-illumination tests of such mirrors are usually performed with
on- ground X-ray facilities, aimed at measuring their effective area and the
angular resolution; however, they in general suffer from effects of the finite
distance of the X-ray source, e.g. a loss of effective area for double
reflection. These effects increase with the focal length of the mirror under
test; hence a "partial" full-illumination measurement might not be fully
representative of the in-flight performances. Indeed, a pencil beam test can be
adopted to overcome this shortcoming, because a sector at a time is exposed to
the X-ray flux, and the compensation of the beam divergence is achieved by
tilting the optic. In this work we present the result of a hard X-ray test
campaign performed at the BL20B2 beamline of the SPring-8 synchrotron radiation
facility, aimed at characterizing the Point Spread Function (PSF) of a
multilayer-coated Wolter-I mirror shell manufactured by Nickel electroforming.
The mirror shell is a demonstrator for the NHXM hard X-ray imaging telescope
(0.3 - 80 keV), with a predicted HEW (Half Energy Width) close to 20 arcsec. We
show some reconstructed PSFs at monochromatic X-ray energies of 15 to 63 keV,
and compare them with the PSFs computed from post-campaign metrology data,
self-consistently treating profile and roughness data by means of a method
based on the Fresnel diffraction theory. The modeling matches the measured PSFs
accurately.
[2]
oai:arXiv.org:1509.03666 [pdf] - 1276331
Computation of the off-axis effective area of the New Hard X-ray Mission
modules by means of an analytical approach
Submitted: 2015-09-11
One of the most important parameters determining the sensitivity of X-ray
telescopes is their effective area as a function of the X-ray energy. The
computation of the effective area of a Wolter-I mirror, with either a single
layer or multilayer coating, is a very simple task for a source on-axis at
astronomical distance. Indeed, when the source moves off-axis the calculation
is more complicated, in particular for new hard X-ray imaging telescopes
(NuSTAR, ASTRO-H, NHXM, IXO) beyond 10 keV, that will make use of multilayer
coatings to extend the reflectivity band in grazing incidence. Unlike
traditional single-layer coatings (in Ir or Au), graded multilayer coatings
exhibit an oscillating reflectivity as a function of the incidence angle, which
makes the effective area not immediately predictable for a source placed
off-axis within the field of view. For this reason, the computation of the
off-axis effective area has been so far demanded to ray- tracing codes, able to
sample the incidence of photons onto the mirror assembly. Even if this approach
should not be disdained, it would be interesting to approach the same problem
from an analytical viewpoint. This would speed up and simplify the computation
of the effective area as a function of the off-axis angle, a considerable
advantage especially whenever the mirror parameters are still to be optimized.
In this work we present the application of a novel, analytical formalism to the
computation of the off-axis effective area and the grasp of the NHXM optical
modules, requiring only the standard routines for the multilayer reflectivity
computation.
[3]
oai:arXiv.org:1509.02264 [pdf] - 1273349
Characterization of multilayer stack parameters from X-ray reflectivity
data using the PPM program: measurements and comparison with TEM results
Submitted: 2015-09-08
Future hard (10 -100 keV) X-ray telescopes (SIMBOL-X, Con-X, HEXIT-SAT, XEUS)
will implement focusing optics with multilayer coatings: in view of the
production of these optics we are exploring several deposition techniques for
the reflective coatings. In order to evaluate the achievable optical
performance X-Ray Reflectivity (XRR) measurements are performed, which are
powerful tools for the in-depth characterization of multilayer properties
(roughness, thickness and density distribution). An exact extraction of the
stack parameters is however difficult because the XRR scans depend on them in a
complex way. The PPM code, developed at ERSF in the past years, is able to
derive the layer-by-layer properties of multilayer structures from
semi-automatic XRR scan fittings by means of a global minimization procedure in
the parameters space. In this work we will present the PPM modeling of some
multilayer stacks (Pt/C and Ni/C) deposited by simple e-beam evaporation.
Moreover, in order to verify the predictions of PPM, the obtained results are
compared with TEM profiles taken on the same set of samples. As we will show,
PPM results are in good agreement with the TEM findings. In addition, we show
that the accurate fitting returns a physically correct evaluation of the
variation of layers thickness through the stack, whereas the thickness trend
derived from TEM profiles can be altered by the superposition of roughness
profiles in the sample image.
