Many astronomical optical systems have the disadvantage of generating curved focal planes requiring flattening optical elements to project the corrected image on flat detectors. The use of these designs in combination with a classical flat sensor implies an overall degradation of throughput and system performances to obtain the proper corrected image. With the recent development of curved sensor this can be avoided. This new technology has been gathering more and more attention from a very broad community, as the potential applications are multiple: from low-cost commercial to high impact scientific systems, to mass-market and on board cameras, defense and security, and astronomical community. We describe here the first concave curved CMOS detector developed within a collaboration between CNRS- LAM and CEA-LETI. This fully-functional detector 20 Mpix (CMOSIS CMV20000) has been curved down to a radius of Rc = 150 mm over a size of 24x32 mm^2 . We present here the methodology adopted for its characterization and describe in detail all the results obtained. We also discuss the main components of noise, such as the readout noise, the fixed pattern noise and the dark current. Finally we provide a comparison with the flat version of the same sensor in order to establish the impact of the curving process on the main characteristics of the sensor.

In the present paper we consider quantitative estimation of the tolerances widening in optical systems with curved detectors. The gain in image quality allows to loosen the margins for manufacturing and assembling errors. On another hand, the requirements for the detector shape and positioning become more tight. We demonstrate both of the effects on example of two optical designs. The first one is a rotationally-symmetrical lens with focal length of 25 mm, f-ratio of 3.5 and field of view equal to 72$^\circ$, working in the visible domain. The second design is a three-mirror anastigmat telescope with focal length of 250 mm, f-ratio of 2.0 and field of view equal to $4^\circ \times 4^\circ$. In both of the cases use of curved detectors allow to increase the image quality and substantially decrease the requirements for manufacturing precision

In the recent years a significant progress was achieved in the field of design and fabrication of optical systems based on freeform optical surfaces. They provide a possibility to build fast, wide-angle and high-resolution systems, which are very compact and free of obscuration. However, the field of freeform surfaces design techniques still remains underexplored. In the present paper we use the mathematical apparatus of orthogonal polynomials defined over a square aperture, which was developed before for the tasks of wavefront reconstruction, to describe shape of a mirror surface. Two cases, namely Legendre polynomials and generalization of the Zernike polynomials on a square, are considered. The potential advantages of these polynomials sets are demonstrated on example of a three-mirror unobscured telescope with F/#=2.5 and FoV=7.2x7.2{\deg}. In addition, we discuss possibility of use of curved detectors in such a design.

LAM and CEA-LETI are developing the technology of deformable detectors, for UV, VIS or NIR applications. Such breakthrough devices will be a revolution for future wide field imagers and spectrographs, firstly by improving the image quality with better off-axis sharpness, resolution, brightness while scaling down the optical system, secondly by overcoming the manufacturing issues identified so far and by offering a flexibility and versatility in optical design. The technology of curved detectors can benefit of the developments of active and deformable structures, to provide a flexibility and a fine tuning of the detectors curvature by thinning down the substrate without modifying the fabrication process of the active pixels. We present studies done so far on optical design improvements, the technological demonstrators we developed and their performances as well as the future five-years roadmap for these developments.