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Aleman, Katerin M.

Normalized to: Aleman, K.

1 article(s) in total. 11 co-authors. Median position in authors list is 3,0.

[1]  oai:arXiv.org:1901.11400  [pdf] - 1825016
Apparatus to Measure Optical Scatter of Coatings Versus Annealing Temperature
Comments: 3 page paper submission for Optical Society of America meeting on Optical Interference Coatings
Submitted: 2019-01-29
Light scattered by amorphous thin-film optical coatings limits the sensitivity of interferometric gravitational-wave detectors. We describe an imaging scatterometer to assess the role that crystal growth during annealing plays in this scatter.