[4]
oai:arXiv.org:1105.0637 [pdf] - 353860
POLARIX: a pathfinder mission of X-ray polarimetry
Costa, Enrico;
Bellazzini, Ronaldo;
Tagliaferri, Gianpiero;
Matt, Giorgio;
Argan, Andrea;
Attina', Primo;
Baldini, Luca;
Basso, Stefano;
Brez, Alessandro;
Citterio, Oberto;
Di Cosimo, Sergio;
Cotroneo, Vincenzo;
Fabiani, Sergio;
Feroci, Marco;
Ferri, Antonella;
Latronico, Luca;
Lazzarotto, Francesco;
Minuti, Massimo;
Morelli, Ennio;
Muleri, Fabio;
Nicolini, Lucio;
Pareschi, Giovanni;
Di Persio, Giuseppe;
Pinchera, Michele;
Razzano, Massimiliano;
Reboa, Luigia;
Rubini, Alda;
Salonico, Antonio Maria;
Sgro', Carmelo;
Soffitta, Paolo;
Spandre, Gloria;
Spiga, Daniele;
Trois, Alessio
Submitted: 2011-05-03
Since the birth of X-ray astronomy, spectral, spatial and timing observation
improved dramatically, procuring a wealth of information on the majority of the
classes of the celestial sources. Polarimetry, instead, remained basically
unprobed. X-ray polarimetry promises to provide additional information
procuring two new observable quantities, the degree and the angle of
polarization. POLARIX is a mission dedicated to X-ray polarimetry. It exploits
the polarimetric response of a Gas Pixel Detector, combined with position
sensitivity, that, at the focus of a telescope, results in a huge increase of
sensitivity. Three Gas Pixel Detectors are coupled with three X-ray optics
which are the heritage of JET-X mission. POLARIX will measure time resolved
X-ray polarization with an angular resolution of about 20 arcsec in a field of
view of 15 arcmin $\times$ 15 arcmin and with an energy resolution of 20 % at 6
keV. The Minimum Detectable Polarization is 12 % for a source having a flux of
1 mCrab and 10^5 s of observing time. The satellite will be placed in an
equatorial orbit of 505 km of altitude by a Vega launcher.The telemetry
down-link station will be Malindi. The pointing of POLARIX satellite will be
gyroless and it will perform a double pointing during the earth occultation of
one source, so maximizing the scientific return. POLARIX data are for 75 % open
to the community while 25 % + SVP (Science Verification Phase, 1 month of
operation) is dedicated to a core program activity open to the contribution of
associated scientists. The planned duration of the mission is one year plus
three months of commissioning and SVP, suitable to perform most of the basic
science within the reach of this instrument.
[5]
oai:arXiv.org:0912.5331 [pdf] - 1018922
A wide field X-ray telescope for astronomical survey purposes: from
theory to practice
Submitted: 2009-12-29, last modified: 2010-02-11
X-ray mirrors are usually built in the Wolter I (paraboloid-hyperboloid)
configuration. This design exhibits no spherical aberration on-axis but suffers
from field curvature, coma and astigmatism, therefore the angular resolution
degrades rapidly with increasing off-axis angles. Different mirror designs
exist in which the primary and secondary mirror profiles are expanded as a
power series in order to increase the angular resolution at large off-axis
positions, at the expanses of the on-axis performances. Here we present the
design and global trade off study of an X-ray mirror systems based on
polynomial optics in view of the Wide Field X-ray Telescope (WFXT) mission.
WFXT aims at performing an extended cosmological survey in the soft X-ray band
with unprecedented flux sensitivity. To achieve these goals the angular
resolution required for the mission is very demanding ~5 arcsec mean resolution
across a 1-deg field of view. In addition an effective area of 5-9000 cm^2 at 1
keV is needed.
