Normalized to: Caselle, M.
[1]
oai:arXiv.org:1808.08041 [pdf] - 1756027
Characterization of a novel pixelated Silicon Drift Detector (PixDD) for
high-throughput X-ray astrophysics
Evangelista, Y.;
Ambrosino, F.;
Feroci, M.;
Bellutti, P.;
Bertuccio, G.;
Borghi, G.;
Campana, R.;
Caselle, M.;
Cirrincione, D.;
Ficorella, F.;
Fiorini, M.;
Fuschino, F.;
Gandola, M.;
Grassi, M.;
Labanti, C.;
Malcovati, P.;
Mele, F.;
Morbidini, A.;
Picciotto, A.;
Rachevski, A.;
Rashevskaya, I.;
Sammartini, M.;
Zampa, G.;
Zampa, N.;
Zorzi, N.;
Vacchi, A.
Submitted: 2018-08-24, last modified: 2018-08-29
Multi-pixel fast silicon detectors represent the enabling technology for the
next generation of space-borne experiments devoted to high-resolution
spectral-timing studies of low-flux compact cosmic sources. Several imaging
detectors based on frame-integration have been developed as focal plane devices
for X-ray space-borne missions but, when coupled to large-area concentrator
X-ray optics, these detectors are affected by strong pile-up and dead-time
effects, thus limiting the time and energy resolution as well as the overall
system sensitivity. The current technological gap in the capability to realize
pixelated silicon detectors for soft X-rays with fast, photon-by-photon
response and nearly Fano-limited energy resolution therefore translates into
the unavailability of sparse read-out sensors suitable for high throughput
X-ray astronomy applications. In the framework of the ReDSoX Italian
collaboration, we developed a new, sparse read-out, pixelated silicon drift
detector which operates in the energy range 0.5-15 keV with nearly Fano-limited
energy resolution ($\leq$150 eV FWHM @ 6 keV) at room temperature or with
moderate cooling ($\sim$0 {\deg}C to +20 {\deg}C). In this paper, we present
the design and the laboratory characterization of the first 16-pixel
(4$\times$4) drift detector prototype (PixDD), read-out by individual ultra
low-noise charge sensitive preamplifiers (SIRIO) and we discuss the future
PixDD prototype developments.