The EXperiment for Cryogenic Large-Aperture Intensity Mapping (EXCLAIM) is a cryogenic balloon-borne instrument that will survey galaxy and star formation history over cosmological time scales. Rather than identifying individual objects, EXCLAIM will be a pathfinder to demonstrate an intensity mapping approach, which measures the cumulative redshifted line emission. EXCLAIM will operate at 420-540 GHz with a spectral resolution R=512 to measure the integrated CO and [CII] in redshift windows spanning 0 < z < 3.5. CO and [CII] line emissions are key tracers of the gas phases in the interstellar medium involved in star-formation processes. EXCLAIM will shed light on questions such as why the star formation rate declines at z < 2, despite continued clustering of the dark matter. The instrument will employ an array of six superconducting integrated grating-analog spectrometers (micro-spec) coupled to microwave kinetic inductance detectors (MKIDs). Here we present an overview of the EXCLAIM instrument design and status.

Silicon oxide thin films play an important role in the realization of optical coatings and high-performance electrical circuits. Estimates of the dielectric function in the far- and mid-infrared regime are derived from the observed transmittance spectrum for a commonly employed low-stress silicon oxide formulation. The experimental, modeling, and numerical methods used to extract the dielectric function are presented.

The far-infrared and submillimeter portions of the electromagnetic spectrum provide a unique view of the astrophysical processes present in the early universe. Micro-Spec ($\mu$-Spec), a high-efficiency direct-detection spectrometer concept working in the 450-1000-$\mu$m wavelength range, will enable a wide range of spaceflight missions that would otherwise be challenging due to the large size of current instruments and the required spectral resolution and sensitivity. This paper focuses on the $\mu$-Spec two-dimensional multimode region, where the light of different wavelengths diffracts and converges onto a set of detectors. A two-step optimization process is used to generate geometrical configurations given specific requirements on spectrometer size, operating spectral range, and performance. The canonically employed focal-plane constraints for the power combiner were removed to probe the design space in its entirety. A new four-stigmatic-point optical design solution is identified and explored for use in far-infrared and submillimeter spectroscopy.

A method is proposed and experimentally explored for in-situ calibration of complex transmission data for superconducting microwave resonators. This cryogenic calibration method accounts for the instrumental transmission response between the vector network analyzer reference plane and the device calibration plane. Once calibrated, the observed resonator response is analyzed in detail by two approaches. The first, a phenomenological model based on physically realizable rational functions, enables the extraction of multiple resonance frequencies and widths for coupled resonators without explicit specification of the circuit network. In the second, an ABCD-matrix representation for the distributed transmission line circuit is used to model the observed response from the characteristic impedance and propagation constant. When used in conjunction with electromagnetic simulations, the kinetic inductance fraction can be determined with this method with an accuracy of 2%. Datasets for superconducting microstrip and coplanar-waveguide resonator devices were investigated and a recovery within 1% of the observed complex transmission amplitude was achieved with both analysis approaches. The experimental configuration used in microwave characterization of the devices and self-consistent constraints for the electromagnetic constitutive relations for parameter extraction are also presented.

The Optical Properties of Astronomical Silicates with Infrared Techniques (OPASI-T) program utilizes multiple instruments to provide spectral data over a wide range of temperature and wavelengths. Experimental methods include Vector Network Analyzer (VNA) and Fourier Transform Spectroscopy (FTS) transmission, and reflection/scattering measurements. From this data, we can determine the optical parameters for the index of refraction, \textit{n}, and the absorption coefficient, \textit{k}. The analysis of the laboratory transmittance data for each sample type is based upon different mathematical models, which are applied to each data set according to their degree of coherence. Presented here are results from iron silicate dust grain analogs, in several sample preparations and at temperatures ranging from 5--300 K, across the infrared and millimeter portion of the spectrum (from 2.5--10,000 \mic\ or 4,000--1 \wvn).

Silicon nitride thin films play an important role in the realization of sensors, filters, and high-performance circuits. Estimates of the dielectric function in the far- and mid-infrared regime are derived from the observed transmittance spectra for a commonly employed low-stress silicon nitride formulation. The experimental, modeling, and numerical methods used to extract the dielectric parameters with an accuracy of approximately 4% are presented.