[6]
oai:arXiv.org:0911.5099 [pdf] - 31065
Angular Resolution of a Photoelectric Polarimeter in the Focus of an
Optical System
Lazzarotto, Francesco;
Fabiani, Sergio;
Costa, Enrico;
Muleri, Fabio;
Soffitta, Paolo;
Di Cosimo, Sergio;
Di Persio, Giuseppe;
Rubini, Alda;
Bellazzini, Ronaldo;
Brez, Alessandro;
Spandre, Gloria;
Cotroneo, Vincenzo;
Moretti, Alberto;
Pareschi, Giovanni;
Tagliaferri, Giampiero
Submitted: 2009-11-26
The INFN and INAF Italian research institutes developed a space-borne X-Ray
polarimetry experiment based on a X-Ray telescope, focussing the radiation on a
Gas Pixel Detector (GPD). The instrument obtains the polarization angle of the
absorbed photons from the direction of emission of the photoelectrons as
visualized in the GPD. Here we will show how we compute the angular resolution
of such an instrument.
[7]
oai:arXiv.org:0906.5367 [pdf] - 25787
Analytical computation of the off-axis Effective Area of grazing
incidence X-ray mirrors
Submitted: 2009-06-29, last modified: 2009-09-04
Focusing mirrors for X-ray telescopes in grazing incidence, introduced in the
70s, are characterized in terms of their performance by their imaging quality
and effective area, which in turn determines their sensitivity. Even though the
on-axis effective area is assumed in general to characterize the collecting
power of an X-ray optic, the telescope capability of imaging extended X-ray
sources is also determined by the variation in its effective area with the
off-axis angle. [...] The complex task of designing optics for future X-ray
telescopes entails detailed computations of both imaging quality and effective
area on- and off-axis. Because of their apparent complexity, both aspects have
been, so far, treated by using ray-tracing routines aimed at simulating the
interaction of X-ray photons with the reflecting surfaces of a given focusing
system. Although this approach has been widely exploited and proven to be
effective, it would also be attractive to regard the same problem from an
analytical viewpoint, to assess an optical design of an X-ray optical module
with a simpler calculation than a ray-tracing routine. [...] We have developed
useful analytical formulae for the off-axis effective area of a
double-reflection mirror in the double cone approximation, requiring only an
integration and the standard routines to calculate the X-ray coating
reflectivity for a given incidence angle. [...] Algebraic expressions are
provided for the mirror geometric area, as a function of the off-axis angle.
Finally, the results of the analytical computations presented here are
validated by comparison with the corresponding predictions of a ray-tracing
code.
[8]
oai:arXiv.org:0903.2483 [pdf] - 22372
Simbol-X Hard X-ray Focusing Mirrors: Results Obtained During the Phase
A Study
Tagliaferri, G.;
Basso, S.;
Borghi, G.;
Burkert, W.;
Citterio, O.;
Civitani, M.;
Conconi, P.;
Cotroneo, V.;
Freyberg, M.;
Garoli, D.;
Gorenstein, P.;
Hartner, G.;
Mattarello, V.;
Orlandi, A.;
Pareschi, G.;
Romaine, S.;
Spiga, D.;
Valsecchi, G.;
Vernani, D.
Submitted: 2009-03-13
Simbol-X will push grazing incidence imaging up to 80 keV, providing a strong
improvement both in sensitivity and angular resolution compared to all
instruments that have operated so far above 10 keV. The superb hard X-ray
imaging capability will be guaranteed by a mirror module of 100 electroformed
Nickel shells with a multilayer reflecting coating. Here we will describe the
technogical development and solutions adopted for the fabrication of the mirror
module, that must guarantee an Half Energy Width (HEW) better than 20 arcsec
from 0.5 up to 30 keV and a goal of 40 arcsec at 60 keV. During the phase A,
terminated at the end of 2008, we have developed three engineering models with
two, two and three shells, respectively. The most critical aspects in the
development of the Simbol-X mirrors are i) the production of the 100 mandrels
with very good surface quality within the timeline of the mission; ii) the
replication of shells that must be very thin (a factor of 2 thinner than those
of XMM-Newton) and still have very good image quality up to 80 keV; iii) the
development of an integration process that allows us to integrate these very
thin mirrors maintaining their intrinsic good image quality. The Phase A study
has shown that we can fabricate the mandrels with the needed quality and that
we have developed a valid integration process. The shells that we have produced
so far have a quite good image quality, e.g. HEW <~30 arcsec at 30 keV, and
effective area. However, we still need to make some improvements to reach the
requirements. We will briefly present these results and discuss the possible
improvements that we will investigate during phase B.
