Normalized to: Ciurea, M.
[1]
oai:arXiv.org:1211.1369 [pdf] - 1157573
Analysis of defect formation in semiconductor cryogenic bolometric
detectors created by heavy dark matter
Submitted: 2012-11-06, last modified: 2013-01-09
The cryogenic detectors in the form of bolometers are presently used for
different applications, in particular for very rare or hypothetical events
associated with new forms of matter, specifically related to the existence of
Dark Matter. In the detection of particles with a semiconductor as target and
detector, usually two signals are measured: ionization and heat. The
amplification of the thermal signal is obtained with the prescriptions from
Luke-Neganov effect. The energy deposited in the semiconductor lattice as
stable defects in the form of Frenkel pairs at cryogenic temperatures,
following the interaction of a dark matter particle, is evaluated and
consequences for measured quantities are discussed. This contribution is
included in the energy balance of the Luke effect. Applying the present model
to germanium and silicon, we found that for the same incident weakly
interacting massive particle the energy deposited in defects in germanium is
about twice the value for silicon.