Normalized to: Baehr, A.
[1]
oai:arXiv.org:1706.08666 [pdf] - 1601501
DEPFET detectors for direct detection of MeV Dark Matter particles
Submitted: 2017-06-27, last modified: 2017-12-09
The existence of dark matter is undisputed, while the nature of it is still
unknown. Explaining dark matter with the existence of a new unobserved particle
is among the most promising possible solutions. Recently dark matter candidates
in the MeV mass region received more and more interest. In comparison to the
mass region between a few GeV to several TeV, this region is experimentally
largely unexplored. We discuss the application of a RNDR DEPFET semiconductor
detector for direct searches for dark matter in the MeV mass region. We present
the working principle of the RNDR DEPFET devices and review the performance
obtained by previously performed prototype measurements. The future potential
of the technology as dark matter detector is discussed and the sensitivity for
MeV dark matter detection with RNDR DEPFET sensors is presented. Under the
assumption of three background events in the region of interest and an exposure
of one kg$\cdot$y a sensitivity of $\bar{\sigma}_{\bar{e}} = 10^{-41}$ cm$^{2}$
for dark matter particles with a mass of 10 MeV can be reached.