[9]
oai:arXiv.org:0810.2708 [pdf] - 17472
X-ray polarimetry on-board HXMT
Soffitta, Paolo;
Bellazzini, Ronaldo;
Tagliaferri, Gianpiero;
Costa, Enrico;
Pareschi, Giovanni;
Basso, Stefano;
Cotroneo, Vincenzo;
Frutti, Massimo;
Lazzarotto, Francesco;
Muleri, Fabio;
Rubini, Alda;
Spandre, Gloria;
Brez, Alessandro;
Baldini, Luca;
Bregeon, Jean;
Minuti, Massimo;
Matt, Giorgio;
Frontera, Filippo
Submitted: 2008-10-15
The development of micropixel gas detectors, capable to image tracks produced
in a gas by photoelectrons, makes possible to perform polarimetry of X-ray
celestial sources in the focus of grazing incidence X-ray telescopes. HXMT is a
mission by the Chinese Space Agency aimed to survey the Hard X-ray Sky with
Phoswich detectors, by exploitation of the direct demodulation technique. Since
a fraction of the HXMT time will be spent on dedicated pointing of particular
sources, it could host, with moderate additional resources a pair of X-ray
telescopes, each with a photoelectric X-ray polarimeter (EXP2, Efficient X-ray
Photoelectric Polarimeter) in the focal plane. We present the design of the
telescopes and the focal plane instrumentation and discuss the performance of
this instrument to detect the degree and angle of linear polarization of some
representative sources. Notwithstanding the limited resources, the proposed
instrument can represent a breakthrough in X-ray Polarimetry.
[10]
oai:arXiv.org:0807.0893 [pdf] - 14237
XIAO: a soft X-ray telescope for the SVOM Mission
Mereghetti, S.;
De Luca, A.;
Fiorini, M.;
La Palombara, N.;
Tiengo, A.;
Uslenghi, M.;
Vianello, G.;
Villa, G.;
Zambra, A.;
Moretti, A.;
Basso, S.;
Campana, S.;
Conconi, P.;
Cotroneo, V.;
Covino, S.;
Ghirlanda, G.;
Ghisellini, G.;
Pareschi, G.;
Tagliaferri, G.;
Trifoglio, M.;
Amati, L.;
Gianotti, F.;
Stella, L.;
Antonelli, A.;
Cordier, B.;
Gotz, D.
Submitted: 2008-07-06
The study of Gamma-ray bursts (GRBs) is a key field to expand our
understanding of several astrophysical and cosmological phenomena. SVOM is a
Chinese-French Mission which will permit to detect and rapidly locate GRBs, in
particular those at high redshift, and to study their multiwavelength emission.
The SVOM satellite, to be launched in 2013, will carry wide field instruments
operating in the X/gamma-ray band and narrow field optical and soft X-ray
telescopes. Here we describe a small soft X-ray telescope (XIAO) proposed as an
Italian contribution to the SVOM mission. Thanks to a grazing incidence X-ray
telescope with effective area of ~120 cm^2 and a short focal length, coupled to
a very compact, low noise, fast read out CCD camera, XIAO can substantially
contribute to the overall SVOM capabilities for both GRB and non-GRB science.
[11]
oai:arXiv.org:0801.2350 [pdf] - 9028
Estimation of X-ray scattering impact in imaging degradation for the
SIMBOL-X telescope
Submitted: 2008-01-15
The imaging performance of X-ray optics (expressed in terms of HEW,
Half-Energy-Width) can be severely affected by X-ray scattering caused by the
surface roughness of the mirrors. The impact of X-ray scattering has an
increasing relevance for increasing photon energy, and can be the dominant
problem in a hard X-ray telescope like SIMBOL-X. In this work we show how, by
means of a novel formalism, we can derive a surface roughness tolerance - in
terms of its power spectrum - from a specific HEW requirement for the SIMBOL-X
optical module.
[12]
oai:arXiv.org:0709.3992 [pdf] - 5336
An X-ray Polarimeter for HXMT Mission
Costa, Enrico;
Bellazzini, Ronaldo;
Tagliaferri, Gianpiero;
Baldini, Luca;
Basso, Stefano;
Bregeon, Johan;
Brez, Alessandro;
Citterio, Oberto;
Cotroneo, Vincenzo;
Frontera, Filippo;
Frutti, Massimo;
Matt, Giorgio;
Minuti, Massimo;
Muleri, Fabio;
Pareschi, Giovanni;
Perola, Giuseppe Cesare;
Rubini, Alda;
Sgro', Carmelo;
Soffitta, Paolo;
Spandre, Gloria
Submitted: 2007-09-25
The development of micropixel gas detectors, capable to image tracks produced
in a gas by photoelectrons, makes possible to perform polarimetry of X-ray
celestial sources in the focus of grazing incidence X-ray telescopes. HXMT is a
mission by the Chinese Space Agency aimed to survey the Hard X-ray Sky with
Phoswich detectors, by exploitation of the direct demodulation technique. Since
a fraction of the HXMT time will be spent on dedicated pointing of particular
sources, it could host, with moderate additional resources a pair of X-ray
telescopes, each with a photoelectric X-ray polarimeter in the focal plane. We
present the design of the telescopes and the focal plane instrumentation and
discuss the performance of this instrument to detect the degree and angle of
linear polarization of some representative sources. Notwithstanding the limited
resources the proposed instrument can represent a breakthrough in X-ray
Polarimetry.
[13]
oai:arXiv.org:astro-ph/0609576 [pdf] - 85168
POLARIX: a small mission of x-ray polarimetry
Costa, Enrico;
Bellazzini, Ronaldo;
Soffitta, Paolo;
Muleri, Fabio;
Feroci, Marco;
Frutti, Massimo;
Mastropietro, Marcello;
Pacciani, Luigi;
Rubini, Alda;
Morelli, Ennio;
Baldini, Luca;
Bitti, Francesco;
Brez, Alessandro;
Cavalca, Francesco;
Latronico, Luca;
Massai, Marco Maria;
Omodei, Nicola;
Pinchera, Michele;
Sgro', Carmelo;
Spandre, Gloria;
Matt, Giorgio;
Perola, Giuseppe Cesare;
Chincarini, Guido;
Citterio, Oberto;
Tagliaferri, Gianpiero;
Pareschi, Giovanni;
Cotroneo, Vincenzo
Submitted: 2006-09-20
X-Ray Polarimetry can be now performed by using a Micro Pattern Gas Chamber
in the focus of a telescope. It requires large area optics for most important
scientific targets. But since the technique is additive a dedicated mission
with a cluster of small telescopes can perform many important measurements and
bridge the 40 year gap between OSO-8 data and future big telescopes such as
XEUS. POLARIX has been conceived as such a pathfinder. It is a Small Satellite
based on the optics of JET-X. Two telescopes are available in flight
configuration and three more can be easily produced starting from the available
superpolished mandrels. We show the capabilities of such a cluster of
telescopes each equipped with a focal plane photoelectric polarimeter and
discuss a few alternative solutions.
[14]
oai:arXiv.org:astro-ph/0609573 [pdf] - 85165
An X-ray polarimeter for hard X-ray optics
Muleri, Fabio;
Bellazzini, Ronaldo;
Costa, Enrico;
Soffitta, Paolo;
Lazzarotto, Francesco;
Feroci, Marco;
Pacciani, Luigi;
Rubini, Alda;
Morelli, Ennio;
Baldini, Luca;
Bitti, Francesco;
Brez, Alessandro;
Cavalca, Francesco;
Latronico, Luca;
Massai, Marco Maria;
Omodei, Nicola;
Pinchera, Michele;
Sgro', Carmelo;
Spandre, Gloria;
Matt, Giorgio;
Perola, Giuseppe Cesare;
Citterio, Oberto;
Pareschi, Giovanni;
Cotroneo, Vincenzo;
Spiga, Daniele;
Canestrari, Rodolfo
Submitted: 2006-09-20
Development of multi-layer optics makes feasible the use of X-ray telescope
at energy up to 60-80 keV: in this paper we discuss the extension of
photoelectric polarimeter based on Micro Pattern Gas Chamber to high energy
X-rays. We calculated the sensitivity with Neon and Argon based mixtures at
high pressure with thick absorption gap: placing the MPGC at focus of a next
generation multi-layer optics, galatic and extragalactic X-ray polarimetry can
be done up till 30 keV.